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Indian Standard No.

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Testing Charges (Excl. Of Taxes)

Validity Date

Remark

URS PRODUCTS AND TESTING PVT. LTD. (A29), NOIDA

8168906

IS 14286 : Part 1 : Sec 3 (2019)

Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 3 special requirements for testing of thin - Film amorphous silicon based photovoltaic (Pv) modules (Second Revision)

1122000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
5 IS 14286( Marking and Documentation)	-	2000	-
11.1 IS 14286( Visual inspection)	-	3000	-
11.2 IS 14286( Maximum power determination)	-	25000	-
11.3 IS 14286( Insulation Test)	-	20000	-
11.4 IS 14286( Measurement of temperature coefficients)	-	25000	-
11.5 IS 14286( Measurement of nominal module operating temperature (NMOT))	-	25000	-
11.6 IS 14286( Performance at STC and NMOT)	-	25000	-
11.7 IS 14286( Performance at low irradiance)	-	25000	-
11.8 IS 14286( Outdoor exposure Test)	-	25000	-
11.9 IS 14286( Hot-spot endurance test)	-	25000	-
11.10 IS 14286( UV Preconditioning test )	-	70000	-
11.11 IS 14286( Thermal cycling test)	-	175000	-
11.12 IS 14286( Humidity-freeze test)	-	70000	-
11.13 IS 14286(Damp heat test)	-	150000	-
11.14, Table 1 IS 14286( Robutness of terminations test - Retention of Junction Box on Mounting Surface - Test of Cord Anchorage)	-	25000	-
11.15 IS 14286( Wet leakage current test)	-	25000	-
11.16 IS 14286( Static Mechanical load test)	-	95000	-
11.17, Table 3 & 4, IS 14286( Hail test)	-	25000	-
11.18 IS 14286( Bypass diode testing)	-	20000	-
11.19 IS 14286( Stabilization )	-	2000	-
11.15(Wet leakage current test (MQT 15))	-	25000	-
11.16(Static mechanical load test (MQT 16))	-	50000	-
11.17(Hail test (MQT 17))	-	25000	-
11.18(Bypass diode thermal test (MQT 18))	-	20000	-
11.19(Stabilization (MQT 19))	-	2000	-

-
-

URS PRODUCTS AND TESTING PVT. LTD. (A29), NOIDA

8168906

IS 14286 : Part 1 : Sec 2 (2019)

Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 2 special requirements for testing of thin - Film cadmium telluride (CdTe) based photovoltaic (Pv) modules (Second Revision)

810000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
5 IS 14286( Marking and Documentation)	-	2000	-
11.1 IS 14286( Visual inspection)	-	3000	-
11.2 IS 14286( Maximum power determination)	-	25000	-
11.3 IS 14286( Insulation Test)	-	20000	-
11.4 IS 14286( Measurement of temperature coefficients)	-	25000	-
11.5 IS 14286( Measurement of nominal module operating temperature (NMOT))	-	25000	-
11.6 IS 14286( Performance at STC and NMOT)	-	25000	-
11.7 IS 14286( Performance at low irradiance)	-	25000	-
11.8 IS 14286( Outdoor exposure Test)	-	25000	-
11.9 IS 14286( Hot-spot endurance test)	-	25000	-
11.10 IS 14286( UV Preconditioning test )	-	70000	-
11.11 IS 14286( Thermal cycling test)	-	175000	-
11.13 IS 14286(Damp heat test)	-	150000	-
11.14, Table 1 IS 14286( Robutness of terminations test - Retention of Junction Box on Mounting Surface - Test of Cord Anchorage)	-	25000	-
11.15 IS 14286( Wet leakage current test)	-	25000	-
11.16 IS 14286( Static Mechanical load test)	-	95000	-
11.17, Table 3 & 4, IS 14286( Hail test)	-	25000	-
11.18 IS 14286( Bypass diode testing)	-	20000	-
11.19 IS 14286( Stabilization )	-	2000	-
11.18(Bypass diode thermal test (MQT 18))	-	20000	-
11.19(Stabilization (MQT 19))	-	3000	-

-
-

URS PRODUCTS AND TESTING PVT. LTD. (A29), NOIDA

8168906

IS 14286 : Part 1 : Sec 1 (2019)

Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 1 special requirements for testing of crystalline silicon photovoltaic (Pv) modules (Second Revision)

810000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
11.1(Visual inspection (MQT 01))	-	3000	-
11.2(Maximum power determination (MQT 02))	-	25000	-
11.3(Insulation test (MQT 03))	-	20000	-
11.4(Measurement of temperature coefficients (MQT 04))	-	25000	-
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	25000	-
11.6(Performance at STC and NMOT (MQT 06))	-	25000	-
11.7(Performance at low irradiance (MQT 07))	-	25000	-
11.8(Outdoor exposure test (MQT 08))	-	25000	-
11.9(Hot-spot endurance test (MQT 09))	-	25000	-
11.1(UV preconditioning test (MQT 10))	-	70000	-
11.11(Thermal cycling test (MQT 11))	-	175000	-
11.12(Humidity-freeze test (MQT 12))	-	70000	-
11.13(Damp heat test (MQT 13))	-	150000	-
11.14(Robustness of terminations (MQT 14))	-	25000	-
11.15(Wet leakage current test (MQT 15))	-	25000	-
11.16(Static mechanical load test (MQT 16))	-	50000	-
11.17(Hail test (MQT 17))	-	25000	-
11.18(Bypass diode thermal test (MQT 18))	-	20000	-
11.19(Stabilization (MQT 19))	-	2000	-

-
-

URS PRODUCTS AND TESTING PVT. LTD. (A29), NOIDA

8168906

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

810000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
4(Marking)	-	2000	-
10.1(Visual inspection)	-	3000	-
10.2(Maximum power determination)	-	25000	-
10.3(Insulation test)	-	20000	-
10.4(Measurement of temperature coefficients)	-	25000	-
10.5(Measurement of NOCT)	-	25000	-
10.6(Performance at STC and NOCT)	-	25000	-
10.7(Performance at low irradiance)	-	25000	-
10.8(Outdoor exposure test)	-	25000	-
10.9(Hot-spot endurance test)	-	25000	-
10.10(UV preconditioning)	-	70000	-
10.11(Thermal cycling test)	-	175000	-
10.12(Humidity freeze test)	-	70000	-
10.13(Damp heat test)	-	150000	-
10.14(Robustness of termination test)	-	25000	-
10.15(Wet leakage current test)	-	25000	-
10.16(Mechanical load test)	-	50000	-
10.17(Hail test)	-	25000	-
10.18(Bypass diode thermal' test)	-	20000	-

-
-

URS PRODUCTS AND TESTING PVT. LTD. (A29), NOIDA

8168906

IS 14286 : Part 1 (2023)

Terrestrial Photovoltaic PV Modules Design Qualification and Type Approval Part 1: Test Requirements (Third Revision)

1800000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
4.1(Visual inspection (MQT 01))	-	10000	-
4.2(Maximum power determination (MQT 02))	-	100000	-
4.3(Insulation test (MQT 03))	-	100000	-
4.4(Measurement of temperature coefficients (MQT 04))	-	100000	-
4.5(Placeholder section, formerly NMOT)	-	10000	-
4.6(Performance at STC (MQT 06.1))	-	100000	-
4.7(Performance at low irradiance (MQT 07))	-	100000	-
4.8(Outdoor exposure test (MQT 08))	-	100000	-
4.9(Hot-spot endurance test (MQT 09))	-	100000	-
4.10(UV preconditioning test (MQT 10))	-	100000	-
4.11(Thermal cycling test (MQT 11))	-	100000	-
4.12(2 Humidity-freeze test (MQT 12))	-	100000	-
4.13(Damp heat test (MQT 13))	-	100000	-
4.14(Robustness of terminations (MQT 14))	-	100000	-
4.15(5 Wet leakage current test (MQT 15))	-	100000	-
4.16(Static mechanical load test (MQT 16))	-	100000	-
4.17(Hail test (MQT 17))	-	100000	-
4.18(Bypass diode testing (MQT 18))	-	100000	-
4.19(Stabilization (MQT 19))	-	100000	-
4.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	100000	-
4.21(Potential induced degradation test (MQT 21))	-	100000	-
4.22(Bending test (MQT 22))	-	100000	-

-
Included w.e.f 04.03.2025

URS PRODUCTS AND TESTING PVT. LTD. (A29), NOIDA

8168906

IS 14286 : Part 1 : Sec 1 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-1: Special requirements for testing of crystalline silicon photovoltaic PV modules Third Revision

1450000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	10000	-
Cl-11.1(Visual inspection)	-	10000	-
Cl-11.2(Maximum power determination)	-	200000	-
Cl-11.3(Insulation test)	-	200000	-
Cl-11.4(Measurement of temperature coefficients)	-	200000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	10000	-
Cl-11.6(Performance at STC)	-	200000	-
Cl-11.7(Performance at low irradiance)	-	100000	-
Cl-11.8(Outdoor exposure test)	-	100000	-
Cl-11.9(Hot-spot endurance test)	-	100000	-
Cl-11.10(UV preconditioning test)	-	100000	-
Cl-11.11(Thermal cycling test)	-	200000	-
Cl-11.12(Humidity-freeze test)	-	200000	-
Cl-11.13(Damp heat test)	-	100000	-
Cl-11.14(Robustness of terminations test)	-	100000	-
Cl-11.15(Wet leakage current tes)	-	100000	-
Cl-11.16(Static mechanical load test)	-	100000	-
Cl-11.17(Hail test)	-	100000	-
Cl-11.18(Bypass diode thermal test)	-	100000	-
Cl-11.19(Stabilization)	-	100000	-
5(Marking and documentation)	-	100000	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	100000	-
11.21(Potential induced degradation test (MQT 21))	-	100000	-
11.22(Bending test (MQT 22))	-	100000	-

-
Included w.e.f 04.03.2025

TUV Rheinland (India) Pvt., Ltd., Bengaluru (6162126)

6162126

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

850000.00 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
10.1(Visual inspection)	-	25000.00	-
10.2(Maximum power determination)	-	50000.00	-
10.3(Insulation test)	-	25000.00	-
10.4(Measurement of temperature coefficients)	-	50000.00	-
10.5(Measurement of NOCT)	-	50000.00	-
10.6(Performance at STC and NOCT)	-	10000.00	-
10.7(Performance at low irradiance)	-	7500.00	-
10.8(Outdoor exposure test)	-	7500.00	-
10.9(Hot-spot endurance test)	-	75000.00	-
10.10(UV preconditioning)	-	50000.00	-
10.11(Thermal cycling test)	-	150000.00	-
10.12(Humidity freeze test)	-	75000.00	-
10.13(Damp heat test)	-	75000.00	-
10.14(Robustness of termination test)	-	25000.00	-
10.15(Wet leakage current test)	-	25000.00	-
10.16(Mechanical load test)	-	50000.00	-
10.17(Hail test)	-	50000.00	-
10.18(Bypass diode thermal' test)	-	40000.00	-
4(Marking)	-	10000.00	-

10 Sep, 2027

-
-

Mitsui Chemicals India Pvt. Ltd., Ahmedabad

7166626

IS 14286 : Part 1 : Sec 1 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-1: Special requirements for testing of crystalline silicon photovoltaic PV modules Third Revision

1814240 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection)	-	17200	-
Cl-11.2(Maximum power determination)	-	55200	-
Cl-11.3(Insulation test)	-	12650	-
Cl-11.4(Measurement of temperature coefficients)	-	27600	-
Cl-11.5(Measurement of nominal module operating temperature)	-	0	-
Cl-11.6(Performance at STC)	-	294000	-
Cl-11.7(Performance at low irradiance)	-	4600	-
Cl-11.8(Outdoor exposure test)	-	23040	-
Cl-11.9(Hot-spot endurance test)	-	67200	-
Cl-11.10(UV preconditioning test)	-	53520	-
Cl-11.11(Thermal cycling test)	-	94080	-
Cl-11.12(Humidity-freeze test)	-	35376	-
Cl-11.13(Damp heat test)	-	122535	-
Cl-11.14(Robustness of terminations test)	-	1272	-
Cl-11.15(Wet leakage current tes)	-	33800	-
Cl-11.16(Static mechanical load test)	-	13680	-
Cl-11.17(Hail test)	-	15120	-
Cl-11.18(Bypass diode thermal test)	-	12560	-
Cl-11.19(Stabilization)	-	2100	-
5(Marking and documentation)	-	0	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	11400	-
11.21(Potential induced degradation test (MQT 21))	-	26000	-
11.22(Bending test (MQT 22))	-	4000	-
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection)	-	0	-
Cl-11.2(Maximum power determination)	-	0	-
Cl-11.3(Insulation test)	-	0	-
Cl-11.4(Measurement of temperature coefficients)	-	0	-
Cl-11.5(Measurement of nominal module operating temperature)	-	0	-
Cl-11.6(Performance at STC)	-	0	-
Cl-11.7(Performance at low irradiance)	-	0	-
Cl-11.8(Outdoor exposure test)	-	0	-
Cl-11.9(Hot-spot endurance test)	-	0	-
Cl-11.10(UV preconditioning test)	-	0	-
Cl-11.11(Thermal cycling test)	-	0	-
Cl-11.12(Humidity-freeze test)	-	0	-
Cl-11.13(Damp heat test)	-	0	-
Cl-11.14(Robustness of terminations test)	-	0	-
Cl-11.15(Wet leakage current tes)	-	0	-
Cl-11.16(Static mechanical load test)	-	0	-
Cl-11.17(Hail test)	-	0	-
Cl-11.18(Bypass diode thermal test)	-	0	-
Cl-11.19(Stabilization)	-	0	-
5(Marking and documentation)	-	0	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	0	-
11.21(Potential induced degradation test (MQT 21))	-	0	-
11.22(Bending test (MQT 22))	-	0	-
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection)	-	0	-
Cl-11.2(Maximum power determination)	-	0	-
Cl-11.3(Insulation test)	-	0	-
Cl-11.4(Measurement of temperature coefficients)	-	0	-
Cl-11.5(Measurement of nominal module operating temperature)	-	0	-
Cl-11.6(Performance at STC)	-	0	-
Cl-11.7(Performance at low irradiance)	-	0	-
Cl-11.8(Outdoor exposure test)	-	0	-
Cl-11.9(Hot-spot endurance test)	-	0	-
Cl-11.10(UV preconditioning test)	-	0	-
Cl-11.11(Thermal cycling test)	-	0	-
Cl-11.12(Humidity-freeze test)	-	0	-
Cl-11.13(Damp heat test)	-	0	-
Cl-11.14(Robustness of terminations test)	-	0	-
Cl-11.15(Wet leakage current tes)	-	0	-
Cl-11.16(Static mechanical load test)	-	0	-
Cl-11.17(Hail test)	-	0	-
Cl-11.18(Bypass diode thermal test)	-	0	-
Cl-11.19(Stabilization)	-	0	-
5(Marking and documentation)	-	0	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	0	-
11.21(Potential induced degradation test (MQT 21))	-	0	-
11.22(Bending test (MQT 22))	-	0	-

02 Dec, 2026

-
Included w.e.f. 04.04.2025

Hi Physix Laboratory India Private Limited, Pune

7126926

IS 14286 : Part 1 : Sec 2 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-2: Special requirements for testing of thin-film Cadmium Telluride CdTe based photovoltaic PV modules Third Revision

1985000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection)	-	20000	-
Cl-11.2(Maximum power determination)	-	30000	-
Cl-11.3(Insulation tes)	-	15000	-
Cl-11.4(Measurement of temperature coefficients)	-	60000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	0	-
Cl-11.6(Performance at STC and NMOT)	-	30000	-
Cl-11.7(Performance at low irradiance)	-	30000	-
Cl-11.8(Outdoor exposure test)	-	30000	-
Cl-11.9(Hot-spot endurance test)	-	200000	-
Cl-11.10(UV preconditioning test)	-	150000	-
Cl-11.11(Thermal cycling test)	-	250000	-
Cl-11.12(Humidity-freeze test)	-	100000	-
Cl-11.13(Damp heat test)	-	150000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current test)	-	20000	-
Cl-11.16(Static mechanical load test)	-	40000	-
Cl-11.17(Hail test)	-	20000	-
Cl-11.18(Bypass diode testing)	-	80000	-
Cl-11.19(Stabilization)	-	300000	-
5(Marking and documentation)	-	5000	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	120000	-
11.21(Potential induced degradation test (MQT 21))	-	300000	-
11.22(Bending test (MQT 22))	-	20000	-

20 Jun, 2028

-
Included w.e.f.08.11.2024

Hi Physix Laboratory India Private Limited, Pune

7126926

IS 14286 : Part 1 : Sec 1 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-1: Special requirements for testing of crystalline silicon photovoltaic PV modules Third Revision

1835000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection)	-	20000	-
Cl-11.2(Maximum power determination)	-	30000	-
Cl-11.3(Insulation test)	-	15000	-
Cl-11.4(Measurement of temperature coefficients)	-	60000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	0	-
Cl-11.6(Performance at STC)	-	30000	-
Cl-11.7(Performance at low irradiance)	-	30000	-
Cl-11.8(Outdoor exposure test)	-	30000	-
Cl-11.9(Hot-spot endurance test)	-	200000	-
Cl-11.10(UV preconditioning test)	-	150000	-
Cl-11.11(Thermal cycling test)	-	250000	-
Cl-11.12(Humidity-freeze test)	-	100000	-
Cl-11.13(Damp heat test)	-	150000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current tes)	-	20000	-
Cl-11.16(Static mechanical load test)	-	40000	-
Cl-11.17(Hail test)	-	20000	-
Cl-11.18(Bypass diode thermal test)	-	80000	-
Cl-11.19(Stabilization)	-	150000	-
5(Marking and documentation)	-	5000	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	120000	-
11.21(Potential induced degradation test (MQT 21))	-	300000	-
11.22(Bending test (MQT 22))	-	20000	-

20 Jun, 2028

-
Included w.e.f 05.11.2024

UL INDIA PRIVATE LIMITED, BENGALURU

6120526

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

CRYSTALLINE SILICON TERRESTRIAL PHOTOVOLTAIC (PV) MODUL

800000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
10.1(Visual inspection)	-	2000	-
10.2(Maximum power determination)	-	4000	-
10.3(Insulation test)	-	4000	-
10.5(Measurement of NOCT)	-	30000	-
10.6(Performance at STC and NOCT)	-	9000	-
10.7(Performance at low irradiance)	-	4000	-
10.8(Outdoor exposure test)	-	20000	-
10.9(Hot-spot endurance test)	-	15000	-
10.10(UV preconditioning)	-	35000	-
10.11(Thermal cycling test)	-	230000	-
10.12(Humidity freeze test)	-	150000	-
10.13(Damp heat test)	-	230000	-
10.14(Robustness of termination test)	-	10000	-
10.15(Wet leakage current test)	-	7000	-
10.16(Mechanical load test)	-	10000	-
10.17(Hail test)	-	10000	-
10.18(Bypass diode thermal' test)	-	10000	-
10.4(Measurement of temperature coefficients)	-	20000	-

-
-

Hi Physix Laboratory India Private Limited, Pune

7126926

IS 14286 : Part 1 : Sec 4 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-4: Special requirements for testing of thin-film CuInGASSe2 based photovoltaic PV modules Third Revision

1985000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection (MQT 01))	-	20000	-
Cl-11.2(Maximum power determination (MQT 02))	-	30000	-
Cl-11.3(Insulation test (MQT 03))	-	15000	-
Cl-11.4(Measurement of temperature coefficients (MQT 04))	-	60000	-
Cl-11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	0	-
Cl-11.6(Performance at STC (MQT 06.1) and NMOT (MQT 06.2)	-	30000	-
Cl-11.7(Performance at low irradiance (MQT 07))	-	30000	-
Cl-11.8(Outdoor exposure test (MQT 08))	-	30000	-
Cl-11.9(Hot-spot endurance test (MQT 09))	-	200000	-
Cl-11.10(UV preconditioning test (MQT 10))	-	150000	-
Cl-11.11(Thermal cycling test (MQT 11))	-	250000	-
Cl-11.12(As per IEC 61215-1:2016)	-	100000	11.12 (Humidity-freeze test (MQT 12))
Cl-11.13(Damp heat test (MQT 13))	-	150000	-
Cl-11.14(Robustness of terminations test (MQT 14))	-	15000	-
Cl-11.15(Robustness of terminations test (MQT 14))	-	20000	11.15 (Wet leakage current test (MQT 15))
Cl-11.16(Static mechanical load test (MQT 16))	-	40000	-
Cl-11.17(Hail test (MQT 17))	-	20000	-
Cl-11.18(Bypass diode testing (MQT 18))	-	80000	-
Cl-11.19(Stabilization (MQT 19))	-	300000	-
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection (MQT 01))	-	0	-
Cl-11.2(Maximum power determination (MQT 02))	-	0	-
Cl-11.3(Insulation test (MQT 03))	-	0	-
Cl-11.4(Measurement of temperature coefficients (MQT 04))	-	0	-
Cl-11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	0	-
Cl-11.6(Performance at STC (MQT 06.1) and NMOT (MQT 06.2)	-	0	-
Cl-11.7(Performance at low irradiance (MQT 07))	-	0	-
Cl-11.8(Outdoor exposure test (MQT 08))	-	0	-
Cl-11.9(Hot-spot endurance test (MQT 09))	-	0	-
Cl-11.10(UV preconditioning test (MQT 10))	-	0	-
Cl-11.11(Thermal cycling test (MQT 11))	-	0	-
Cl-11.12(As per IEC 61215-1:2016)	-	0	-
Cl-11.13(Damp heat test (MQT 13))	-	0	-
Cl-11.14(Robustness of terminations test (MQT 14))	-	0	-
Cl-11.15(Robustness of terminations test (MQT 14))	-	0	-
Cl-11.16(Static mechanical load test (MQT 16))	-	0	-
Cl-11.17(Hail test (MQT 17))	-	0	-
Cl-11.18(Bypass diode testing (MQT 18))	-	0	-
Cl-11.19(Stabilization (MQT 19))	-	0	-
5(Marking and documentation)	-	5000	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	120000	-
11.21(Potential induced degradation test (MQT 21))	-	300000	-
11.22(Bending test (MQT 22))	-	20000	-

20 Jun, 2028

-
Included w.e.f 05.11.2024

ACE TEST LAB PRIVATE LIMITED (8166826), DELHI

8166826

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

740000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
4(Marking)	-	39333.33	-
10.1(Visual inspection)	-	39333.33	-
10.2(Maximum power determination)	-	39333.33	-
10.3(Insulation test)	-	39333.33	-
10.4(Measurement of temperature coefficients)	-	39333.33	-
10.5(Measurement of NOCT)	-	39333.33	-
10.6(Performance at STC and NOCT)	-	39333.33	-
10.7(Performance at low irradiance)	-	39333.33	-
10.8(Outdoor exposure test)	-	39333.33	-
10.9(Hot-spot endurance test)	-	39333.33	-
10.10(UV preconditioning)	-	39333.33	-
10.11(Thermal cycling test)	-	36888.90	-
10.12(Humidity freeze test)	-	36888.90	-
10.13(Damp heat test)	-	36888.92	-
10.14(Robustness of termination test)	-	39333.33	-
10.15(Wet leakage current test)	-	39333.33	-
10.16(Mechanical load test)	-	39333.33	-
10.17(Hail test)	-	39333.33	-
10.18(Bypass diode thermal' test)	-	39333.33	-

-
-

Hi Physix Laboratory India Private Limited, Pune

7126926

IS 14286 : Part 1 : Sec 3 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-3: Special requirements for testing of thin-film amorphous silicon based photovoltaic PV modules Third Revision

1985000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection)	-	20000	-
Cl-11.2(Maximum power determination)	-	30000	-
Cl-11.3(Insulation test)	-	15000	-
Cl-11.4(Measurement of temperature coefficients)	-	60000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	0	-
Cl-11.6(Performance at STC and NMOT)	-	30000	-
Cl-11.7(Performance at low irradiance)	-	30000	-
Cl-11.8(Outdoor exposure test)	-	30000	-
Cl-11.9(Hot-spot endurance test)	-	200000	-
Cl-11.10(UV preconditioning test)	-	150000	-
Cl-11.11(Thermal cycling test)	-	250000	-
Cl-11.12(Humidity-freeze test)	-	100000	-
Cl-11.13(Damp heat test)	-	150000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current test)	-	20000	-
Cl-11.16(Static mechanical load test)	-	40000	-
Cl-11.17(Hail test)	-	20000	-
Cl-11.18(Bypass diode testing)	-	80000	-
Cl-11.19(Stabilization)	-	300000	-
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection)	-	0	-
Cl-11.2(Maximum power determination)	-	0	-
Cl-11.3(Insulation test)	-	0	-
Cl-11.4(Measurement of temperature coefficients)	-	0	-
Cl-11.5(Measurement of nominal module operating temperature)	-	0	-
Cl-11.6(Performance at STC and NMOT)	-	0	-
Cl-11.7(Performance at low irradiance)	-	0	-
Cl-11.8(Outdoor exposure test)	-	0	-
Cl-11.9(Hot-spot endurance test)	-	0	-
Cl-11.10(UV preconditioning test)	-	0	-
Cl-11.11(Thermal cycling test)	-	0	-
Cl-11.12(Humidity-freeze test)	-	0	-
Cl-11.13(Damp heat test)	-	0	-
Cl-11.14(Robustness of terminations test)	-	0	-
Cl-11.15(Wet leakage current test)	-	0	-
Cl-11.16(Static mechanical load test)	-	0	-
Cl-11.17(Hail test)	-	0	-
Cl-11.18(Bypass diode testing)	-	0	-
Cl-11.19(Stabilization)	-	0	-
5(Marking and documentation)	-	5000	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	120000	-
11.21(Potential induced degradation test (MQT 21))	-	300000	-
11.22(Bending test (MQT 22))	-	20000	-

20 Jun, 2028

-
Included w.e.f 05.11.2024

DELHI TEST HOUSE (50) KUNDLI SONIPAT

9127026

IS 14286 : Part 1 : Sec 1 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-1: Special requirements for testing of crystalline silicon photovoltaic PV modules Third Revision

2005000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	6000	-
Cl-11.1(Visual inspection)	-	2000	-
Cl-11.2(Maximum power determination)	-	7000	-
Cl-11.3(Insulation test)	-	20000	-
Cl-11.4(Measurement of temperature coefficients)	-	110000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	5000	-
Cl-11.6(Performance at STC)	-	2500	-
Cl-11.7(Performance at low irradiance)	-	10000	-
Cl-11.8(Outdoor exposure test)	-	50000	-
Cl-11.9(Hot-spot endurance test)	-	125000	-
Cl-11.10(UV preconditioning test)	-	125000	-
Cl-11.11(Thermal cycling test)	-	160000	-
Cl-11.12(Humidity-freeze test)	-	80000	-
Cl-11.13(Damp heat test)	-	160000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current tes)	-	25000	-
Cl-11.16(Static mechanical load test)	-	50000	-
Cl-11.17(Hail test)	-	50000	-
Cl-11.18(Bypass diode thermal test)	-	75000	-
Cl-11.19(Stabilization)	-	95000	-
Cl-8(Major visual defects)	-	6000	-
Cl-11.1(Visual inspection)	-	2000	-
Cl-11.2(Maximum power determination)	-	7000	-
Cl-11.3(Insulation test)	-	20000	-
Cl-11.4(Measurement of temperature coefficients)	-	110000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	5000	-
Cl-11.6(Performance at STC)	-	2500	-
Cl-11.7(Performance at low irradiance)	-	10000	-
Cl-11.8(Outdoor exposure test)	-	50000	-
Cl-11.9(Hot-spot endurance test)	-	125000	-
Cl-11.10(UV preconditioning test)	-	125000	-
Cl-11.11(Thermal cycling test)	-	160000	-
Cl-11.12(Humidity-freeze test)	-	80000	-
Cl-11.13(Damp heat test)	-	160000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current tes)	-	25000	-
Cl-11.16(Static mechanical load test)	-	50000	-
Cl-11.17(Hail test)	-	50000	-
Cl-11.18(Bypass diode thermal test)	-	75000	-
Cl-11.19(Stabilization)	-	95000	-
5(Marking and documentation)	-	10000	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	25000	-
11.21(Potential induced degradation test (MQT 21))	-	400000	-
11.22(Bending test (MQT 22))	-	70000	-
Cl-8(Major visual defects)	-	6000	-
Cl-11.1(Visual inspection)	-	2000	-
Cl-11.2(Maximum power determination)	-	7000	-
Cl-11.3(Insulation test)	-	20000	-
Cl-11.4(Measurement of temperature coefficients)	-	110000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	5000	-
Cl-11.6(Performance at STC)	-	2500	-
Cl-11.7(Performance at low irradiance)	-	10000	-
Cl-11.8(Outdoor exposure test)	-	50000	-
Cl-11.9(Hot-spot endurance test)	-	125000	-
Cl-11.10(UV preconditioning test)	-	125000	-
Cl-11.11(Thermal cycling test)	-	160000	-
Cl-11.12(Humidity-freeze test)	-	80000	-
Cl-11.13(Damp heat test)	-	160000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current tes)	-	25000	-
Cl-11.16(Static mechanical load test)	-	50000	-
Cl-11.17(Hail test)	-	50000	-
Cl-11.18(Bypass diode thermal test)	-	75000	-
Cl-11.19(Stabilization)	-	95000	-
5(Marking and documentation)	-	10000	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	25000	-
11.21(Potential induced degradation test (MQT 21))	-	400000	-
11.22(Bending test (MQT 22))	-	70000	-

23 Jun, 2028

-
Included w.e.f.26.11.2024

Bharat Test House Pvt Ltd 1474 Sonipat Haryana

9135626

IS 14286 : Part 1 : Sec 4 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-4: Special requirements for testing of thin-film CuInGASSe2 based photovoltaic PV modules Third Revision

1502500 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	6000	-
Cl-11.1(Visual inspection (MQT 01))	-	2000	-
Cl-11.2(Maximum power determination (MQT 02))	-	7000	-
Cl-11.3(Insulation test (MQT 03))	-	20000	-
Cl-11.4(Measurement of temperature coefficients (MQT 04))	-	110000	-
Cl-11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	5000	-
Cl-11.6(Performance at STC (MQT 06.1) and NMOT (MQT 06.2)	-	2500	-
Cl-11.7(Performance at low irradiance (MQT 07))	-	10000	-
Cl-11.8(Outdoor exposure test (MQT 08))	-	50000	-
Cl-11.9(Hot-spot endurance test (MQT 09))	-	125000	-
Cl-11.10(UV preconditioning test (MQT 10))	-	125000	-
Cl-11.11(Thermal cycling test (MQT 11))	-	160000	-
Cl-11.12(As per IEC 61215-1:2016)	-	80000	-
Cl-11.13(Damp heat test (MQT 13))	-	160000	-
Cl-11.14(Robustness of terminations test (MQT 14))	-	15000	-
Cl-11.15(Robustness of terminations test (MQT 14))	-	25000	-
Cl-11.16(Static mechanical load test (MQT 16))	-	50000	-
Cl-11.17(Hail test (MQT 17))	-	50000	-
Cl-11.18(Bypass diode testing (MQT 18))	-	75000	-
Cl-11.19(Stabilization (MQT 19))	-	95000	-

19 Mar, 2029

-
-

Bharat Test House Pvt Ltd 1474 Sonipat Haryana

9135626

IS 14286 : Part 1 : Sec 3 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-3: Special requirements for testing of thin-film amorphous silicon based photovoltaic PV modules Third Revision

1502500 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	6000	-
Cl-11.1(Visual inspection)	-	2000	-
Cl-11.2(Maximum power determination)	-	7000	-
Cl-11.3(Insulation test)	-	20000	-
Cl-11.4(Measurement of temperature coefficients)	-	110000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	5000	-
Cl-11.6(Performance at STC and NMOT)	-	2500	-
Cl-11.7(Performance at low irradiance)	-	10000	-
Cl-11.8(Outdoor exposure test)	-	50000	-
Cl-11.9(Hot-spot endurance test)	-	125000	-
Cl-11.10(UV preconditioning test)	-	125000	-
Cl-11.11(Thermal cycling test)	-	160000	-
Cl-11.12(Humidity-freeze test)	-	80000	-
Cl-11.13(Damp heat test)	-	160000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current test)	-	25000	-
Cl-11.16(Static mechanical load test)	-	50000	-
Cl-11.17(Hail test)	-	50000	-
Cl-11.18(Bypass diode testing)	-	75000	-
Cl-11.19(Stabilization)	-	95000	-

19 Mar, 2029

-
-

Bharat Test House Pvt Ltd 1474 Sonipat Haryana

9135626

IS 14286 : Part 1 : Sec 2 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-2: Special requirements for testing of thin-film Cadmium Telluride CdTe based photovoltaic PV modules Third Revision

Thin-film Cadmium Telluride CdTe based PV Modules

1502500 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	6000	-
Cl-11.1(Visual inspection)	-	2000	-
Cl-11.2(Maximum power determination)	-	7000	-
Cl-11.3(Insulation tes)	-	20000	-
Cl-11.4(Measurement of temperature coefficients)	-	110000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	5000	-
Cl-11.6(Performance at STC and NMOT)	-	2500	-
Cl-11.7(Performance at low irradiance)	-	10000	-
Cl-11.8(Outdoor exposure test)	-	50000	-
Cl-11.9(Hot-spot endurance test)	-	125000	-
Cl-11.10(UV preconditioning test)	-	125000	-
Cl-11.11(Thermal cycling test)	-	160000	-
Cl-11.12(Humidity-freeze test)	-	80000	-
Cl-11.13(Damp heat test)	-	160000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current test)	-	25000	-
Cl-11.16(Static mechanical load test)	-	50000	-
Cl-11.17(Hail test)	-	50000	-
Cl-11.18(Bypass diode testing)	-	75000	-
Cl-11.19(Stabilization)	-	95000	-

19 Mar, 2029

-
-

Bharat Test House Pvt Ltd 1474 Sonipat Haryana

9135626

IS 14286 : Part 1 : Sec 1 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-1: Special requirements for testing of crystalline silicon photovoltaic PV modules Third Revision

1502500 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	6000	-
Cl-11.1(Visual inspection)	-	2000	-
Cl-11.2(Maximum power determination)	-	7000	-
Cl-11.3(Insulation test)	-	20000	-
Cl-11.4(Measurement of temperature coefficients)	-	110000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	5000	-
Cl-11.6(Performance at STC)	-	2500	-
Cl-11.7(Performance at low irradiance)	-	10000	-
Cl-11.8(Outdoor exposure test)	-	50000	-
Cl-11.9(Hot-spot endurance test)	-	125000	-
Cl-11.10(UV preconditioning test)	-	125000	-
Cl-11.11(Thermal cycling test)	-	160000	-
Cl-11.12(Humidity-freeze test)	-	80000	-
Cl-11.13(Damp heat test)	-	160000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current tes)	-	25000	-
Cl-11.16(Static mechanical load test)	-	50000	-
Cl-11.17(Hail test)	-	50000	-
Cl-11.18(Bypass diode thermal test)	-	75000	-
Cl-11.19(Stabilization)	-	95000	-

19 Mar, 2029

-
including w.e.f. 09.10.2024

Mitsui Chemicals India Pvt. Ltd., Ahmedabad

7166626

IS 14286 : Part 1 : Sec 1 (2019)

1298050 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
11.1(Visual inspection (MQT 01))	-	45500	-
11.2(Maximum power determination (MQT 02))	-	45000	-
11.3(Insulation test (MQT 03))	-	10000	-
11.4(Measurement of temperature coefficients (MQT 04))	-	65000	-
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	18200	-
11.6(Performance at STC and NMOT (MQT 06))	-	5000	-
11.7(Performance at low irradiance (MQT 07))	-	5000	-
11.8(Outdoor exposure test (MQT 08))	-	52200	-
11.9(Hot-spot endurance test (MQT 09))	-	36400	-
11.1(UV preconditioning test (MQT 10))	-	36400	-
11.11(Thermal cycling test (MQT 11))	-	400000	-
11.12(Humidity-freeze test (MQT 12))	-	118800	-
11.13(Damp heat test (MQT 13))	-	18000	-
11.14(Robustness of terminations (MQT 14))	-	45500	-
11.15(Wet leakage current test (MQT 15))	-	63800	-
11.16(Static mechanical load test (MQT 16))	-	18200	-
11.17(Hail test (MQT 17))	-	22750	-
11.18(Bypass diode thermal test (MQT 18))	-	42300	-
11.19(Stabilization (MQT 19))	-	250000	-
11.1(Visual inspection (MQT 01))	-	45500	-
11.2(Maximum power determination (MQT 02))	-	45000	-
11.3(Insulation test (MQT 03))	-	10000	-
11.4(Measurement of temperature coefficients (MQT 04))	-	65000	-
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	18200	-
11.6(Performance at STC and NMOT (MQT 06))	-	5000	-
11.7(Performance at low irradiance (MQT 07))	-	5000	-
11.8(Outdoor exposure test (MQT 08))	-	52200	-
11.9(Hot-spot endurance test (MQT 09))	-	36400	-
11.1(UV preconditioning test (MQT 10))	-	36400	-
11.11(Thermal cycling test (MQT 11))	-	400000	-
11.12(Humidity-freeze test (MQT 12))	-	118800	-
11.13(Damp heat test (MQT 13))	-	18000	-
11.14(Robustness of terminations (MQT 14))	-	45500	-
11.15(Wet leakage current test (MQT 15))	-	63800	-
11.16(Static mechanical load test (MQT 16))	-	18200	-
11.17(Hail test (MQT 17))	-	22750	-
11.18(Bypass diode thermal test (MQT 18))	-	42300	-
11.19(Stabilization (MQT 19))	-	250000	-
5(Marking and documentation)	-	0	-
8(Major visual defects)	-	0	-
5(Marking and documentation)	-	0	-
8(Major visual defects)	-	0	-
11.1(Visual inspection (MQT 01))	-	-	-
11.2(Maximum power determination (MQT 02))	-	-	-
11.3(Insulation test (MQT 03))	-	-	-
11.4(Measurement of temperature coefficients (MQT 04))	-	-	-
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	-	-
11.6(Performance at STC and NMOT (MQT 06))	-	-	-
11.7(Performance at low irradiance (MQT 07))	-	-	-
11.8(Outdoor exposure test (MQT 08))	-	-	-
11.9(Hot-spot endurance test (MQT 09))	-	-	-
11.1(UV preconditioning test (MQT 10))	-	-	-
11.11(Thermal cycling test (MQT 11))	-	-	-
11.12(Humidity-freeze test (MQT 12))	-	-	-
11.13(Damp heat test (MQT 13))	-	-	-
11.14(Robustness of terminations (MQT 14))	-	-	-
11.15(Wet leakage current test (MQT 15))	-	-	-
11.16(Static mechanical load test (MQT 16))	-	-	-
11.17(Hail test (MQT 17))	-	-	-
11.18(Bypass diode thermal test (MQT 18))	-	-	-
11.19(Stabilization (MQT 19))	-	-	-
5(Marking and documentation)	-	-	-
8(Major visual defects)	-	-	-

02 Dec, 2026

-
-

Mitsui Chemicals India Pvt. Ltd., Ahmedabad

7166626

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

Solar Photovoltaic Modules

1280550 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
4(Marking)	-	50000	-
10.1(Visual inspection)	-	39033	-
10.2(Maximum power determination)	-	49662	-
10.3(Insulation test)	-	20840	-
10.4(Measurement of temperature coefficients)	-	65000	-
10.5(Measurement of NOCT)	-	38200	-
10.6(Performance at STC and NOCT)	-	49662	-
10.7(Performance at low irradiance)	-	7500	-
10.8(Outdoor exposure test)	-	52200	-
10.9(Hot-spot endurance test)	-	33318	-
10.10(UV preconditioning)	-	36400	-
10.11(Thermal cycling test)	-	372400	-
10.12(Humidity freeze test)	-	136400	-
10.13(Damp heat test)	-	318000	-
10.14(Robustness of termination test)	-	45500	-
10.15(Wet leakage current test)	-	163800	-
10.16(Mechanical load test)	-	38200	-
10.17(Hail test)	-	22750	-
10.18(Bypass diode thermal' test)	-	42300	-

02 Dec, 2026

-
-

Bharat Test House Pvt Ltd 1474 Sonipat Haryana

9135626

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

Crystalline Silicon Terrestrial Photovoltaic Module

700000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
4(Marking)	-	0	NA
10.1(Visual inspection)	-	2000	5% discount for BIS
10.2(Maximum power determination)	-	5000	5% discount for BIS
10.3(Insulation test)	-	3000	5% discount for BIS
10.4(Measurement of temperature coefficients)	-	10000	5% discount for BIS
10.5(Measurement of NOCT)	-	5000	5% discount for BIS
10.6(Performance at STC and NOCT)	-	9000	5% discount for BIS
10.7(Performance at low irradiance)	-	5000	5% discount for BIS
10.8(Outdoor exposure test)	-	8000	5% discount for BIS
10.9(Hot-spot endurance test)	-	10000	5% discount for BIS
10.10(UV preconditioning)	-	55000	5% discount for BIS
10.11(Thermal cycling test)	-	255000	5% discount for BIS
10.12(Humidity freeze test)	-	95000	5% discount for BIS
10.13(Damp heat test)	-	200000	5% discount for BIS
10.14(Robustness of termination test)	-	5000	5% discount for BIS
10.15(Wet leakage current test)	-	6000	5% discount for BIS
10.16(Mechanical load test)	-	12000	5% discount for BIS
10.17(Hail test)	-	8000	5% discount for BIS
10.18(Bypass diode thermal' test)	-	7000	5% discount for BIS

19 Mar, 2029

-
-

Bharat Test House Pvt Ltd 1474 Sonipat Haryana

9135626

IS 14286 : Part 1 : Sec 2 (2019)

Terrestrial Photovoltaic (PV) Modules

750000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
11.19(Stabilization (MQT 19))	-	42500	5% discount for BIS
11.18(Bypass diode thermal test (MQT 18))	-	27500	5% discount for BIS
11.19 IS 14286( Stabilization )	-	42500	5% discount for BIS
11.18 IS 14286( Bypass diode testing)	-	27500	5% discount for BIS
11.17, Table 3 & 4, IS 14286( Hail test)	-	52500	5% discount for BIS
11.16 IS 14286( Static Mechanical load test)	-	25000	5% discount for BIS
11.15 IS 14286( Wet leakage current test)	-	25000	5% discount for BIS
11.14, Table 1 IS 14286( Robutness of terminations test - Retention of Junction Box on Mounting Surface - Test of Cord Anchorage)	-	20000	5% discount for BIS
11.13 IS 14286(Damp heat test)	-	42500	5% discount for BIS
11.12 IS 14286( Humidity-freeze test)	-	57500	5% discount for BIS
11.11 IS 14286( Thermal cycling test)	-	50000	5% discount for BIS
11.10 IS 14286( UV Preconditioning test )	-	37500	5% discount for BIS
11.9 IS 14286( Hot-spot endurance test)	-	80000	5% discount for BIS
11.8 IS 14286( Outdoor exposure Test)	-	32500	5% discount for BIS
11.7 IS 14286( Performance at low irradiance)	-	57500	5% discount for BIS
11.6 IS 14286( Performance at STC and NMOT)	-	60000	5% discount for BIS
11.5 IS 14286( Measurement of nominal module operating temperature (NMOT))	-	55000	5% discount for BIS
11.4 IS 14286( Measurement of temperature coefficients)	-	55000	5% discount for BIS
11.3 IS 14286( Insulation Test)	-	15000	5% discount for BIS
11.2 IS 14286( Maximum power determination)	-	7500	5% discount for BIS
11.1 IS 14286( Visual inspection)	-	7500	5% discount for BIS
5 IS 14286( Marking and Documentation)	-	0	5% discount for BIS

19 Mar, 2029

-
-

Central Power Research Institute (CPRI), Bangalore

6101024

IS 14286 : Part 1 : Sec 1 (2019)

1295440 View breakup
-

Clause No.	Exclusion	Remark
11.1(Visual inspection (MQT 01))	-	Individual charge not available
11.2(Maximum power determination (MQT 02))	-	Individual charge not available
11.3(Insulation test (MQT 03))	-	Individual charge not available
11.4(Measurement of temperature coefficients (MQT 04))	-	Individual charge not available
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	Individual charge not available
11.6(Performance at STC and NMOT (MQT 06))	-	Individual charge not available
11.7(Performance at low irradiance (MQT 07))	-	Individual charge not available
11.8(Outdoor exposure test (MQT 08))	-	Individual charge not available
11.9(Hot-spot endurance test (MQT 09))	-	Individual charge not available
11.1(UV preconditioning test (MQT 10))	-	Individual charge not available
11.11(Thermal cycling test (MQT 11))	-	Individual charge not available
11.12(Humidity-freeze test (MQT 12))	-	Individual charge not available
11.13(Damp heat test (MQT 13))	-	Individual charge not available
11.14(Robustness of terminations (MQT 14))	-	Individual charge not available
11.15(Wet leakage current test (MQT 15))	-	Individual charge not available
11.16(Static mechanical load test (MQT 16))	-	Individual charge not available
11.17(Hail test (MQT 17))	-	Individual charge not available
11.18(Bypass diode thermal test (MQT 18))	-	Individual charge not available
11.19(Stabilization (MQT 19))	-	Individual charge not available
5(Marking and documentation)	-	Individual charge not available
8(Major visual defects)	-	Individual charge not available

31 Dec, 2026

-
Included w.e.f 16.05.2024

DELHI TEST HOUSE (50) KUNDLI SONIPAT

9127026

IS 14286 : Part 1 : Sec 1 (2019)

700000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
11.1(Visual inspection (MQT 01))	-	20000	-
11.2(Maximum power determination (MQT 02))	-	20000	-
11.3(Insulation test (MQT 03))	-	10000	-
11.4(Measurement of temperature coefficients (MQT 04))	-	30000	-
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	30000	-
11.6(Performance at STC and NMOT (MQT 06))	-	30000	-
11.7(Performance at low irradiance (MQT 07))	-	30000	-
11.8(Outdoor exposure test (MQT 08))	-	30000	-
11.9(Hot-spot endurance test (MQT 09))	-	45000	-
11.1(UV preconditioning test (MQT 10))	-	30000	-
11.11(Thermal cycling test (MQT 11))	-	70000	-
11.12(Humidity-freeze test (MQT 12))	-	85000	-
11.13(Damp heat test (MQT 13))	-	100000	-
11.14(Robustness of terminations (MQT 14))	-	20000	-
11.15(Wet leakage current test (MQT 15))	-	20000	-
11.16(Static mechanical load test (MQT 16))	-	30000	-
11.17(Hail test (MQT 17))	-	30000	-
11.18(Bypass diode thermal test (MQT 18))	-	40000	-
11.19(Stabilization (MQT 19))	-	30000	-

23 Jun, 2028

-
-

DELHI TEST HOUSE (50) KUNDLI SONIPAT

9127026

IS 14286 : Part 1 (2019)

Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements (Second Revision)

1100000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
11(Test flow and procedures)	-	100000	-
5(Marking and documentation)	-	100000	-
7(Pass criteria)	-	300000	-
6(Testing)	-	100000	-
8(Major visual defects)	-	200000	-
8(Major visual defects)	-	200000	-
9(Report)	-	150000	-
10(Modifications)	-	150000	-

23 Jun, 2028

-
-

DELHI TEST HOUSE (50) KUNDLI SONIPAT

9127026

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

750000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
10.1(Visual inspection)	-	4000.0	--
10.2(Maximum power determination)	-	20000	-
10.3(Insulation test)	-	5000	-
10.4(Measurement of temperature coefficients)	-	20000	-
10.5(Measurement of NOCT)	-	20000	-
10.6(Performance at STC and NOCT)	-	15000	-
10.7(Performance at low irradiance)	-	15000	-
10.8(Outdoor exposure test)	-	35000	-
10.9(Hot-spot endurance test)	-	20000	-
10.10(UV preconditioning)	-	20000	-
10.11(Thermal cycling test)	-	200000	-
10.12(Humidity freeze test)	-	120000	-
10.13(Damp heat test)	-	220000	-
10.14(Robustness of termination test)	-	5000	-
10.15(Wet leakage current test)	-	5000	-
10.16(Mechanical load test)	-	15000	-
10.17(Hail test)	-	5000	-
10.18(Bypass diode thermal' test)	-	5000	-
4(Marking)	-	1000	-

23 Jun, 2028

-
-

Hi Physix Laboratory India Private Limited, Pune

7126926

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

740000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
4(Marking)	-	0	-
10.1(Visual inspection)	-	5000	-
10.2(Maximum power determination)	-	10000	-
10.3(Insulation test)	-	5000	-
10.4(Measurement of temperature coefficients)	-	20000	-
10.5(Measurement of NOCT)	-	20000	-
10.6(Performance at STC and NOCT)	-	20000	-
10.7(Performance at low irradiance)	-	10000	-
10.8(Outdoor exposure test)	-	30000	-
10.9(Hot-spot endurance test)	-	50000	-
10.10(UV preconditioning)	-	100000	-
10.11(Thermal cycling test)	-	150000	-
10.12(Humidity freeze test)	-	100000	-
10.13(Damp heat test)	-	150000	-
10.14(Robustness of termination test)	-	5000	-
10.15(Wet leakage current test)	-	5000	-
10.16(Mechanical load test)	-	20000	-
10.17(Hail test)	-	10000	-
10.18(Bypass diode thermal' test)	-	30000	-

20 Jun, 2028

-
-

Hi Physix Laboratory India Private Limited, Pune

7126926

IS 14286 : Part 1 : Sec 1 (2019)

1315000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
11.1(Visual inspection (MQT 01))	-	5000	-
11.2(Maximum power determination (MQT 02))	-	10000	-
11.3(Insulation test (MQT 03))	-	5000	-
11.4(Measurement of temperature coefficients (MQT 04))	-	60000	-
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	20000	-
11.6(Performance at STC and NMOT (MQT 06))	-	80000	-
11.7(Performance at low irradiance (MQT 07))	-	30000	-
11.8(Outdoor exposure test (MQT 08))	-	30000	-
11.9(Hot-spot endurance test (MQT 09))	-	200000	-
11.1(UV preconditioning test (MQT 10))	-	100000	-
11.11(Thermal cycling test (MQT 11))	-	250000	-
11.12(Humidity-freeze test (MQT 12))	-	100000	-
11.13(Damp heat test (MQT 13))	-	150000	-
11.14(Robustness of terminations (MQT 14))	-	10000	-
11.15(Wet leakage current test (MQT 15))	-	5000	-
11.16(Static mechanical load test (MQT 16))	-	20000	-
11.17(Hail test (MQT 17))	-	10000	-
11.18(Bypass diode thermal test (MQT 18))	-	80000	-
11.19(Stabilization (MQT 19))	-	150000	-

20 Jun, 2028

-
Including testing of IS 14286 (Part 1& 2):2019

Hi Physix Laboratory India Private Limited, Pune

7126926

IS 14286 : Part 1 : Sec 2 (2019)

1465000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
5 IS 14286( Marking and Documentation)	-	0	-
11.1 IS 14286( Visual inspection)	-	5000	-
11.2 IS 14286( Maximum power determination)	-	10000	-
11.3 IS 14286( Insulation Test)	-	5000	-
11.4 IS 14286( Measurement of temperature coefficients)	-	60000	-
11.5 IS 14286( Measurement of nominal module operating temperature (NMOT))	-	20000	-
11.6 IS 14286( Performance at STC and NMOT)	-	80000	-
11.7 IS 14286( Performance at low irradiance)	-	30000	-
11.8 IS 14286( Outdoor exposure Test)	-	30000	-
11.9 IS 14286( Hot-spot endurance test)	-	200000	-
11.10 IS 14286( UV Preconditioning test )	-	100000	-
11.11 IS 14286( Thermal cycling test)	-	250000	-
11.12 IS 14286( Humidity-freeze test)	-	100000	-
11.13 IS 14286(Damp heat test)	-	150000	-
11.14, Table 1 IS 14286( Robutness of terminations test - Retention of Junction Box on Mounting Surface - Test of Cord Anchorage)	-	10000	-
11.15 IS 14286( Wet leakage current test)	-	5000	-
11.16 IS 14286( Static Mechanical load test)	-	20000	-
11.17, Table 3 & 4, IS 14286( Hail test)	-	10000	-
11.18 IS 14286( Bypass diode testing)	-	80000	-
11.19 IS 14286( Stabilization )	-	300000	-

20 Jun, 2028

-
Including testing of IS 14286 (Part 1& 2):2019

Bureau of Indian Standards

The National Standards Body of India

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