| 31 |
TUV Rheinland (India) Pvt., Ltd., Bengaluru (6162126)
| 6162126
| IS 14286 (2010) |
Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision) |
- |
850000.00 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 10.1(Visual inspection) |
- |
25000.00 |
|
- |
| 10.2(Maximum power determination) |
- |
50000.00 |
|
- |
| 10.3(Insulation test) |
- |
25000.00 |
|
- |
| 10.4(Measurement of temperature coefficients) |
- |
50000.00 |
|
- |
| 10.5(Measurement of NOCT) |
- |
50000.00 |
|
- |
| 10.6(Performance at STC and NOCT) |
- |
10000.00 |
|
- |
| 10.7(Performance at low irradiance) |
- |
7500.00 |
|
- |
| 10.8(Outdoor exposure test) |
- |
7500.00 |
|
- |
| 10.9(Hot-spot endurance test) |
- |
75000.00 |
|
- |
| 10.10(UV preconditioning) |
- |
50000.00 |
|
- |
| 10.11(Thermal cycling test) |
- |
150000.00 |
|
- |
| 10.12(Humidity freeze test) |
- |
75000.00 |
|
- |
| 10.13(Damp heat test) |
- |
75000.00 |
|
- |
| 10.14(Robustness of termination test) |
- |
25000.00 |
|
- |
| 10.15(Wet leakage current test) |
- |
25000.00 |
|
- |
| 10.16(Mechanical load test) |
- |
50000.00 |
|
- |
| 10.17(Hail test) |
- |
50000.00 |
|
- |
| 10.18(Bypass diode thermal' test) |
- |
40000.00 |
|
- |
| 4(Marking) |
- |
10000.00 |
|
- |
|
10 Sep, 2027 |
-
- |
| 32 |
Mitsui Chemicals India Pvt. Ltd., Ahmedabad
| 7166626
| IS 14286 : Part 1 : Sec 1 (2023) |
Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-1: Special requirements for testing of crystalline silicon photovoltaic PV modules Third Revision |
- |
1814240 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| Cl-8(Major visual defects) |
- |
0 |
|
- |
| Cl-11.1(Visual inspection) |
- |
17200 |
|
- |
| Cl-11.2(Maximum power determination) |
- |
55200 |
|
- |
| Cl-11.3(Insulation test) |
- |
12650 |
|
- |
| Cl-11.4(Measurement of temperature coefficients) |
- |
27600 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature) |
- |
0 |
|
- |
| Cl-11.6(Performance at STC) |
- |
294000 |
|
- |
| Cl-11.7(Performance at low irradiance) |
- |
4600 |
|
- |
| Cl-11.8(Outdoor exposure test) |
- |
23040 |
|
- |
| Cl-11.9(Hot-spot endurance test) |
- |
67200 |
|
- |
| Cl-11.10(UV preconditioning test) |
- |
53520 |
|
- |
| Cl-11.11(Thermal cycling test) |
- |
94080 |
|
- |
| Cl-11.12(Humidity-freeze test) |
- |
35376 |
|
- |
| Cl-11.13(Damp heat test) |
- |
122535 |
|
- |
| Cl-11.14(Robustness of terminations test) |
- |
1272 |
|
- |
| Cl-11.15(Wet leakage current tes) |
- |
33800 |
|
- |
| Cl-11.16(Static mechanical load test) |
- |
13680 |
|
- |
| Cl-11.17(Hail test) |
- |
15120 |
|
- |
| Cl-11.18(Bypass diode thermal test) |
- |
12560 |
|
- |
| Cl-11.19(Stabilization) |
- |
2100 |
|
- |
| 5(Marking and documentation) |
- |
0 |
|
- |
| 11.20(Cyclic (dynamic) mechanical load test (MQT 20)) |
- |
11400 |
|
- |
| 11.21(Potential induced degradation test (MQT 21)) |
- |
26000 |
|
- |
| 11.22(Bending test (MQT 22)) |
- |
4000 |
|
- |
| Cl-8(Major visual defects) |
- |
0 |
|
- |
| Cl-11.1(Visual inspection) |
- |
0 |
|
- |
| Cl-11.2(Maximum power determination) |
- |
0 |
|
- |
| Cl-11.3(Insulation test) |
- |
0 |
|
- |
| Cl-11.4(Measurement of temperature coefficients) |
- |
0 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature) |
- |
0 |
|
- |
| Cl-11.6(Performance at STC) |
- |
0 |
|
- |
| Cl-11.7(Performance at low irradiance) |
- |
0 |
|
- |
| Cl-11.8(Outdoor exposure test) |
- |
0 |
|
- |
| Cl-11.9(Hot-spot endurance test) |
- |
0 |
|
- |
| Cl-11.10(UV preconditioning test) |
- |
0 |
|
- |
| Cl-11.11(Thermal cycling test) |
- |
0 |
|
- |
| Cl-11.12(Humidity-freeze test) |
- |
0 |
|
- |
| Cl-11.13(Damp heat test) |
- |
0 |
|
- |
| Cl-11.14(Robustness of terminations test) |
- |
0 |
|
- |
| Cl-11.15(Wet leakage current tes) |
- |
0 |
|
- |
| Cl-11.16(Static mechanical load test) |
- |
0 |
|
- |
| Cl-11.17(Hail test) |
- |
0 |
|
- |
| Cl-11.18(Bypass diode thermal test) |
- |
0 |
|
- |
| Cl-11.19(Stabilization) |
- |
0 |
|
- |
| 5(Marking and documentation) |
- |
0 |
|
- |
| 11.20(Cyclic (dynamic) mechanical load test (MQT 20)) |
- |
0 |
|
- |
| 11.21(Potential induced degradation test (MQT 21)) |
- |
0 |
|
- |
| 11.22(Bending test (MQT 22)) |
- |
0 |
|
- |
| Cl-8(Major visual defects) |
- |
0 |
|
- |
| Cl-11.1(Visual inspection) |
- |
0 |
|
- |
| Cl-11.2(Maximum power determination) |
- |
0 |
|
- |
| Cl-11.3(Insulation test) |
- |
0 |
|
- |
| Cl-11.4(Measurement of temperature coefficients) |
- |
0 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature) |
- |
0 |
|
- |
| Cl-11.6(Performance at STC) |
- |
0 |
|
- |
| Cl-11.7(Performance at low irradiance) |
- |
0 |
|
- |
| Cl-11.8(Outdoor exposure test) |
- |
0 |
|
- |
| Cl-11.9(Hot-spot endurance test) |
- |
0 |
|
- |
| Cl-11.10(UV preconditioning test) |
- |
0 |
|
- |
| Cl-11.11(Thermal cycling test) |
- |
0 |
|
- |
| Cl-11.12(Humidity-freeze test) |
- |
0 |
|
- |
| Cl-11.13(Damp heat test) |
- |
0 |
|
- |
| Cl-11.14(Robustness of terminations test) |
- |
0 |
|
- |
| Cl-11.15(Wet leakage current tes) |
- |
0 |
|
- |
| Cl-11.16(Static mechanical load test) |
- |
0 |
|
- |
| Cl-11.17(Hail test) |
- |
0 |
|
- |
| Cl-11.18(Bypass diode thermal test) |
- |
0 |
|
- |
| Cl-11.19(Stabilization) |
- |
0 |
|
- |
| 5(Marking and documentation) |
- |
0 |
|
- |
| 11.20(Cyclic (dynamic) mechanical load test (MQT 20)) |
- |
0 |
|
- |
| 11.21(Potential induced degradation test (MQT 21)) |
- |
0 |
|
- |
| 11.22(Bending test (MQT 22)) |
- |
0 |
|
- |
|
02 Dec, 2026 |
-
Included w.e.f. 04.04.2025 |
| 33 |
Hi Physix Laboratory India Private Limited, Pune
| 7126926
| IS 14286 : Part 1 : Sec 2 (2023) |
Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-2: Special requirements for testing of thin-film Cadmium Telluride CdTe based photovoltaic PV modules Third Revision |
- |
1985000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| Cl-8(Major visual defects) |
- |
0 |
|
- |
| Cl-11.1(Visual inspection) |
- |
20000 |
|
- |
| Cl-11.2(Maximum power determination) |
- |
30000 |
|
- |
| Cl-11.3(Insulation tes) |
- |
15000 |
|
- |
| Cl-11.4(Measurement of temperature coefficients) |
- |
60000 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature) |
- |
0 |
|
- |
| Cl-11.6(Performance at STC and NMOT) |
- |
30000 |
|
- |
| Cl-11.7(Performance at low irradiance) |
- |
30000 |
|
- |
| Cl-11.8(Outdoor exposure test) |
- |
30000 |
|
- |
| Cl-11.9(Hot-spot endurance test) |
- |
200000 |
|
- |
| Cl-11.10(UV preconditioning test) |
- |
150000 |
|
- |
| Cl-11.11(Thermal cycling test) |
- |
250000 |
|
- |
| Cl-11.12(Humidity-freeze test) |
- |
100000 |
|
- |
| Cl-11.13(Damp heat test) |
- |
150000 |
|
- |
| Cl-11.14(Robustness of terminations test) |
- |
15000 |
|
- |
| Cl-11.15(Wet leakage current test) |
- |
20000 |
|
- |
| Cl-11.16(Static mechanical load test) |
- |
40000 |
|
- |
| Cl-11.17(Hail test) |
- |
20000 |
|
- |
| Cl-11.18(Bypass diode testing) |
- |
80000 |
|
- |
| Cl-11.19(Stabilization) |
- |
300000 |
|
- |
| 5(Marking and documentation) |
- |
5000 |
|
- |
| 11.20(Cyclic (dynamic) mechanical load test (MQT 20)) |
- |
120000 |
|
- |
| 11.21(Potential induced degradation test (MQT 21)) |
- |
300000 |
|
- |
| 11.22(Bending test (MQT 22)) |
- |
20000 |
|
- |
|
20 Jun, 2028 |
-
Included w.e.f.08.11.2024 |
| 34 |
Hi Physix Laboratory India Private Limited, Pune
| 7126926
| IS 14286 : Part 1 : Sec 1 (2023) |
Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-1: Special requirements for testing of crystalline silicon photovoltaic PV modules Third Revision |
- |
1835000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| Cl-8(Major visual defects) |
- |
0 |
|
- |
| Cl-11.1(Visual inspection) |
- |
20000 |
|
- |
| Cl-11.2(Maximum power determination) |
- |
30000 |
|
- |
| Cl-11.3(Insulation test) |
- |
15000 |
|
- |
| Cl-11.4(Measurement of temperature coefficients) |
- |
60000 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature) |
- |
0 |
|
- |
| Cl-11.6(Performance at STC) |
- |
30000 |
|
- |
| Cl-11.7(Performance at low irradiance) |
- |
30000 |
|
- |
| Cl-11.8(Outdoor exposure test) |
- |
30000 |
|
- |
| Cl-11.9(Hot-spot endurance test) |
- |
200000 |
|
- |
| Cl-11.10(UV preconditioning test) |
- |
150000 |
|
- |
| Cl-11.11(Thermal cycling test) |
- |
250000 |
|
- |
| Cl-11.12(Humidity-freeze test) |
- |
100000 |
|
- |
| Cl-11.13(Damp heat test) |
- |
150000 |
|
- |
| Cl-11.14(Robustness of terminations test) |
- |
15000 |
|
- |
| Cl-11.15(Wet leakage current tes) |
- |
20000 |
|
- |
| Cl-11.16(Static mechanical load test) |
- |
40000 |
|
- |
| Cl-11.17(Hail test) |
- |
20000 |
|
- |
| Cl-11.18(Bypass diode thermal test) |
- |
80000 |
|
- |
| Cl-11.19(Stabilization) |
- |
150000 |
|
- |
| 5(Marking and documentation) |
- |
5000 |
|
- |
| 11.20(Cyclic (dynamic) mechanical load test (MQT 20)) |
- |
120000 |
|
- |
| 11.21(Potential induced degradation test (MQT 21)) |
- |
300000 |
|
- |
| 11.22(Bending test (MQT 22)) |
- |
20000 |
|
- |
|
20 Jun, 2028 |
-
Included w.e.f 05.11.2024 |
| 35 |
UL INDIA PRIVATE LIMITED, BENGALURU
| 6120526
| IS 14286 (2010) |
Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision) |
CRYSTALLINE SILICON TERRESTRIAL PHOTOVOLTAIC (PV) MODUL |
800000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 10.1(Visual inspection) |
- |
2000 |
|
- |
| 10.2(Maximum power determination) |
- |
4000 |
|
- |
| 10.3(Insulation test) |
- |
4000 |
|
- |
| 10.5(Measurement of NOCT) |
- |
30000 |
|
- |
| 10.6(Performance at STC and NOCT) |
- |
9000 |
|
- |
| 10.7(Performance at low irradiance) |
- |
4000 |
|
- |
| 10.8(Outdoor exposure test) |
- |
20000 |
|
- |
| 10.9(Hot-spot endurance test) |
- |
15000 |
|
- |
| 10.10(UV preconditioning) |
- |
35000 |
|
- |
| 10.11(Thermal cycling test) |
- |
230000 |
|
- |
| 10.12(Humidity freeze test) |
- |
150000 |
|
- |
| 10.13(Damp heat test) |
- |
230000 |
|
- |
| 10.14(Robustness of termination test) |
- |
10000 |
|
- |
| 10.15(Wet leakage current test) |
- |
7000 |
|
- |
| 10.16(Mechanical load test) |
- |
10000 |
|
- |
| 10.17(Hail test) |
- |
10000 |
|
- |
| 10.18(Bypass diode thermal' test) |
- |
10000 |
|
- |
| 10.4(Measurement of temperature coefficients) |
- |
20000 |
|
- |
|
12 May, 2027 |
-
- |
| 36 |
Hi Physix Laboratory India Private Limited, Pune
| 7126926
| IS 14286 : Part 1 : Sec 4 (2023) |
Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-4: Special requirements for testing of thin-film CuInGASSe2 based photovoltaic PV modules Third Revision |
- |
1985000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| Cl-8(Major visual defects) |
- |
0 |
|
- |
| Cl-11.1(Visual inspection (MQT 01)) |
- |
20000 |
|
- |
| Cl-11.2(Maximum power determination (MQT 02)) |
- |
30000 |
|
- |
| Cl-11.3(Insulation test (MQT 03)) |
- |
15000 |
|
- |
| Cl-11.4(Measurement of temperature coefficients (MQT 04)) |
- |
60000 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05)) |
- |
0 |
|
- |
| Cl-11.6(Performance at STC (MQT 06.1) and NMOT (MQT 06.2) |
- |
30000 |
|
- |
| Cl-11.7(Performance at low irradiance (MQT 07)) |
- |
30000 |
|
- |
| Cl-11.8(Outdoor exposure test (MQT 08)) |
- |
30000 |
|
- |
| Cl-11.9(Hot-spot endurance test (MQT 09)) |
- |
200000 |
|
- |
| Cl-11.10(UV preconditioning test (MQT 10)) |
- |
150000 |
|
- |
| Cl-11.11(Thermal cycling test (MQT 11)) |
- |
250000 |
|
- |
| Cl-11.12(As per IEC 61215-1:2016) |
- |
100000 |
|
11.12 (Humidity-freeze test (MQT 12)) |
| Cl-11.13(Damp heat test (MQT 13)) |
- |
150000 |
|
- |
| Cl-11.14(Robustness of terminations test (MQT 14)) |
- |
15000 |
|
- |
| Cl-11.15(Robustness of terminations test (MQT 14)) |
- |
20000 |
|
11.15 (Wet leakage current test (MQT 15)) |
| Cl-11.16(Static mechanical load test (MQT 16)) |
- |
40000 |
|
- |
| Cl-11.17(Hail test (MQT 17)) |
- |
20000 |
|
- |
| Cl-11.18(Bypass diode testing (MQT 18)) |
- |
80000 |
|
- |
| Cl-11.19(Stabilization (MQT 19)) |
- |
300000 |
|
- |
| Cl-8(Major visual defects) |
- |
0 |
|
- |
| Cl-11.1(Visual inspection (MQT 01)) |
- |
0 |
|
- |
| Cl-11.2(Maximum power determination (MQT 02)) |
- |
0 |
|
- |
| Cl-11.3(Insulation test (MQT 03)) |
- |
0 |
|
- |
| Cl-11.4(Measurement of temperature coefficients (MQT 04)) |
- |
0 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05)) |
- |
0 |
|
- |
| Cl-11.6(Performance at STC (MQT 06.1) and NMOT (MQT 06.2) |
- |
0 |
|
- |
| Cl-11.7(Performance at low irradiance (MQT 07)) |
- |
0 |
|
- |
| Cl-11.8(Outdoor exposure test (MQT 08)) |
- |
0 |
|
- |
| Cl-11.9(Hot-spot endurance test (MQT 09)) |
- |
0 |
|
- |
| Cl-11.10(UV preconditioning test (MQT 10)) |
- |
0 |
|
- |
| Cl-11.11(Thermal cycling test (MQT 11)) |
- |
0 |
|
- |
| Cl-11.12(As per IEC 61215-1:2016) |
- |
0 |
|
- |
| Cl-11.13(Damp heat test (MQT 13)) |
- |
0 |
|
- |
| Cl-11.14(Robustness of terminations test (MQT 14)) |
- |
0 |
|
- |
| Cl-11.15(Robustness of terminations test (MQT 14)) |
- |
0 |
|
- |
| Cl-11.16(Static mechanical load test (MQT 16)) |
- |
0 |
|
- |
| Cl-11.17(Hail test (MQT 17)) |
- |
0 |
|
- |
| Cl-11.18(Bypass diode testing (MQT 18)) |
- |
0 |
|
- |
| Cl-11.19(Stabilization (MQT 19)) |
- |
0 |
|
- |
| 5(Marking and documentation) |
- |
5000 |
|
- |
| 11.20(Cyclic (dynamic) mechanical load test (MQT 20)) |
- |
120000 |
|
- |
| 11.21(Potential induced degradation test (MQT 21)) |
- |
300000 |
|
- |
| 11.22(Bending test (MQT 22)) |
- |
20000 |
|
- |
|
20 Jun, 2028 |
-
Included w.e.f 05.11.2024 |
| 37 |
ACE TEST LAB PRIVATE LIMITED (8166826), DELHI
| 8166826
| IS 14286 (2010) |
Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision) |
- |
740000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 4(Marking) |
- |
39333.33 |
|
- |
| 10.1(Visual inspection) |
- |
39333.33 |
|
- |
| 10.2(Maximum power determination) |
- |
39333.33 |
|
- |
| 10.3(Insulation test) |
- |
39333.33 |
|
- |
| 10.4(Measurement of temperature coefficients) |
- |
39333.33 |
|
- |
| 10.5(Measurement of NOCT) |
- |
39333.33 |
|
- |
| 10.6(Performance at STC and NOCT) |
- |
39333.33 |
|
- |
| 10.7(Performance at low irradiance) |
- |
39333.33 |
|
- |
| 10.8(Outdoor exposure test) |
- |
39333.33 |
|
- |
| 10.9(Hot-spot endurance test) |
- |
39333.33 |
|
- |
| 10.10(UV preconditioning) |
- |
39333.33 |
|
- |
| 10.11(Thermal cycling test) |
- |
36888.90 |
|
- |
| 10.12(Humidity freeze test) |
- |
36888.90 |
|
- |
| 10.13(Damp heat test) |
- |
36888.92 |
|
- |
| 10.14(Robustness of termination test) |
- |
39333.33 |
|
- |
| 10.15(Wet leakage current test) |
- |
39333.33 |
|
- |
| 10.16(Mechanical load test) |
- |
39333.33 |
|
- |
| 10.17(Hail test) |
- |
39333.33 |
|
- |
| 10.18(Bypass diode thermal' test) |
- |
39333.33 |
|
- |
|
07 Jan, 2027 |
-
- |
| 38 |
Hi Physix Laboratory India Private Limited, Pune
| 7126926
| IS 14286 : Part 1 : Sec 3 (2023) |
Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-3: Special requirements for testing of thin-film amorphous silicon based photovoltaic PV modules Third Revision |
- |
1985000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| Cl-8(Major visual defects) |
- |
0 |
|
- |
| Cl-11.1(Visual inspection) |
- |
20000 |
|
- |
| Cl-11.2(Maximum power determination) |
- |
30000 |
|
- |
| Cl-11.3(Insulation test) |
- |
15000 |
|
- |
| Cl-11.4(Measurement of temperature coefficients) |
- |
60000 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature) |
- |
0 |
|
- |
| Cl-11.6(Performance at STC and NMOT) |
- |
30000 |
|
- |
| Cl-11.7(Performance at low irradiance) |
- |
30000 |
|
- |
| Cl-11.8(Outdoor exposure test) |
- |
30000 |
|
- |
| Cl-11.9(Hot-spot endurance test) |
- |
200000 |
|
- |
| Cl-11.10(UV preconditioning test) |
- |
150000 |
|
- |
| Cl-11.11(Thermal cycling test) |
- |
250000 |
|
- |
| Cl-11.12(Humidity-freeze test) |
- |
100000 |
|
- |
| Cl-11.13(Damp heat test) |
- |
150000 |
|
- |
| Cl-11.14(Robustness of terminations test) |
- |
15000 |
|
- |
| Cl-11.15(Wet leakage current test) |
- |
20000 |
|
- |
| Cl-11.16(Static mechanical load test) |
- |
40000 |
|
- |
| Cl-11.17(Hail test) |
- |
20000 |
|
- |
| Cl-11.18(Bypass diode testing) |
- |
80000 |
|
- |
| Cl-11.19(Stabilization) |
- |
300000 |
|
- |
| Cl-8(Major visual defects) |
- |
0 |
|
- |
| Cl-11.1(Visual inspection) |
- |
0 |
|
- |
| Cl-11.2(Maximum power determination) |
- |
0 |
|
- |
| Cl-11.3(Insulation test) |
- |
0 |
|
- |
| Cl-11.4(Measurement of temperature coefficients) |
- |
0 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature) |
- |
0 |
|
- |
| Cl-11.6(Performance at STC and NMOT) |
- |
0 |
|
- |
| Cl-11.7(Performance at low irradiance) |
- |
0 |
|
- |
| Cl-11.8(Outdoor exposure test) |
- |
0 |
|
- |
| Cl-11.9(Hot-spot endurance test) |
- |
0 |
|
- |
| Cl-11.10(UV preconditioning test) |
- |
0 |
|
- |
| Cl-11.11(Thermal cycling test) |
- |
0 |
|
- |
| Cl-11.12(Humidity-freeze test) |
- |
0 |
|
- |
| Cl-11.13(Damp heat test) |
- |
0 |
|
- |
| Cl-11.14(Robustness of terminations test) |
- |
0 |
|
- |
| Cl-11.15(Wet leakage current test) |
- |
0 |
|
- |
| Cl-11.16(Static mechanical load test) |
- |
0 |
|
- |
| Cl-11.17(Hail test) |
- |
0 |
|
- |
| Cl-11.18(Bypass diode testing) |
- |
0 |
|
- |
| Cl-11.19(Stabilization) |
- |
0 |
|
- |
| 5(Marking and documentation) |
- |
5000 |
|
- |
| 11.20(Cyclic (dynamic) mechanical load test (MQT 20)) |
- |
120000 |
|
- |
| 11.21(Potential induced degradation test (MQT 21)) |
- |
300000 |
|
- |
| 11.22(Bending test (MQT 22)) |
- |
20000 |
|
- |
|
20 Jun, 2028 |
-
Included w.e.f 05.11.2024 |
| 39 |
DELHI TEST HOUSE (50) KUNDLI SONIPAT
| 9127026
| IS 14286 : Part 1 : Sec 1 (2023) |
Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-1: Special requirements for testing of crystalline silicon photovoltaic PV modules Third Revision |
- |
2005000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| Cl-8(Major visual defects) |
- |
6000 |
|
- |
| Cl-11.1(Visual inspection) |
- |
2000 |
|
- |
| Cl-11.2(Maximum power determination) |
- |
7000 |
|
- |
| Cl-11.3(Insulation test) |
- |
20000 |
|
- |
| Cl-11.4(Measurement of temperature coefficients) |
- |
110000 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature) |
- |
5000 |
|
- |
| Cl-11.6(Performance at STC) |
- |
2500 |
|
- |
| Cl-11.7(Performance at low irradiance) |
- |
10000 |
|
- |
| Cl-11.8(Outdoor exposure test) |
- |
50000 |
|
- |
| Cl-11.9(Hot-spot endurance test) |
- |
125000 |
|
- |
| Cl-11.10(UV preconditioning test) |
- |
125000 |
|
- |
| Cl-11.11(Thermal cycling test) |
- |
160000 |
|
- |
| Cl-11.12(Humidity-freeze test) |
- |
80000 |
|
- |
| Cl-11.13(Damp heat test) |
- |
160000 |
|
- |
| Cl-11.14(Robustness of terminations test) |
- |
15000 |
|
- |
| Cl-11.15(Wet leakage current tes) |
- |
25000 |
|
- |
| Cl-11.16(Static mechanical load test) |
- |
50000 |
|
- |
| Cl-11.17(Hail test) |
- |
50000 |
|
- |
| Cl-11.18(Bypass diode thermal test) |
- |
75000 |
|
- |
| Cl-11.19(Stabilization) |
- |
95000 |
|
- |
| Cl-8(Major visual defects) |
- |
6000 |
|
- |
| Cl-11.1(Visual inspection) |
- |
2000 |
|
- |
| Cl-11.2(Maximum power determination) |
- |
7000 |
|
- |
| Cl-11.3(Insulation test) |
- |
20000 |
|
- |
| Cl-11.4(Measurement of temperature coefficients) |
- |
110000 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature) |
- |
5000 |
|
- |
| Cl-11.6(Performance at STC) |
- |
2500 |
|
- |
| Cl-11.7(Performance at low irradiance) |
- |
10000 |
|
- |
| Cl-11.8(Outdoor exposure test) |
- |
50000 |
|
- |
| Cl-11.9(Hot-spot endurance test) |
- |
125000 |
|
- |
| Cl-11.10(UV preconditioning test) |
- |
125000 |
|
- |
| Cl-11.11(Thermal cycling test) |
- |
160000 |
|
- |
| Cl-11.12(Humidity-freeze test) |
- |
80000 |
|
- |
| Cl-11.13(Damp heat test) |
- |
160000 |
|
- |
| Cl-11.14(Robustness of terminations test) |
- |
15000 |
|
- |
| Cl-11.15(Wet leakage current tes) |
- |
25000 |
|
- |
| Cl-11.16(Static mechanical load test) |
- |
50000 |
|
- |
| Cl-11.17(Hail test) |
- |
50000 |
|
- |
| Cl-11.18(Bypass diode thermal test) |
- |
75000 |
|
- |
| Cl-11.19(Stabilization) |
- |
95000 |
|
- |
| 5(Marking and documentation) |
- |
10000 |
|
- |
| 11.20(Cyclic (dynamic) mechanical load test (MQT 20)) |
- |
25000 |
|
- |
| 11.21(Potential induced degradation test (MQT 21)) |
- |
400000 |
|
- |
| 11.22(Bending test (MQT 22)) |
- |
70000 |
|
- |
| Cl-8(Major visual defects) |
- |
6000 |
|
- |
| Cl-11.1(Visual inspection) |
- |
2000 |
|
- |
| Cl-11.2(Maximum power determination) |
- |
7000 |
|
- |
| Cl-11.3(Insulation test) |
- |
20000 |
|
- |
| Cl-11.4(Measurement of temperature coefficients) |
- |
110000 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature) |
- |
5000 |
|
- |
| Cl-11.6(Performance at STC) |
- |
2500 |
|
- |
| Cl-11.7(Performance at low irradiance) |
- |
10000 |
|
- |
| Cl-11.8(Outdoor exposure test) |
- |
50000 |
|
- |
| Cl-11.9(Hot-spot endurance test) |
- |
125000 |
|
- |
| Cl-11.10(UV preconditioning test) |
- |
125000 |
|
- |
| Cl-11.11(Thermal cycling test) |
- |
160000 |
|
- |
| Cl-11.12(Humidity-freeze test) |
- |
80000 |
|
- |
| Cl-11.13(Damp heat test) |
- |
160000 |
|
- |
| Cl-11.14(Robustness of terminations test) |
- |
15000 |
|
- |
| Cl-11.15(Wet leakage current tes) |
- |
25000 |
|
- |
| Cl-11.16(Static mechanical load test) |
- |
50000 |
|
- |
| Cl-11.17(Hail test) |
- |
50000 |
|
- |
| Cl-11.18(Bypass diode thermal test) |
- |
75000 |
|
- |
| Cl-11.19(Stabilization) |
- |
95000 |
|
- |
| 5(Marking and documentation) |
- |
10000 |
|
- |
| 11.20(Cyclic (dynamic) mechanical load test (MQT 20)) |
- |
25000 |
|
- |
| 11.21(Potential induced degradation test (MQT 21)) |
- |
400000 |
|
- |
| 11.22(Bending test (MQT 22)) |
- |
70000 |
|
- |
|
23 Jun, 2028 |
-
Included w.e.f.26.11.2024 |
| 40 |
Bharat Test House Pvt Ltd 1474 Sonipat Haryana
| 9135626
| IS 14286 : Part 1 : Sec 4 (2023) |
Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-4: Special requirements for testing of thin-film CuInGASSe2 based photovoltaic PV modules Third Revision |
- |
1502500 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| Cl-8(Major visual defects) |
- |
6000 |
|
- |
| Cl-11.1(Visual inspection (MQT 01)) |
- |
2000 |
|
- |
| Cl-11.2(Maximum power determination (MQT 02)) |
- |
7000 |
|
- |
| Cl-11.3(Insulation test (MQT 03)) |
- |
20000 |
|
- |
| Cl-11.4(Measurement of temperature coefficients (MQT 04)) |
- |
110000 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05)) |
- |
5000 |
|
- |
| Cl-11.6(Performance at STC (MQT 06.1) and NMOT (MQT 06.2) |
- |
2500 |
|
- |
| Cl-11.7(Performance at low irradiance (MQT 07)) |
- |
10000 |
|
- |
| Cl-11.8(Outdoor exposure test (MQT 08)) |
- |
50000 |
|
- |
| Cl-11.9(Hot-spot endurance test (MQT 09)) |
- |
125000 |
|
- |
| Cl-11.10(UV preconditioning test (MQT 10)) |
- |
125000 |
|
- |
| Cl-11.11(Thermal cycling test (MQT 11)) |
- |
160000 |
|
- |
| Cl-11.12(As per IEC 61215-1:2016) |
- |
80000 |
|
- |
| Cl-11.13(Damp heat test (MQT 13)) |
- |
160000 |
|
- |
| Cl-11.14(Robustness of terminations test (MQT 14)) |
- |
15000 |
|
- |
| Cl-11.15(Robustness of terminations test (MQT 14)) |
- |
25000 |
|
- |
| Cl-11.16(Static mechanical load test (MQT 16)) |
- |
50000 |
|
- |
| Cl-11.17(Hail test (MQT 17)) |
- |
50000 |
|
- |
| Cl-11.18(Bypass diode testing (MQT 18)) |
- |
75000 |
|
- |
| Cl-11.19(Stabilization (MQT 19)) |
- |
95000 |
|
- |
|
19 Mar, 2026 |
-
- |
| 41 |
Bharat Test House Pvt Ltd 1474 Sonipat Haryana
| 9135626
| IS 14286 : Part 1 : Sec 3 (2023) |
Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-3: Special requirements for testing of thin-film amorphous silicon based photovoltaic PV modules Third Revision |
- |
1502500 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| Cl-8(Major visual defects) |
- |
6000 |
|
- |
| Cl-11.1(Visual inspection) |
- |
2000 |
|
- |
| Cl-11.2(Maximum power determination) |
- |
7000 |
|
- |
| Cl-11.3(Insulation test) |
- |
20000 |
|
- |
| Cl-11.4(Measurement of temperature coefficients) |
- |
110000 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature) |
- |
5000 |
|
- |
| Cl-11.6(Performance at STC and NMOT) |
- |
2500 |
|
- |
| Cl-11.7(Performance at low irradiance) |
- |
10000 |
|
- |
| Cl-11.8(Outdoor exposure test) |
- |
50000 |
|
- |
| Cl-11.9(Hot-spot endurance test) |
- |
125000 |
|
- |
| Cl-11.10(UV preconditioning test) |
- |
125000 |
|
- |
| Cl-11.11(Thermal cycling test) |
- |
160000 |
|
- |
| Cl-11.12(Humidity-freeze test) |
- |
80000 |
|
- |
| Cl-11.13(Damp heat test) |
- |
160000 |
|
- |
| Cl-11.14(Robustness of terminations test) |
- |
15000 |
|
- |
| Cl-11.15(Wet leakage current test) |
- |
25000 |
|
- |
| Cl-11.16(Static mechanical load test) |
- |
50000 |
|
- |
| Cl-11.17(Hail test) |
- |
50000 |
|
- |
| Cl-11.18(Bypass diode testing) |
- |
75000 |
|
- |
| Cl-11.19(Stabilization) |
- |
95000 |
|
- |
|
19 Mar, 2026 |
-
- |
| 42 |
Bharat Test House Pvt Ltd 1474 Sonipat Haryana
| 9135626
| IS 14286 : Part 1 : Sec 2 (2023) |
Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-2: Special requirements for testing of thin-film Cadmium Telluride CdTe based photovoltaic PV modules Third Revision |
Thin-film Cadmium Telluride CdTe based PV Modules |
1502500 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| Cl-8(Major visual defects) |
- |
6000 |
|
- |
| Cl-11.1(Visual inspection) |
- |
2000 |
|
- |
| Cl-11.2(Maximum power determination) |
- |
7000 |
|
- |
| Cl-11.3(Insulation tes) |
- |
20000 |
|
- |
| Cl-11.4(Measurement of temperature coefficients) |
- |
110000 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature) |
- |
5000 |
|
- |
| Cl-11.6(Performance at STC and NMOT) |
- |
2500 |
|
- |
| Cl-11.7(Performance at low irradiance) |
- |
10000 |
|
- |
| Cl-11.8(Outdoor exposure test) |
- |
50000 |
|
- |
| Cl-11.9(Hot-spot endurance test) |
- |
125000 |
|
- |
| Cl-11.10(UV preconditioning test) |
- |
125000 |
|
- |
| Cl-11.11(Thermal cycling test) |
- |
160000 |
|
- |
| Cl-11.12(Humidity-freeze test) |
- |
80000 |
|
- |
| Cl-11.13(Damp heat test) |
- |
160000 |
|
- |
| Cl-11.14(Robustness of terminations test) |
- |
15000 |
|
- |
| Cl-11.15(Wet leakage current test) |
- |
25000 |
|
- |
| Cl-11.16(Static mechanical load test) |
- |
50000 |
|
- |
| Cl-11.17(Hail test) |
- |
50000 |
|
- |
| Cl-11.18(Bypass diode testing) |
- |
75000 |
|
- |
| Cl-11.19(Stabilization) |
- |
95000 |
|
- |
|
19 Mar, 2026 |
-
- |
| 43 |
Bharat Test House Pvt Ltd 1474 Sonipat Haryana
| 9135626
| IS 14286 : Part 1 : Sec 1 (2023) |
Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-1: Special requirements for testing of crystalline silicon photovoltaic PV modules Third Revision |
- |
1502500 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| Cl-8(Major visual defects) |
- |
6000 |
|
- |
| Cl-11.1(Visual inspection) |
- |
2000 |
|
- |
| Cl-11.2(Maximum power determination) |
- |
7000 |
|
- |
| Cl-11.3(Insulation test) |
- |
20000 |
|
- |
| Cl-11.4(Measurement of temperature coefficients) |
- |
110000 |
|
- |
| Cl-11.5(Measurement of nominal module operating temperature) |
- |
5000 |
|
- |
| Cl-11.6(Performance at STC) |
- |
2500 |
|
- |
| Cl-11.7(Performance at low irradiance) |
- |
10000 |
|
- |
| Cl-11.8(Outdoor exposure test) |
- |
50000 |
|
- |
| Cl-11.9(Hot-spot endurance test) |
- |
125000 |
|
- |
| Cl-11.10(UV preconditioning test) |
- |
125000 |
|
- |
| Cl-11.11(Thermal cycling test) |
- |
160000 |
|
- |
| Cl-11.12(Humidity-freeze test) |
- |
80000 |
|
- |
| Cl-11.13(Damp heat test) |
- |
160000 |
|
- |
| Cl-11.14(Robustness of terminations test) |
- |
15000 |
|
- |
| Cl-11.15(Wet leakage current tes) |
- |
25000 |
|
- |
| Cl-11.16(Static mechanical load test) |
- |
50000 |
|
- |
| Cl-11.17(Hail test) |
- |
50000 |
|
- |
| Cl-11.18(Bypass diode thermal test) |
- |
75000 |
|
- |
| Cl-11.19(Stabilization) |
- |
95000 |
|
- |
|
19 Mar, 2026 |
-
including w.e.f. 09.10.2024 |
| 44 |
Mitsui Chemicals India Pvt. Ltd., Ahmedabad
| 7166626
| IS 14286 : Part 1 : Sec 1 (2019) |
Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 1 special requirements for testing of crystalline silicon photovoltaic (Pv) modules (Second Revision) |
- |
1298050 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 11.1(Visual inspection (MQT 01)) |
- |
45500 |
|
- |
| 11.2(Maximum power determination (MQT 02)) |
- |
45000 |
|
- |
| 11.3(Insulation test (MQT 03)) |
- |
10000 |
|
- |
| 11.4(Measurement of temperature coefficients (MQT 04)) |
- |
65000 |
|
- |
| 11.5(Measurement of nominal module operating temperature (NMOT)
(MQT 05)) |
- |
18200 |
|
- |
| 11.6(Performance at STC and NMOT
(MQT 06)) |
- |
5000 |
|
- |
| 11.7(Performance at low irradiance
(MQT 07)) |
- |
5000 |
|
- |
| 11.8(Outdoor exposure test (MQT 08)) |
- |
52200 |
|
- |
| 11.9(Hot-spot endurance test (MQT 09)) |
- |
36400 |
|
- |
| 11.1(UV preconditioning test
(MQT 10)) |
- |
36400 |
|
- |
| 11.11(Thermal cycling test (MQT 11)) |
- |
400000 |
|
- |
| 11.12(Humidity-freeze test (MQT 12)) |
- |
118800 |
|
- |
| 11.13(Damp heat test (MQT 13)) |
- |
18000 |
|
- |
| 11.14(Robustness of terminations
(MQT 14)) |
- |
45500 |
|
- |
| 11.15(Wet leakage current test (MQT 15)) |
- |
63800 |
|
- |
| 11.16(Static mechanical load test
(MQT 16)) |
- |
18200 |
|
- |
| 11.17(Hail test (MQT 17)) |
- |
22750 |
|
- |
| 11.18(Bypass diode thermal test (MQT 18)) |
- |
42300 |
|
- |
| 11.19(Stabilization (MQT 19)) |
- |
250000 |
|
- |
| 11.1(Visual inspection (MQT 01)) |
- |
45500 |
|
- |
| 11.2(Maximum power determination (MQT 02)) |
- |
45000 |
|
- |
| 11.3(Insulation test (MQT 03)) |
- |
10000 |
|
- |
| 11.4(Measurement of temperature coefficients (MQT 04)) |
- |
65000 |
|
- |
| 11.5(Measurement of nominal module operating temperature (NMOT)
(MQT 05)) |
- |
18200 |
|
- |
| 11.6(Performance at STC and NMOT
(MQT 06)) |
- |
5000 |
|
- |
| 11.7(Performance at low irradiance
(MQT 07)) |
- |
5000 |
|
- |
| 11.8(Outdoor exposure test (MQT 08)) |
- |
52200 |
|
- |
| 11.9(Hot-spot endurance test (MQT 09)) |
- |
36400 |
|
- |
| 11.1(UV preconditioning test
(MQT 10)) |
- |
36400 |
|
- |
| 11.11(Thermal cycling test (MQT 11)) |
- |
400000 |
|
- |
| 11.12(Humidity-freeze test (MQT 12)) |
- |
118800 |
|
- |
| 11.13(Damp heat test (MQT 13)) |
- |
18000 |
|
- |
| 11.14(Robustness of terminations
(MQT 14)) |
- |
45500 |
|
- |
| 11.15(Wet leakage current test (MQT 15)) |
- |
63800 |
|
- |
| 11.16(Static mechanical load test
(MQT 16)) |
- |
18200 |
|
- |
| 11.17(Hail test (MQT 17)) |
- |
22750 |
|
- |
| 11.18(Bypass diode thermal test (MQT 18)) |
- |
42300 |
|
- |
| 11.19(Stabilization (MQT 19)) |
- |
250000 |
|
- |
| 5(Marking and documentation) |
- |
0 |
|
- |
| 8(Major visual defects) |
- |
0 |
|
- |
| 5(Marking and documentation) |
- |
0 |
|
- |
| 8(Major visual defects) |
- |
0 |
|
- |
| 11.1(Visual inspection (MQT 01)) |
- |
- |
|
- |
| 11.2(Maximum power determination (MQT 02)) |
- |
- |
|
- |
| 11.3(Insulation test (MQT 03)) |
- |
- |
|
- |
| 11.4(Measurement of temperature coefficients (MQT 04)) |
- |
- |
|
- |
| 11.5(Measurement of nominal module operating temperature (NMOT)
(MQT 05)) |
- |
- |
|
- |
| 11.6(Performance at STC and NMOT
(MQT 06)) |
- |
- |
|
- |
| 11.7(Performance at low irradiance
(MQT 07)) |
- |
- |
|
- |
| 11.8(Outdoor exposure test (MQT 08)) |
- |
- |
|
- |
| 11.9(Hot-spot endurance test (MQT 09)) |
- |
- |
|
- |
| 11.1(UV preconditioning test
(MQT 10)) |
- |
- |
|
- |
| 11.11(Thermal cycling test (MQT 11)) |
- |
- |
|
- |
| 11.12(Humidity-freeze test (MQT 12)) |
- |
- |
|
- |
| 11.13(Damp heat test (MQT 13)) |
- |
- |
|
- |
| 11.14(Robustness of terminations
(MQT 14)) |
- |
- |
|
- |
| 11.15(Wet leakage current test (MQT 15)) |
- |
- |
|
- |
| 11.16(Static mechanical load test
(MQT 16)) |
- |
- |
|
- |
| 11.17(Hail test (MQT 17)) |
- |
- |
|
- |
| 11.18(Bypass diode thermal test (MQT 18)) |
- |
- |
|
- |
| 11.19(Stabilization (MQT 19)) |
- |
- |
|
- |
| 5(Marking and documentation) |
- |
- |
|
- |
| 8(Major visual defects) |
- |
- |
|
- |
|
02 Dec, 2026 |
-
- |
| 45 |
Mitsui Chemicals India Pvt. Ltd., Ahmedabad
| 7166626
| IS 14286 (2010) |
Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision) |
Solar Photovoltaic Modules |
1280550 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 4(Marking) |
- |
50000 |
|
- |
| 10.1(Visual inspection) |
- |
39033 |
|
- |
| 10.2(Maximum power determination) |
- |
49662 |
|
- |
| 10.3(Insulation test) |
- |
20840 |
|
- |
| 10.4(Measurement of temperature coefficients) |
- |
65000 |
|
- |
| 10.5(Measurement of NOCT) |
- |
38200 |
|
- |
| 10.6(Performance at STC and NOCT) |
- |
49662 |
|
- |
| 10.7(Performance at low irradiance) |
- |
7500 |
|
- |
| 10.8(Outdoor exposure test) |
- |
52200 |
|
- |
| 10.9(Hot-spot endurance test) |
- |
33318 |
|
- |
| 10.10(UV preconditioning) |
- |
36400 |
|
- |
| 10.11(Thermal cycling test) |
- |
372400 |
|
- |
| 10.12(Humidity freeze test) |
- |
136400 |
|
- |
| 10.13(Damp heat test) |
- |
318000 |
|
- |
| 10.14(Robustness of termination test) |
- |
45500 |
|
- |
| 10.15(Wet leakage current test) |
- |
163800 |
|
- |
| 10.16(Mechanical load test) |
- |
38200 |
|
- |
| 10.17(Hail test) |
- |
22750 |
|
- |
| 10.18(Bypass diode thermal' test) |
- |
42300 |
|
- |
|
02 Dec, 2026 |
-
- |
| 46 |
Bharat Test House Pvt Ltd 1474 Sonipat Haryana
| 9135626
| IS 14286 (2010) |
Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision) |
Crystalline Silicon Terrestrial Photovoltaic Module |
700000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 4(Marking) |
- |
0 |
|
NA |
| 10.1(Visual inspection) |
- |
2000 |
|
5% discount for BIS |
| 10.2(Maximum power determination) |
- |
5000 |
|
5% discount for BIS |
| 10.3(Insulation test) |
- |
3000 |
|
5% discount for BIS |
| 10.4(Measurement of temperature coefficients) |
- |
10000 |
|
5% discount for BIS |
| 10.5(Measurement of NOCT) |
- |
5000 |
|
5% discount for BIS |
| 10.6(Performance at STC and NOCT) |
- |
9000 |
|
5% discount for BIS |
| 10.7(Performance at low irradiance) |
- |
5000 |
|
5% discount for BIS |
| 10.8(Outdoor exposure test) |
- |
8000 |
|
5% discount for BIS |
| 10.9(Hot-spot endurance test) |
- |
10000 |
|
5% discount for BIS |
| 10.10(UV preconditioning) |
- |
55000 |
|
5% discount for BIS |
| 10.11(Thermal cycling test) |
- |
255000 |
|
5% discount for BIS |
| 10.12(Humidity freeze test) |
- |
95000 |
|
5% discount for BIS |
| 10.13(Damp heat test) |
- |
200000 |
|
5% discount for BIS |
| 10.14(Robustness of termination test) |
- |
5000 |
|
5% discount for BIS |
| 10.15(Wet leakage current test) |
- |
6000 |
|
5% discount for BIS |
| 10.16(Mechanical load test) |
- |
12000 |
|
5% discount for BIS |
| 10.17(Hail test) |
- |
8000 |
|
5% discount for BIS |
| 10.18(Bypass diode thermal' test) |
- |
7000 |
|
5% discount for BIS |
|
19 Mar, 2026 |
-
- |
| 47 |
Bharat Test House Pvt Ltd 1474 Sonipat Haryana
| 9135626
| IS 14286 : Part 1 : Sec 2 (2019) |
Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 2 special requirements for testing of thin - Film cadmium telluride (CdTe) based photovoltaic (Pv) modules (Second Revision) |
Terrestrial Photovoltaic (PV) Modules |
750000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 11.19(Stabilization (MQT 19)) |
- |
42500 |
|
5% discount for BIS |
| 11.18(Bypass diode thermal test (MQT 18)) |
- |
27500 |
|
5% discount for BIS |
| 11.19
IS 14286( Stabilization ) |
- |
42500 |
|
5% discount for BIS |
| 11.18
IS 14286( Bypass diode testing) |
- |
27500 |
|
5% discount for BIS |
| 11.17, Table 3 & 4,
IS 14286( Hail test) |
- |
52500 |
|
5% discount for BIS |
| 11.16
IS 14286( Static Mechanical load test) |
- |
25000 |
|
5% discount for BIS |
| 11.15
IS 14286( Wet leakage current test) |
- |
25000 |
|
5% discount for BIS |
| 11.14, Table 1
IS 14286( Robutness of terminations test - Retention of Junction Box on Mounting Surface - Test of Cord Anchorage) |
- |
20000 |
|
5% discount for BIS |
| 11.13
IS 14286(Damp heat test) |
- |
42500 |
|
5% discount for BIS |
| 11.12
IS 14286( Humidity-freeze test) |
- |
57500 |
|
5% discount for BIS |
| 11.11
IS 14286( Thermal cycling test) |
- |
50000 |
|
5% discount for BIS |
| 11.10
IS 14286( UV Preconditioning test ) |
- |
37500 |
|
5% discount for BIS |
| 11.9
IS 14286( Hot-spot endurance test) |
- |
80000 |
|
5% discount for BIS |
| 11.8
IS 14286( Outdoor exposure Test) |
- |
32500 |
|
5% discount for BIS |
| 11.7
IS 14286( Performance at low irradiance) |
- |
57500 |
|
5% discount for BIS |
| 11.6
IS 14286( Performance at STC and NMOT) |
- |
60000 |
|
5% discount for BIS |
| 11.5
IS 14286( Measurement of nominal module operating temperature (NMOT)) |
- |
55000 |
|
5% discount for BIS |
| 11.4
IS 14286( Measurement of temperature coefficients) |
- |
55000 |
|
5% discount for BIS |
| 11.3
IS 14286( Insulation Test) |
- |
15000 |
|
5% discount for BIS |
| 11.2
IS 14286( Maximum power determination) |
- |
7500 |
|
5% discount for BIS |
| 11.1
IS 14286( Visual inspection) |
- |
7500 |
|
5% discount for BIS |
| 5
IS 14286( Marking and Documentation) |
- |
0 |
|
5% discount for BIS |
|
19 Mar, 2026 |
-
- |
| 48 |
Electrical Research and Development Association (ERDA), Vadodara, Gujarat
| 7101125
| IS 14286 (2010) |
Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision) |
- |
963359 View breakup
Rs. 9,63,359/- (For complete testing)
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 10.1(Visual inspection) |
- |
9217 |
|
- |
| 10.2(Maximum power determination) |
- |
28173 |
|
- |
| 10.3(Insulation test) |
- |
4488 |
|
- |
| 4(Marking) |
- |
0 |
|
- |
| 10.4(Measurement of temperature coefficients) |
- |
32669 |
|
- |
| 10.5(Measurement of NOCT) |
- |
52133 |
|
- |
| 10.6(Performance at STC and NOCT) |
- |
28173 |
|
- |
| 10.7(Performance at low irradiance) |
- |
5245 |
|
- |
| 10.8(Outdoor exposure test) |
- |
66472 |
|
- |
| 10.9(Hot-spot endurance test) |
- |
61005 |
|
- |
| 10.10(UV preconditioning) |
- |
47327 |
|
- |
| 10.11(Thermal cycling test) |
- |
272058 |
|
- |
| 10.12(Humidity freeze test) |
- |
96055 |
|
- |
| 10.13(Damp heat test) |
- |
107667 |
|
- |
| 10.14(Robustness of termination test) |
- |
19176 |
|
- |
| 10.15(Wet leakage current test) |
- |
9507 |
|
- |
| 10.16(Mechanical load test) |
- |
38498 |
|
- |
| 10.17(Hail test) |
- |
42422 |
|
- |
| 10.18(Bypass diode thermal' test) |
- |
43074 |
|
- |
|
30 Nov, 2025 |
-
Included w.e.f. 05.12.2023 |
| 49 |
Central Power Research Institute (CPRI), Bangalore
| 6101024
| IS 14286 : Part 1 : Sec 1 (2019) |
Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 1 special requirements for testing of crystalline silicon photovoltaic (Pv) modules (Second Revision) |
- |
1295440 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 11.1(Visual inspection (MQT 01)) |
- |
0 |
|
Individual charge not available |
| 11.2(Maximum power determination (MQT 02)) |
- |
0 |
|
Individual charge not available |
| 11.3(Insulation test (MQT 03)) |
- |
0 |
|
Individual charge not available |
| 11.4(Measurement of temperature coefficients (MQT 04)) |
- |
0 |
|
Individual charge not available |
| 11.5(Measurement of nominal module operating temperature (NMOT)
(MQT 05)) |
- |
0 |
|
Individual charge not available |
| 11.6(Performance at STC and NMOT
(MQT 06)) |
- |
0 |
|
Individual charge not available |
| 11.7(Performance at low irradiance
(MQT 07)) |
- |
0 |
|
Individual charge not available |
| 11.8(Outdoor exposure test (MQT 08)) |
- |
0 |
|
Individual charge not available |
| 11.9(Hot-spot endurance test (MQT 09)) |
- |
0 |
|
Individual charge not available |
| 11.1(UV preconditioning test
(MQT 10)) |
- |
0 |
|
Individual charge not available |
| 11.11(Thermal cycling test (MQT 11)) |
- |
0 |
|
Individual charge not available |
| 11.12(Humidity-freeze test (MQT 12)) |
- |
0 |
|
Individual charge not available |
| 11.13(Damp heat test (MQT 13)) |
- |
0 |
|
Individual charge not available |
| 11.14(Robustness of terminations
(MQT 14)) |
- |
0 |
|
Individual charge not available |
| 11.15(Wet leakage current test (MQT 15)) |
- |
0 |
|
Individual charge not available |
| 11.16(Static mechanical load test
(MQT 16)) |
- |
0 |
|
Individual charge not available |
| 11.17(Hail test (MQT 17)) |
- |
0 |
|
Individual charge not available |
| 11.18(Bypass diode thermal test (MQT 18)) |
- |
0 |
|
Individual charge not available |
| 11.19(Stabilization (MQT 19)) |
- |
0 |
|
Individual charge not available |
| 5(Marking and documentation) |
- |
0 |
|
Individual charge not available |
| 8(Major visual defects) |
- |
0 |
|
Individual charge not available |
|
31 Dec, 2026 |
-
Included w.e.f 16.05.2024 |
| 50 |
DELHI TEST HOUSE (50) KUNDLI SONIPAT
| 9127026
| IS 14286 : Part 1 : Sec 1 (2019) |
Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 1 special requirements for testing of crystalline silicon photovoltaic (Pv) modules (Second Revision) |
- |
700000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 11.1(Visual inspection (MQT 01)) |
- |
20000 |
|
- |
| 11.2(Maximum power determination (MQT 02)) |
- |
20000 |
|
- |
| 11.3(Insulation test (MQT 03)) |
- |
10000 |
|
- |
| 11.4(Measurement of temperature coefficients (MQT 04)) |
- |
30000 |
|
- |
| 11.5(Measurement of nominal module operating temperature (NMOT)
(MQT 05)) |
- |
30000 |
|
- |
| 11.6(Performance at STC and NMOT
(MQT 06)) |
- |
30000 |
|
- |
| 11.7(Performance at low irradiance
(MQT 07)) |
- |
30000 |
|
- |
| 11.8(Outdoor exposure test (MQT 08)) |
- |
30000 |
|
- |
| 11.9(Hot-spot endurance test (MQT 09)) |
- |
45000 |
|
- |
| 11.1(UV preconditioning test
(MQT 10)) |
- |
30000 |
|
- |
| 11.11(Thermal cycling test (MQT 11)) |
- |
70000 |
|
- |
| 11.12(Humidity-freeze test (MQT 12)) |
- |
85000 |
|
- |
| 11.13(Damp heat test (MQT 13)) |
- |
100000 |
|
- |
| 11.14(Robustness of terminations
(MQT 14)) |
- |
20000 |
|
- |
| 11.15(Wet leakage current test (MQT 15)) |
- |
20000 |
|
- |
| 11.16(Static mechanical load test
(MQT 16)) |
- |
30000 |
|
- |
| 11.17(Hail test (MQT 17)) |
- |
30000 |
|
- |
| 11.18(Bypass diode thermal test (MQT 18)) |
- |
40000 |
|
- |
| 11.19(Stabilization (MQT 19)) |
- |
30000 |
|
- |
|
23 Jun, 2028 |
-
- |
| 51 |
DELHI TEST HOUSE (50) KUNDLI SONIPAT
| 9127026
| IS 14286 : Part 1 (2019) |
Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements (Second Revision) |
- |
1100000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 11(Test flow and procedures) |
- |
100000 |
|
- |
| 5(Marking and documentation) |
- |
100000 |
|
- |
| 7(Pass criteria) |
- |
300000 |
|
- |
| 6(Testing) |
- |
100000 |
|
- |
| 8(Major visual defects) |
- |
200000 |
|
- |
| 8(Major visual defects) |
- |
200000 |
|
- |
| 9(Report) |
- |
150000 |
|
- |
| 10(Modifications) |
- |
150000 |
|
- |
|
23 Jun, 2028 |
-
- |
| 52 |
DELHI TEST HOUSE (50) KUNDLI SONIPAT
| 9127026
| IS 14286 (2010) |
Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision) |
- |
750000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 10.1(Visual inspection) |
- |
4000.0 |
|
-- |
| 10.2(Maximum power determination) |
- |
20000 |
|
- |
| 10.3(Insulation test) |
- |
5000 |
|
- |
| 10.4(Measurement of temperature coefficients) |
- |
20000 |
|
- |
| 10.5(Measurement of NOCT) |
- |
20000 |
|
- |
| 10.6(Performance at STC and NOCT) |
- |
15000 |
|
- |
| 10.7(Performance at low irradiance) |
- |
15000 |
|
- |
| 10.8(Outdoor exposure test) |
- |
35000 |
|
- |
| 10.9(Hot-spot endurance test) |
- |
20000 |
|
- |
| 10.10(UV preconditioning) |
- |
20000 |
|
- |
| 10.11(Thermal cycling test) |
- |
200000 |
|
- |
| 10.12(Humidity freeze test) |
- |
120000 |
|
- |
| 10.13(Damp heat test) |
- |
220000 |
|
- |
| 10.14(Robustness of termination test) |
- |
5000 |
|
- |
| 10.15(Wet leakage current test) |
- |
5000 |
|
- |
| 10.16(Mechanical load test) |
- |
15000 |
|
- |
| 10.17(Hail test) |
- |
5000 |
|
- |
| 10.18(Bypass diode thermal' test) |
- |
5000 |
|
- |
| 4(Marking) |
- |
1000 |
|
- |
|
23 Jun, 2028 |
-
- |
| 53 |
Hi Physix Laboratory India Private Limited, Pune
| 7126926
| IS 14286 (2010) |
Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision) |
- |
740000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 4(Marking) |
- |
0 |
|
- |
| 10.1(Visual inspection) |
- |
5000 |
|
- |
| 10.2(Maximum power determination) |
- |
10000 |
|
- |
| 10.3(Insulation test) |
- |
5000 |
|
- |
| 10.4(Measurement of temperature coefficients) |
- |
20000 |
|
- |
| 10.5(Measurement of NOCT) |
- |
20000 |
|
- |
| 10.6(Performance at STC and NOCT) |
- |
20000 |
|
- |
| 10.7(Performance at low irradiance) |
- |
10000 |
|
- |
| 10.8(Outdoor exposure test) |
- |
30000 |
|
- |
| 10.9(Hot-spot endurance test) |
- |
50000 |
|
- |
| 10.10(UV preconditioning) |
- |
100000 |
|
- |
| 10.11(Thermal cycling test) |
- |
150000 |
|
- |
| 10.12(Humidity freeze test) |
- |
100000 |
|
- |
| 10.13(Damp heat test) |
- |
150000 |
|
- |
| 10.14(Robustness of termination test) |
- |
5000 |
|
- |
| 10.15(Wet leakage current test) |
- |
5000 |
|
- |
| 10.16(Mechanical load test) |
- |
20000 |
|
- |
| 10.17(Hail test) |
- |
10000 |
|
- |
| 10.18(Bypass diode thermal' test) |
- |
30000 |
|
- |
|
20 Jun, 2028 |
-
- |
| 54 |
Hi Physix Laboratory India Private Limited, Pune
| 7126926
| IS 14286 : Part 1 : Sec 1 (2019) |
Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 1 special requirements for testing of crystalline silicon photovoltaic (Pv) modules (Second Revision) |
- |
1315000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 11.1(Visual inspection (MQT 01)) |
- |
5000 |
|
- |
| 11.2(Maximum power determination (MQT 02)) |
- |
10000 |
|
- |
| 11.3(Insulation test (MQT 03)) |
- |
5000 |
|
- |
| 11.4(Measurement of temperature coefficients (MQT 04)) |
- |
60000 |
|
- |
| 11.5(Measurement of nominal module operating temperature (NMOT)
(MQT 05)) |
- |
20000 |
|
- |
| 11.6(Performance at STC and NMOT
(MQT 06)) |
- |
80000 |
|
- |
| 11.7(Performance at low irradiance
(MQT 07)) |
- |
30000 |
|
- |
| 11.8(Outdoor exposure test (MQT 08)) |
- |
30000 |
|
- |
| 11.9(Hot-spot endurance test (MQT 09)) |
- |
200000 |
|
- |
| 11.1(UV preconditioning test
(MQT 10)) |
- |
100000 |
|
- |
| 11.11(Thermal cycling test (MQT 11)) |
- |
250000 |
|
- |
| 11.12(Humidity-freeze test (MQT 12)) |
- |
100000 |
|
- |
| 11.13(Damp heat test (MQT 13)) |
- |
150000 |
|
- |
| 11.14(Robustness of terminations
(MQT 14)) |
- |
10000 |
|
- |
| 11.15(Wet leakage current test (MQT 15)) |
- |
5000 |
|
- |
| 11.16(Static mechanical load test
(MQT 16)) |
- |
20000 |
|
- |
| 11.17(Hail test (MQT 17)) |
- |
10000 |
|
- |
| 11.18(Bypass diode thermal test (MQT 18)) |
- |
80000 |
|
- |
| 11.19(Stabilization (MQT 19)) |
- |
150000 |
|
- |
|
20 Jun, 2028 |
-
Including testing of IS 14286 (Part 1& 2):2019 |
| 55 |
Hi Physix Laboratory India Private Limited, Pune
| 7126926
| IS 14286 : Part 1 : Sec 2 (2019) |
Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 2 special requirements for testing of thin - Film cadmium telluride (CdTe) based photovoltaic (Pv) modules (Second Revision) |
- |
1465000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 5
IS 14286( Marking and Documentation) |
- |
0 |
|
- |
| 11.1
IS 14286( Visual inspection) |
- |
5000 |
|
- |
| 11.2
IS 14286( Maximum power determination) |
- |
10000 |
|
- |
| 11.3
IS 14286( Insulation Test) |
- |
5000 |
|
- |
| 11.4
IS 14286( Measurement of temperature coefficients) |
- |
60000 |
|
- |
| 11.5
IS 14286( Measurement of nominal module operating temperature (NMOT)) |
- |
20000 |
|
- |
| 11.6
IS 14286( Performance at STC and NMOT) |
- |
80000 |
|
- |
| 11.7
IS 14286( Performance at low irradiance) |
- |
30000 |
|
- |
| 11.8
IS 14286( Outdoor exposure Test) |
- |
30000 |
|
- |
| 11.9
IS 14286( Hot-spot endurance test) |
- |
200000 |
|
- |
| 11.10
IS 14286( UV Preconditioning test ) |
- |
100000 |
|
- |
| 11.11
IS 14286( Thermal cycling test) |
- |
250000 |
|
- |
| 11.12
IS 14286( Humidity-freeze test) |
- |
100000 |
|
- |
| 11.13
IS 14286(Damp heat test) |
- |
150000 |
|
- |
| 11.14, Table 1
IS 14286( Robutness of terminations test - Retention of Junction Box on Mounting Surface - Test of Cord Anchorage) |
- |
10000 |
|
- |
| 11.15
IS 14286( Wet leakage current test) |
- |
5000 |
|
- |
| 11.16
IS 14286( Static Mechanical load test) |
- |
20000 |
|
- |
| 11.17, Table 3 & 4,
IS 14286( Hail test) |
- |
10000 |
|
- |
| 11.18
IS 14286( Bypass diode testing) |
- |
80000 |
|
- |
| 11.19
IS 14286( Stabilization ) |
- |
300000 |
|
- |
|
20 Jun, 2028 |
-
Including testing of IS 14286 (Part 1& 2):2019 |
| 56 |
Hi Physix Laboratory India Private Limited, Pune
| 7126926
| IS 14286 : Part 1 : Sec 3 (2019) |
Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 3 special requirements for testing of thin - Film amorphous silicon based photovoltaic (Pv) modules (Second Revision) |
- |
1465000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 5
IS 14286( Marking and Documentation) |
- |
0 |
|
- |
| 11.1
IS 14286( Visual inspection) |
- |
5000 |
|
- |
| 11.2
IS 14286( Maximum power determination) |
- |
10000 |
|
- |
| 11.3
IS 14286( Insulation Test) |
- |
5000 |
|
- |
| 11.4
IS 14286( Measurement of temperature coefficients) |
- |
60000 |
|
- |
| 11.5
IS 14286( Measurement of nominal module operating temperature (NMOT)) |
- |
20000 |
|
- |
| 11.6
IS 14286( Performance at STC and NMOT) |
- |
80000 |
|
- |
| 11.7
IS 14286( Performance at low irradiance) |
- |
30000 |
|
- |
| 11.8
IS 14286( Outdoor exposure Test) |
- |
30000 |
|
- |
| 11.9
IS 14286( Hot-spot endurance test) |
- |
200000 |
|
- |
| 11.10
IS 14286( UV Preconditioning test ) |
- |
100000 |
|
- |
| 11.11
IS 14286( Thermal cycling test) |
- |
250000 |
|
- |
| 11.12
IS 14286( Humidity-freeze test) |
- |
100000 |
|
- |
| 11.13
IS 14286(Damp heat test) |
- |
150000 |
|
- |
| 11.14, Table 1
IS 14286( Robutness of terminations test - Retention of Junction Box on Mounting Surface - Test of Cord Anchorage) |
- |
10000 |
|
- |
| 11.15
IS 14286( Wet leakage current test) |
- |
5000 |
|
- |
| 11.16
IS 14286( Static Mechanical load test) |
- |
20000 |
|
- |
| 11.17, Table 3 & 4,
IS 14286( Hail test) |
- |
10000 |
|
- |
| 11.18
IS 14286( Bypass diode testing) |
- |
80000 |
|
- |
| 11.19(Stabilization (MQT 19)) |
- |
300000 |
|
- |
|
20 Jun, 2028 |
-
Including testing of IS 14286 (Part 1& 2):2019 |
| 57 |
Hi Physix Laboratory India Private Limited, Pune
| 7126926
| IS 14286 : Part 1 : Sec 4 (2019) |
Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 4 special requirements for testing of thin - Film Cu(In,ga)(S,se)2 based photovoltaic (Pv) modules (Second Revision) |
- |
1465000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 11.3(Insulation test (MQT 03)) |
- |
5000 |
|
- |
| 11.4(Measurement of temperature coefficients (MQT 04)) |
- |
60000 |
|
- |
| 11.5(Measurement of nominal module operating temperature (NMOT)
(MQT 05)) |
- |
20000 |
|
- |
| 11.6(Performance at STC and NMOT
(MQT 06)) |
- |
80000 |
|
- |
| 11.7(Performance at low irradiance
(MQT 07)) |
- |
30000 |
|
- |
| 11.8(Outdoor exposure test (MQT 08)) |
- |
30000 |
|
- |
| 11.9(Hot-spot endurance test (MQT 09)) |
- |
200000 |
|
- |
| 11.1(UV preconditioning test
(MQT 10)) |
- |
100000 |
|
- |
| 11.11(Thermal cycling test (MQT 11)) |
- |
250000 |
|
- |
| 11.12(Humidity-freeze test (MQT 12)) |
- |
100000 |
|
- |
| 11.13(Damp heat test (MQT 13)) |
- |
150000 |
|
- |
| 11.14(Robustness of terminations
(MQT 14)) |
- |
10000 |
|
- |
| 11.15(Wet leakage current test (MQT 15)) |
- |
5000 |
|
- |
| 11.16(Static mechanical load test
(MQT 16)) |
- |
20000 |
|
- |
| 11.17(Hail test (MQT 17)) |
- |
10000 |
|
- |
| 11.18(Bypass diode thermal test (MQT 18)) |
- |
80000 |
|
- |
| 11.19(Stabilization (MQT 19)) |
- |
300000 |
|
- |
|
20 Jun, 2028 |
-
Including testing of IS 14286 (Part 1& 2):2019 |
| 58 |
Central Power Research Institute (CPRI), Bangalore
| 6101024
| IS 14286 : Part 1 (2019) |
Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements (Second Revision) |
SOLAR PHOTOVOLTAIC MODULE |
1175000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 5(Marking and documentation) |
- |
0 |
|
The complete test charges will be provided through a proforma invoice. |
| 6(Testing) |
- |
0 |
|
The complete test charges will be provided through a proforma invoice. |
| 7(Pass criteria) |
- |
0 |
|
The complete test charges will be provided through a proforma invoice. |
| 8(Major visual defects) |
- |
0 |
|
The complete test charges will be provided through a proforma invoice. |
| 8(Major visual defects) |
- |
0 |
|
The complete test charges will be provided through a proforma invoice. |
| 9(Report) |
- |
0 |
|
The complete test charges will be provided through a proforma invoice. |
| 10(Modifications) |
- |
0 |
|
The complete test charges will be provided through a proforma invoice. |
| 11(Test flow and procedures) |
- |
0 |
|
The complete test charges will be provided through a proforma invoice. |
|
31 Dec, 2026 |
-
Included w.e.f, 23/04/2020 |
| 59 |
National Institute of Solar Energy, Gurugram
| 9140024
| IS 14286 (2010) |
Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision) |
- |
- View breakup
Rs.11,20,000/-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
No Record Found
|
|
- |
-
(Lab of national repute and eminence, facilities of which are being utilized by BIS.) |
| 60 |
Bharat Test House Pvt Ltd 1474 Sonipat Haryana
| 9135626
| IS 14286 : Part 1 : Sec 1 (2019) |
Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 1 special requirements for testing of crystalline silicon photovoltaic (Pv) modules (Second Revision) |
Terrestrial Photovoltaic (PV) Modules |
750000 View breakup
-
| Clause No. |
Exclusion |
Testing Charges (Excl. Of Taxes) |
Effective Date |
Remark |
| 11.1(Visual inspection (MQT 01)) |
- |
7500 |
|
- |
| 11.2(Maximum power determination (MQT 02)) |
- |
7500 |
|
- |
| 11.3(Insulation test (MQT 03)) |
- |
15000 |
|
- |
| 11.4(Measurement of temperature coefficients (MQT 04)) |
- |
55000 |
|
- |
| 11.5(Measurement of nominal module operating temperature (NMOT)
(MQT 05)) |
- |
55000 |
|
- |
| 11.6(Performance at STC and NMOT
(MQT 06)) |
- |
60000 |
|
- |
| 11.7(Performance at low irradiance
(MQT 07)) |
- |
57500 |
|
- |
| 11.8(Outdoor exposure test (MQT 08)) |
- |
32500 |
|
- |
| 11.9(Hot-spot endurance test (MQT 09)) |
- |
80000 |
|
- |
| 11.1(UV preconditioning test
(MQT 10)) |
- |
37500 |
|
- |
| 11.11(Thermal cycling test (MQT 11)) |
- |
50000 |
|
- |
| 11.12(Humidity-freeze test (MQT 12)) |
- |
57500 |
|
- |
| 11.13(Damp heat test (MQT 13)) |
- |
42500 |
|
- |
| 11.14(Robustness of terminations
(MQT 14)) |
- |
20000 |
|
- |
| 11.15(Wet leakage current test (MQT 15)) |
- |
25000 |
|
- |
| 11.16(Static mechanical load test
(MQT 16)) |
- |
25000 |
|
- |
| 11.17(Hail test (MQT 17)) |
- |
52500 |
|
- |
| 11.18(Bypass diode thermal test (MQT 18)) |
- |
27500 |
|
- |
| 11.19(Stabilization (MQT 19)) |
- |
42500 |
|
- |
|
19 Mar, 2026 |
-
Included w.e.f 13.05.2020 |
