BIS - LIMS (Laboratory Information Management System)

Lauritz Knudsen Switchgear Testing Laboratories, MSW, SEIPL, Mumbai

SCHNEIDER ELECTRIC INDIA PRIVATE LIMITED, PLOT NO. - A600, TTC INDUSTRIAL AREA, MIDC, SHIL-PHATA ROAD, MAHAPE, MAHARASHTRA – 400710., Mumbai, Mumbai Suburban, Maharashtra, 400710

9769979737 somnath.borate@lntebg.com

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S.No.

Indian Standard No.

Product

Grade / Type / Size / Designation etc.

Testing Charges (Excl. Of Taxes)

Validity Date

Remark

IS 12640 : Part 1 (2024)

Residual current operated circuitBreakers without integral overcurrent protection for household and similar uses Rccbs: Part 1 general rules (Third Revision)

514500 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
6(Marking)	-	500	-
8.1.1(General)	-	500	-
8.1.2(Mechanism)	-	1500	-
9.3(Indelibility of marking)	-	1000	-
8.1.3(Clearance and creepage distance (External parts only))	-	1500	-
9.15(Trip free mechanism)	-	3500	-
9.4(Reliability of screws, current-carrying parts and connections)	-	4000	-
9.5(Reliability of terminals for external conductors)	-	4000	-
9.6(Protection againts electrci shock)	-	3000	-
9.13(Resistance to heat)	-	2500	-
8.1.3(Clearance and creepage distance (Internal parts only))	-	1500	-
9.25(Resistance to rusting)	-	3000	-
9.14(Resistance to abnormal heat and to fire)	-	15000	-
9.7.7.4(Resistance of the insulation of open contacts and basic insulation against an impulse voltage in normal conditions)	-	10000	-
9.7.7.5(Verification of the behaviour of components bridging the basic insulation)	-	10000	-
9.7.1(Resistance to humidity)	-	15000	-
9.7.2(Insulation resistance of the main circuit)	-	7500	-
9.7.3(Dielectric strength of the main circuit)	-	5000	-
9.7.4(Insulation resistance and dielectric strength of auxiliary circuits)	-	7500	-
9.7.7.2(Verification of clearances with the impulse withstand voltage)	-	10000	-
9.7.5(Secondary circuit of detection transformers)	-	10000	-
9.7.6(Capability of control circuits connected to the main circuits etc.)	-	10000	-
9.8(Temperature-rise)	-	15000	-
9.22.2(Reliability at 40 °C)	-	35000	-
9.23(Ageing of electronic components)	-	20000	-
9.10(Mechanical and electrical endurance)	-	40000	-
9.9(Residual operating characteristics)	-	80000	-
9.17(Behaviour in the case of failure of the line voltage)	-	5000	-
9.19(Unwanted tripping Behaviour in the case of surge currents)	-	0	Test facility not available
9.21(DC components)	-	0	Test facility not available, not in NABL Scope
9.11.2.3a)b)(Perf ormance at IΔm)	-	49000	-
9.16(Test device)	-	1000	-
9.12(Resistance to mechanical shock and impact)	-	10000	-
9.18(Non-operating current under overcurrent conditions)	-	10000	-
9.11.2.3c)(Verification of the suitability of RCCBs for use in IT-systems)	-	49000	-
9.11.2.4 a)(Coordination at Inc)	-	49000	-
9.11.2.4 c)(Performance at Im)	-	49000	-
9.11.2.4 b)(Coordination at Im)	-	49000	-
9.11.2.2(Coordination at IΔc)	-	49000	-
9.22.1(Reliability (climatic test))	-	70000	-
IEC 615432 , Table 4 -T1.1(Harmonics, inter harmonics)	-	0	Test facility not available, not in NABL scope
IEC 61543, Table 4 -T1.2(Signalling voltages)	-	0	Test facility not available
IEC 61543, Table 5 –T2.3(Surges)	-	50000	Test available, not in NABL Scope
IEC 61543, Table 5 -T2.1(Conducted s ine-wave form voltages or c urrents)	-	0	Test facility not available
IEC 61543, Table 5 -T2.1(Conducted s ine-wave form voltages or c urrents)	-	0	Test facility not available
IEC 61543, Table 5 -T2.5(Radiated electromagnetic field)	-	0	Test facility not available, not in NABL scope
IEC 61543, Table 5 -T2.2(Fast transients (bursts))	-	20000	Test facility available, not in NABL Scope
IEC 61543, Table 5 – T2.6(Conducted common mode disturbances in the frequency range lower than 150 kHz)	-	0	Test facility not available, not in NABL scope
IEC 61543, Table 6 -T3.1(Electrostatic discharges)	-	20000	Test facility available, not in NABL Scope
6(Marking)	-	500	-
8.1.1(General)	-	500	-
8.1.2(Mechanism)	-	1500	-
9.3(Indelibility of marking)	-	1000	-
8.1.3(Clearance and creepage distance (External parts only))	-	1500	-
9.15(Trip free mechanism)	-	3500	-
9.4(Reliability of screws, current-carrying parts and connections)	-	4000	-
9.5(Reliability of terminals for external conductors)	-	4000	-
9.6(Protection againts electrci shock)	-	3000	-
9.13(Resistance to heat)	-	2500	-
8.1.3(Clearance and creepage distance (Internal parts only))	-	1500	-
9.25(Resistance to rusting)	-	3000	-
9.14(Resistance to abnormal heat and to fire)	-	15000	-
9.7.7.4(Resistance of the insulation of open contacts and basic insulation against an impulse voltage in normal conditions)	-	10000	-
9.7.7.5(Verification of the behaviour of components bridging the basic insulation)	-	10000	-
9.7.1(Resistance to humidity)	-	15000	-
9.7.2(Insulation resistance of the main circuit)	-	7500	-
9.7.3(Dielectric strength of the main circuit)	-	5000	-
9.7.4(Insulation resistance and dielectric strength of auxiliary circuits)	-	7500	-
9.7.7.2(Verification of clearances with the impulse withstand voltage)	-	10000	-
9.7.5(Secondary circuit of detection transformers)	-	10000	-
9.7.6(Capability of control circuits connected to the main circuits etc.)	-	10000	-
9.8(Temperature-rise)	-	15000	-
9.22.2(Reliability at 40 °C)	-	35000	-
9.23(Ageing of electronic components)	-	20000	-
9.10(Mechanical and electrical endurance)	-	40000	-
9.9(Residual operating characteristics)	-	80000	-
9.17(Behaviour in the case of failure of the line voltage)	-	5000	-
9.19(Unwanted tripping Behaviour in the case of surge currents)	-	0	Test Facility Not Available
9.21(DC components)	-	0	Test Facility Not Available
9.11.2.3a)b)(Perf ormance at IΔm)	-	49000	-
9.16(Test device)	-	1000	-
9.12(Resistance to mechanical shock and impact)	-	10000	-
9.18(Non-operating current under overcurrent conditions)	-	10000	-
9.11.2.3c)(Verification of the suitability of RCCBs for use in IT-systems)	-	49000	-
9.11.2.4 a)(Coordination at Inc)	-	49000	-
9.11.2.4 c)(Performance at Im)	-	49000	-
9.11.2.4 b)(Coordination at Im)	-	49000	-
9.11.2.2(Coordination at IΔc)	-	49000	-
9.22.1(Reliability (climatic test))	-	70000	-
IEC 615432 , Table 4 -T1.1(Harmonics, inter harmonics)	-	0	49000
IEC 61543, Table 4 -T1.2(Signalling voltages)	-	0	-
IEC 61543, Table 5 –T2.3(Surges)	-	50000	Test Facility , not in NABL Scope
IEC 61543, Table 5 -T2.1(Conducted s ine-wave form voltages or c urrents)	-	0	Test Facility Not Available
IEC 61543, Table 5 -T2.1(Conducted s ine-wave form voltages or c urrents)	-	0	Test Facility Not Available
IEC 61543, Table 5 -T2.5(Radiated electromagnetic field)	-	0	Test Facility Not Available
IEC 61543, Table 5 -T2.2(Fast transients (bursts))	-	20000	Test Facility available , not in NABL Scope
IEC 61543, Table 5 – T2.6(Conducted common mode disturbances in the frequency range lower than 150 kHz)	-	0	Test Facility Not available
IEC 61543, Table 6 -T3.1(Electrostatic discharges)	-	20000	Not in NABL Scope

11 Apr, 2027

-
1 9.19 (Unwanted tripping Behaviour in the case of surge currents) Unwanted tripping Behavior in the case of surge currents Test Facility not available. 2 9.21 (DC components) DC Components Test Facility not available. 3 IEC 615432 , Table 4 -T1.1 (Harmonics, inter harmonics) Harmonics , Inter Harmonics Test Facility not available. 4 IEC 61543, Table 4 -T1.2 (Signalling voltages) Signaling Voltages Test Facility not available. 5 IEC 61543, Table 5 -T2.1 (Conducted s ine-wave form voltages or c urrents) Conducted sine-wave form voltages or currents Test Facility not available. 6 IEC 61543, Table 5 -T2.1 (Conducted s ine-wave form voltages or c urrents) Conducted sine-wave form voltages or currents Test Facility not available. 7 IEC 61543, Table 5 -T2.5 (Radiated electromagnetic field) Radiated Electromagnetic Field Test Facility not available. 8 IEC 61543, Table 5 – T2.6 (Conducted common mode disturbances in the frequency range lower than 150 kHz) Conducted Common mode disturbances in the frequency range lower than 150 kHz Test Facility not available.

IS/IEC 60898 : PART 1 (2015)

Electrical accessories - Circuit - Breakers for overcurrent protection for household and similar installations: Part 1 circuit - Breakers for a.c. operation (First Revision)

647000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
4.2(Classification, IS 60898-1)	-	500	-
4.3(Classification, IS 60898-1)	-	500	-
4.4(Classification, IS 60898-1)	-	500	-
4.5(Classification, IS 60898-1)	-	500	-
4.5.1(Classification, IS 60898-1)	-	500	-
4.5.2(Classification, IS 60898-1)	-	500	-
4.6(Classification, IS 60898-1)	-	500	-
4.7(Classification, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
8.1.1(General, IS 60898-1)	-	500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.3(Clearances and creepage distances, IS 60898-1)	-	1500	-
8.1.3(Clearances and creepage distances, IS 60898-1)	-	1500	-
8.1.4.1(Reliability of Screws current carrying parts and connections IS 60898-1)	-	4000	-
8.1.4.2(Reliability of Screws current carrying parts and connections IS 60898-1)	-	4000	-
8.1.4.3(Reliability of Screws current carrying parts and connections IS 60898-1)	-	4000	-
8.1.4.4(Reliability of Screws current carrying parts and connections IS 60898-1)	-	4000	-
8.1.5.1(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.2(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.3(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.4(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.5(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.6(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.7(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.8(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.9(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.10(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.11(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.12(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.2(Protection against Electric Shock, IS 60898-1)	-	3000	-
8.3.2(Dielectric strength at power frequency, IS 60898-1)	-	15000	-
8.3.4(Dielectric strength at rated impulse withstand voltage ( Uimp), IS 60898-1)	-	15000	-
8.1(Resistance to heat, IS 60898-1)	-	2500	-
8.11(Resistance to abnormal heat and to fire, IS 60898-1)	-	2500	-
8.12(Resistance to rusting, IS 60898-1)	-	3000	-
9.3(Test of indelibility of marking, IS 60898-1)	-	1000	-
9.4(Test of reliability of screws, current-carrying parts and connections, IS 60898-1)	-	4000	-
9.5.1(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	3500	-
9.5.2(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	3500	-
9.5.2(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	3500	-
9.5.2(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	3500	-
9.5.2(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	3500	-
9.5.3(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	3500	-
9.5.4(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	3500	-
9.6(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.6(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.6(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.1(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.2(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.3(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.4(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.5.1(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.5.2(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.5.3(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.5.4(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.9(28- day test, IS 60898-1)	-	50000	-
9.14.1(Test of resistance to heat, IS 60898-1)	-	2500	-
9.14.2(Test of resistance to heat, IS 60898-1)	-	2500	-
9.14.3(Test of resistance to heat, IS 60898-1)	-	2500	-
9.15(Resistance to abnormal heat and to fire)	-	2500	-
9.16(Test of resistance to rusting)	-	2500	-
8.1.6(Non-interchangeability)	-	1000	-
9.12.12(Verification of the circuit-breaker after short-circuit tests)	-	49000	-
9.13(Resistance to mechanical shock and impact)	-	10000	-
I.3(Verification of clearances between open contacts)	-	3000	-
8.4(Temperature-rise, IS 60898-1)	-	15000	-
8.4(Temperature-rise, IS 60898-1)	-	15000	-
8.5(Uninterrupted duty, IS 60898-1)	-	3000	-
8.6(Automatic operation, IS 60898-1)	-	2000	-
8.7(Mechanical and electrical endurance, IS 60898-1)	-	40000	-
8.8(Performance at short-circuit currents, IS 60898-1)	-	49000	-
8.9(Resistance to mechanical shock and impact, IS 60898-1)	-	10000	-
8.13(Power loss, IS 60898-1)	-	10000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	15000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	15000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	15000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	15000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	15000	-
9.8.5(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	15000	-
9.10.2(Test of tripping characteristic, IS 60898-1)	-	10000	-
9.10.3(Test of tripping characteristic, IS 60898-1)	-	10000	-
9.10.4(Test of tripping characteristic, IS 60898-1)	-	10000	-
9.10.5(Test of tripping characteristic, IS 60898-1)	-	10000	-
9.11(Verification of mechanical and electrical endurance, IS 60898-1)	-	40000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.13.1(Mechanical Stress, IS 60898-1)	-	3500	-
9.13.2.2(Mechanical Stress, IS 60898-1)	-	3500	-
9.13.2.3(Mechanical Stress, IS 60898-1)	-	3500	-
9.13.2.4(Mechanical Stress, IS 60898-1)	-	3500	-
9.13.2.5(Mechanical Stress, IS 60898-1)	-	3500	-
9.12.11.2.2(Short-circuit test for verifying the suitability of circuit-breakers for use in IT systems)	-	49000	-
I.2(Tripping tests)	-	10000	-
9.12.11.2.1(Performance at reduced short-circuit currents)	-	49000	-
9.12.11.3(Short-circuit performance at 1 500 A)	-	49000	-
9.12.11.4.2(Service short-circuit capacity (Ics))	-	49000	-
9.12.11.4.3(Performance at rated short-circuit capacity (Icn))	-	49000	-
9.12.11.4.4(Performance at rated making and breaking capacity (Icn1) on an individual pole of multipole circuit-breakers)	-	49000	-
8.3.3(Isolating capability, IS 60898-1)	-	5000	-
4.2(Classification, IS 60898-1)	-	500	-
4.3(Classification, IS 60898-1)	-	500	-
4.4(Classification, IS 60898-1)	-	500	-
4.5(Classification, IS 60898-1)	-	500	-
4.5.1(Classification, IS 60898-1)	-	500	-
4.5.2(Classification, IS 60898-1)	-	500	-
4.6(Classification, IS 60898-1)	-	500	-
4.7(Classification, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
6(Marking and other product information, IS 60898-1)	-	500	-
8.1.1(General, IS 60898-1)	-	500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.2(Mechanism, IS 60898-1)	-	1500	-
8.1.3(Clearances and creepage distances, IS 60898-1)	-	1500	-
8.1.3(Clearances and creepage distances, IS 60898-1)	-	1500	-
8.1.4.1(Reliability of Screws current carrying parts and connections IS 60898-1)	-	4000	-
8.1.4.2(Reliability of Screws current carrying parts and connections IS 60898-1)	-	4000	-
8.1.4.3(Reliability of Screws current carrying parts and connections IS 60898-1)	-	4000	-
8.1.4.4(Reliability of Screws current carrying parts and connections IS 60898-1)	-	4000	-
8.1.5.1(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.2(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.3(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.4(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.5(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.6(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.7(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.8(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.9(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.10(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.11(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.1.5.12(Reliability of terminals for external conductors, IS 60898-1)	-	4000	-
8.2(Protection against Electric Shock, IS 60898-1)	-	3000	-
8.3.2(Dielectric strength at power frequency, IS 60898-1)	-	15000	-
8.3.4(Dielectric strength at rated impulse withstand voltage ( Uimp), IS 60898-1)	-	15000	-
8.1(Resistance to heat, IS 60898-1)	-	2500	-
8.11(Resistance to abnormal heat and to fire, IS 60898-1)	-	15000	-
8.12(Resistance to rusting, IS 60898-1)	-	3000	-
9.3(Test of indelibility of marking, IS 60898-1)	-	1000	-
9.4(Test of reliability of screws, current-carrying parts and connections, IS 60898-1)	-	4000	-
9.5.1(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	3500	-
9.5.2(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	3500	-
9.5.2(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	3500	-
9.5.2(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	3500	-
9.5.2(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	3500	-
9.5.3(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	3500	-
9.5.4(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	3500	-
9.6(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.6(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.6(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.1(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.2(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.3(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.4(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.5.1(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.5.2(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.5.3(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.7.5.4(Test of protection against electric shock, IS 60898-1)	-	3000	-
9.9(28- day test, IS 60898-1)	-	50000	-
9.14.1(Test of resistance to heat, IS 60898-1)	-	2500	-
9.14.2(Test of resistance to heat, IS 60898-1)	-	2500	-
9.14.3(Test of resistance to heat, IS 60898-1)	-	2500	-
9.15(Resistance to abnormal heat and to fire)	-	15000	-
9.16(Test of resistance to rusting)	-	3000	-
8.1.6(Non-interchangeability)	-	1000	-
9.12.12(Verification of the circuit-breaker after short-circuit tests)	-	17000	-
9.13(Resistance to mechanical shock and impact)	-	10000	-
I.3(Verification of clearances between open contacts)	-	3000	-
8.4(Temperature-rise, IS 60898-1)	-	15000	-
8.4(Temperature-rise, IS 60898-1)	-	15000	-
8.5(Uninterrupted duty, IS 60898-1)	-	3000	-
8.6(Automatic operation, IS 60898-1)	-	2000	-
8.7(Mechanical and electrical endurance, IS 60898-1)	-	40000	-
8.8(Performance at short-circuit currents, IS 60898-1)	-	49000	-
8.9(Resistance to mechanical shock and impact, IS 60898-1)	-	10000	-
8.13(Power loss, IS 60898-1)	-	10000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	15000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	15000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	15000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	15000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	15000	-
9.8.5(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	15000	-
9.10.2(Test of tripping characteristic, IS 60898-1)	-	10000	-
9.10.3(Test of tripping characteristic, IS 60898-1)	-	10000	-
9.10.4(Test of tripping characteristic, IS 60898-1)	-	8000	-
9.10.5(Test of tripping characteristic, IS 60898-1)	-	10000	-
9.11(Verification of mechanical and electrical endurance, IS 60898-1)	-	40000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.12(Short- Circuit tests, IS 60898-1)	-	49000	-
9.13.1(Mechanical Stress, IS 60898-1)	-	3500	-
9.13.2.2(Mechanical Stress, IS 60898-1)	-	3500	-
9.13.2.3(Mechanical Stress, IS 60898-1)	-	3500	-
9.13.2.4(Mechanical Stress, IS 60898-1)	-	3500	-
9.13.2.5(Mechanical Stress, IS 60898-1)	-	3500	-
9.12.11.2.2(Short-circuit test for verifying the suitability of circuit-breakers for use in IT systems)	-	49000	-
I.2(Tripping tests)	-	10000	-
9.12.11.2.1(Performance at reduced short-circuit currents)	-	49000	-
9.12.11.3(Short-circuit performance at 1 500 A)	-	49000	-
9.12.11.4.2(Service short-circuit capacity (Ics))	-	49000	-
9.12.11.4.3(Performance at rated short-circuit capacity (Icn))	-	49000	-
9.12.11.4.4(Performance at rated making and breaking capacity (Icn1) on an individual pole of multipole circuit-breakers)	-	49000	-
8.3.3(Isolating capability, IS 60898-1)	-	5000	-

11 Apr, 2027

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included w.e.f 17.02.2026

IS 12640 : Part 2 (2016)

Residual current operated circuit - Breakers with integral overcurrent protection for household and similar uses (Rcbos): Part 2 general rules

2845000 View breakup
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Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
8.1.3(Clearances and creepage distances (internal parts))	-	1500	-
Cl. No. 9.15 & 4 to 10 of IEC : 60695-2-1(Resistance to abnormal heat and to fire)	-	15000	-
9.7.2(Insulation resistance of main circuit)	-	7500	-
9.7.3 a)(Dielectric strength of the main circuit)	-	5000	-
9.7.3 b)(Dielectric strength of the main circuit)	-	5000	-
9.7.3 c)(Dielectric strength of the main circuit)	-	5000	-
9.7.6(Capability of control circuits connected to the main circuit in respect of withstanding high d.c. voltages due to insulation measurements )	-	10000	-
9.9.1.2 c)(Verification of the correct operation in case of sudden appearance of residual current)	-	49000	-
9.2(Verification of resistance of the insulation against an impulse voltage)	-	10000	-
9.10.3(Condition of the RCBO after the test.)	-	500	-
9.12.12.1(VERIFICATION OF THE RCBO AFTER SHORT-CIRCUIT TEST : DIELECTRIC STRENGTH TEST)	-	21000	-
9.9.1.2(Verification of the operating characteristic under residual current conditions)	-	80000	-
9.12.13.2(Verification of the RCBO after residual current making and breaking test)	-	49000	-
9.9.1(Verification of the operating characteristic under residual current conditions)	-	80000	-
Cl. No. 9.11.2.1 i)(Condition of the RCBO after test)	-	500	-
9.13.1(Verification of resistance to mechanical shock )	-	10000	-
9.13.2(Verification of resistance to mechanical impact )	-	10000	-
9.12.12.1(VERIFICATION OF THE RCBO AFTER SHORT CIRCUIT TEST)	-	49000	-
9.12.12.2(VERIFICATION OF THE RCBO AFTER SHORT CIRCUIT TEST)	-	49000	-
6(Marking (except indelibility of marking))	-	500	-
8.1.1(Mechanical Design(General))	-	500	-
8.1.2(Mechanical Design (Mechanism))	-	500	-
6, 9.3(Indelibility of marking)	-	1000	-
8.1.6(Noninterchangeability)	-	500	-
8.2, 9.6(Protection against electric shock)	-	3000	-
8.9, 9.14(Resistance to heat)	-	2500	-
9.7.7.5(Verification of the behavior of components bridging the basic insulation)	-	10000	-
8.1.3, 8.3, 9.7.4(Insulation resistance and dielectric strength of auxiliary circuits)	-	7500	-
8.1.3, 8.3, 9.7.7.2(Verification of clearances with the impulse withstand voltage)	-	10000	-
8.1.3, Cl. 8.3, Cl. 9.7.6(Capability of control circuits connected to the main circuits)	-	10000	-
6(Marking)	-	500	-
8.1.1(General)	-	500	-
8.1.2(Mechanism)	-	1500	-
9.3(Indelebility of marking)	-	1000	-
9.6(Protection against electric shock)	-	3000	-
9.25(Resistance to rusting)	-	3000	-
9.15(Resistance to abnormal heat and to fire)	-	15000	-
9.7.4(Insulation resistance and dielectric strength of auxiliary circuits)	-	7500	-
9.7.7.2(Verification of clearances with the impulse withstand voltage)	-	10000	-
9.7.7.3(Verification of leakage currents across open contacts)	-	2000	-
9.19(Behaviour in case of surge currents)	-	12000	-
D.4(Observation)	-	500	-
9.23(Observation)	-	500	-
9.3(Indelibility of Marking)	-	1000	-
8.1.3(Creepage distances (mm))	-	1500	-
8.1.3(Clearance (mm))	-	1500	-
8.1.3()	-	1500	-
9.5.1(Pull test on terminals.)	-	8000	-
9.5.1(Pull test @ conductor of smallest and largest cross sctional area)	-	8000	-
9.13(Test of resistance to heat)	-	2500	-
9.14(Resistance to abnormal heat and to fire (glow wire test)	-	15000	-
9.7.3(Dielectric strength of the main circuit)	-	5000	-
9.10(Mechanical and electrical endurance)	-	40000	-
8.16, Cl. 9.23(Ageing of electronic components)	-	20000	-
9.23(Ageing of electronic components)	-	20000	-
9.12.11.4 b) (and 9.12.12)(Performance at service short-circuit capacity)	-	49000	-
9.12.11.4 c) (and 9.12.12.2)(Performance at rated short-circuit capacity)	-	49000	-
9.9.1.2(Off-load tests with residual sinusoidal alternating currents at the reference temperature of 20 °C ± 5 °C)	-	70000	-
9.9.2(Overcurrent operating characteristics)	-	49000	-
8.7, Cl. 9.12.13(Performance at I(delta)m)	-	49000	-
9.12.13(Performance at IΔm)	-	49000	-
9.12.11.2(PERFORMANCE AT REDUCED SHORT-CIRCUIT CURRENTS)	-	49000	-
9.22.1(Reliability (Climatic test))	-	70000	-
9.22.1.1(Reliability (Climatic test) : Testing chamber)	-	70000	-
9.22.1.2(Reliability (Climatic test) :Severity)	-	70000	-
9.22.1.3 b) 2(Reliability (Climatic test) : procedure)	-	70000	-
9.22.1.3 b) 2(Reliability (Climatic test) : procedure)	-	70000	-
9.22.1.4(Reliability (Climatic test) : Recovery)	-	70000	-
9.22.1.5(Reliability (Climatic test) : Final verification)	-	70000	-
9.4(Reliability of screws, current-carrying parts and connections)	-	4000	-
8.1.4(Reliability of Screws,current-carrying parts and connections)	-	4000	-
8.1.5(Reliability of Terminals for external conductors)	-	4000	-
8.1.3, 9.7.7.4(Resistance of the insulation of open contacts and basic insulation against an impulse voltage in normal conditions)	-	10000	-
9.7.7.4(Resistance of the insulation of open contacts and basic insulation against an impulse voltage in normal conditions)	-	10000	-
9.7.1(Resistance to humidity)	-	15000	-
8.1.4.4 , 9.25(Resistance to rusting)	-	3000	-
9.12.11.2.2(Short circuit test for verifying suitability of RCBOs for use in IT-systems)	-	49000	-
9.12.11.3(SHORT-CIRCUIT PERFORMANCE AT 1500 A)	-	49000	-
9.12.1(Short-circuit tests : )	-	49000	-
9.12.11.4(TEST AT SERVICE SHORT-CIRCUIT CAPACITY (Ics)	-	49000	-
9.9.2.3 a)(Test of effect of ambient temperature on the tripping characteristic)	-	10000	-
9.9.2.3 b)(Test of effect of ambient temperature on the tripping characteristic)	-	10000	-
9.9.2.2(Test of instantaneous tripping)	-	10000	-
9.4(Test of reliability of screws, current carrying parts and connections)	-	4000	-
9.5(Test of reliability of screws, current carrying parts and connections)	-	4000	-
9.5(Test of reliability of screw-type terminals for external)	-	4000	-
9.25(Test of resistance to rusting)	-	3000	-
9.8(Test of Temperature rise)	-	15000	-
9.9.2.1 a)(Test of time-(over)current characteristic)	-	10000	-
9.9.2.1 b)(Test of time-(over)current characteristic)	-	10000	-
9.5.3(Test with copper conductor of largest cross sectional area)	-	10000	-
9.5.2(Test with copper conductor of smallest and largest cross sctional area)	-	10000	-
9.22.2(Test with temperature of 40 ºC)	-	15000	-
9.7.7.1(testing procedure for the impulse withstand voltage tests)	-	10000	-
9.9.1.4(Tests at the temperature limits)	-	15000	-
D.2(Time & current)	-	10000	-
8.1.2 , 9.11(Trip-free mechanism)	-	5000	-
9.11(Trip-free mechanism)	-	3500	-
9.1(Verification of mechanical and electrical endurance)	-	40000	-
9.9.1.3(Verification of the correct operation with load at the reference temperature)	-	15000	-
9.16(Verification of the operation of the test device at the limits of rated voltage )	-	3000	-
9.16 a)(Verification of the operation of the test device at the limits of rated voltage)	-	3000	-
9.16 b)(Verification of the operation of the test device at the limits of rated voltage)	-	3000	-
9.12.13(Verification of the rated residual making and breaking capacity (I∆m)	-	49000	-
8.12, Cl.9.17(Behavior in the case of failure of line voltages)	-	5000	-
9.17(Behaviour in case of failure of the line voltage)	-	5000	-
9.9.1.5(Particular test conditions for RCBOs functionally dependent on line voltage)	-	10000	-
8.1.3, 8.3, Cl. 9.7.5(Secondary circuit of detection transformers)	-	10000	-
9.7.5(Secondary circuit of detection transformers)	-	10000	-
D.3(Voltage)	-	1000	-
6(Marking)	-	500	-
9.7.2(Insulation resistance of main circuit)	-	7500	-
9.7.2(Insulation resistance of main circuit)	-	7500	-
9.8(Test of temperature-rise )	-	15000	-
9.9.1.3(Verification of the correct operation with load at the reference temperature)	-	15000	-
9.12.13.2(Verification of the RCBO after residual current making and breaking test)	-	49000	-
9.12.13.2(Verification of the RCBO after residual current making and breaking test)	-	49000	-
9.16(Verification of the operation of the test device at the limits of rated voltage )	-	3000	-
9.16(Verification of the operation of the test device at the limits of rated voltage )	-	3000	-
9.9.1.2(Off-load tests with residual sinusoidal alternating currents at the reference temperature of 20 °C ± 5 °C)	-	70000	-
9.9.1.4(Tests at the temperature limits)	-	15000	-
9.19.1(Current surge test for all RCBOs (0,5 µs/100 kHz ring wave test)	-	15000	NOT IN NABL SCOPE
9.19.1(Current surge test for all RCBOs (0,5 µs/100 kHz ring wave test)	-	15000	NOT IN NABL SCOPE
9.19.2(Verification of behavior at surge currents up to 3000A (8/20µs surge current test))	-	5000	-
9.9.2.2(Test of instantaneous tripping)	-	10000	-
9.9.2.2(Test of instantaneous tripping)	-	10000	-
9.12.12.2(VERIFICATION OF THE RCBO AFTER SHORT CIRCUIT TEST)	-	49000	-
9.12.12.2(VERIFICATION OF THE RCBO AFTER SHORT CIRCUIT TEST)	-	49000	-
8.1.6(Non-interchangeability)	-	500	-
9.14(Resistance to heat)	-	2500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
6(Marking)	-	500	-
8.1.2(Mechanism)	-	1500	-
8.1.2(Mechanism)	-	1500	-
8.1.2(Mechanism)	-	1500	-
8.1.2(Mechanism)	-	1500	-
8.1.2(Mechanism)	-	1500	-
8.1.2(Mechanism)	-	1500	-
8.1.2(Mechanism)	-	1500	-
8.1.2(Mechanism)	-	1500	-
8.1.3(Clearance (mm))	-	1500	-
8.1.3(Clearance (mm))	-	1500	-
8.1.3(Clearance (mm))	-	1500	-
8.1.3(Clearance (mm))	-	1500	-
8.1.3(Clearance (mm))	-	1500	-
8.1.3(Clearance (mm))	-	1500	-
8.1.3(Clearance (mm))	-	1500	-
8.1.3(Clearance (mm))	-	1500	-
8.1.3(Clearance (mm))	-	1500	-
8.1.3(Creepage distances (mm))	-	1500	-
8.1.3(Creepage distances (mm))	-	1500	-
8.1.3(Creepage distances (mm))	-	1500	-
8.1.3(Creepage distances (mm))	-	1500	-
8.1.3(Creepage distances (mm))	-	1500	-
8.1.3(Creepage distances (mm))	-	1500	-
8.1.3(Creepage distances (mm))	-	1500	-
8.1.3(Creepage distances (mm))	-	1500	-
8.1.3(Creepage distances (mm))	-	1500	-
8.1.3(Creepage distances (mm))	-	1500	-
8.1.3(Creepage distances (mm))	-	1500	-
8.1.3(Creepage distances (mm))	-	1500	-
9.19.1(Current surge test for all RCBOs (0,5 µs/100 kHz ring wave test))	-	15000	-
9.19.2(Verification of behavior at surge currents up to 3000A (8/20µs surge current test))	-	5000	-
9.6(Protection against electric shock)	-	3000	-
9.13(Test of resistance to heat)	-	2500	-
9.13(Test of resistance to heat)	-	2500	-
9.13(Test of resistance to heat)	-	2500	-
9.13(Test of resistance to heat)	-	2500	-
9.14(Resistance to abnormal heat and to fire (glow wire test)	-	15000	-
9.14(Resistance to abnormal heat and to fire (glow wire test)	-	15000	-
9.7.1(Resistance to humidity)	-	15000	-
9.7.2(Insulation resistance of main circuit)	-	15000	-
9.7.4(Insulation resistance and dilectric strength of auxiliary circuits)	-	7500	-
9.7.4(Insulation resistance and dilectric strength of auxiliary circuits)	-	7500	-
9.8(Test of Temperature rise)	-	15000	-
9.8(Test of Temperature rise)	-	15000	-
9.8(Test of Temperature rise)	-	15000	-
9.8(Test of Temperature rise)	-	15000	-
9.9.1.3(Verification of the correct operation with load at the reference temperature)	-	15000	-
9.24()	-	2000	-
9.24(Electromagnetic Compatibility , (Electrostatic discharges))	-	15000	FACILITY AVAILABLE , NOT IN NABL SCOPE
9.24(Electromagnetic Compatibility , (Fast transients (bursts)))	-	15000	FACILITY AVAILABLE , NOT IN NABL SCOPE
9.24 Annex-A, Test Sequence-H(Surges)	-	50000	FACILITY AVAILABLE , NOT IN NABL SCOPE
9.24 Annex-A, Test Sequence-I(Conducted sine-wave form voltages or currents)	-	40000	FACILITY AVAILABLE , NOT IN NABL SCOPE
9.24 Annex-A, Test Sequence-J(Electrostatic discharges)	-	20000	FACILITY AVAILABLE , NOT IN NABL SCOPE

11 Apr, 2027

-
"1 9.24 Electromagnetic Compatibility , (Harmonics, inter harmonics) Test facility not available. 2 9.24 (Electromagnetic Compatibility , ( Harmonics, inter harmonics)) Electromagnetic Compatibility , (Harmonics, inter harmonics) Test facility not available. 3 9.24 (Electromagnetic Compatibility , (Signalling voltages)) Electromagnetic Compatibility , (Signalling voltages) Test facility not available. 4 9.24 (Electromagnetic Compatibility ,(Conducted unidirectional transients),) Electromagnetic Compatibility ,(Conducted unidirectional transients Test facility not available. 5 9.24 Electromagnetic Compatibility , (Harmonics, inter harmonics) Test facility not available. 6 9.24 (Electromagnetic Compatibility , ( Harmonics, inter harmonics)) Electromagnetic Compatibility , (Harmonics, inter harmonics) Test facility not available. 7 9.24 (Electromagnetic Compatibility , (Signalling voltages)) Electromagnetic Compatibility , (Signalling voltages) Test facility not available. 8 9.24 (Electromagnetic Compatibility ,(Conducted unidirectional transients),) Electromagnetic Compatibility ,(Conducted unidirectional transients Test facility not available. 9 9.24 (Electromagnetic Compatibility , (Conducted sine-wave form voltages or currents)) Electromagnetic Compatibility , (Conducted sine-wave form voltages or currents Test facility not available. 10 9.24 (Electromagnetic Compatibility ,(Radiated electromagnetic field)) Electromagnetic Compatibility ,(Radiated electromagnetic field Test facility not available. 11 9.24 (Electromagnetic Compatibility , (Conducted common mode disturbances in the frequency range lower than 150 kHz)) Electromagnetic Compatibility , (Conducted common mode disturbances in the frequency range lower than 150 kHz Test facility not available. 12 9.21 (DC components) DC components Test facility not available. 13 9.24 Annex-A, Test Sequence-J (Conducted common mode disturbances) Conducted common mode disturbances Test facility not available. 14 9.21 (DC components) DC components Test facility not available. 15 9.24 Annex-A, Test Sequence-J (Conducted common mode disturbances) Conducted common mode disturbances Test facility not available. 16 9.24 Annex-A, Test Sequence-H (Harmonics, inter harmonics) Harmonics, inter harmonics Test facility not available. 17 9.24 Annex-A, Test Sequence-H (Signalling voltages) Signalling voltages Test facility not available. 18 9.24 Annex-A, Test Sequence-H (Surges) Surges Test facility not available. 19 9.21 (DC components) DC components Test facility not available. 20 9.24 Annex-A, Test Sequence-J (Conducted common mode disturbances) Conducted common mode disturbances Test facility not available. 21 9.24 Annex-A, Test Sequence-H (Harmonics, inter harmonics) Harmonics, inter harmonics Test facility not available. 22 9.24 Annex-A, Test Sequence-H (Signalling voltages) Signalling voltages Test facility not available. 23 9.24 Annex-A, Test Sequence-H (Surges) Surges Test facility not available . 24 9.24 Annex-A, Test Sequence-I (Fast transients (bursts)) Fast transients (bursts) Test facility not available. 25 9.24 Annex-A, Test Sequence-I (Radiated electromagnetic field) Radiated electromagnetic field Test facility not available.

IS/IEC 61439 : Part 3 (2012)

Low - Voltage switchgear and controlgear assemblies: Part 3 distribution boards intended to be operated by ordinary persons (Dbo)

Distribution boards intended to be operated by ordinary persons

520000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
4(Symbols and abbreviations)	-	2000	No Test
5(Interface characteristics)	-	2000	No Test
6(Information)	-	2000	No Test
7(Service conditions)	-	2000	-
8(Constructional requirements)	-	2000	-
9(Performance requirements)	-	170000	EMI/EMC Test is Not Applicable
10(Design verification)	-	170000	-
11(Routine verification)	-	170000	-
4(Symbols and abbreviations)	-	2000	No test
5(Interface characteristics)	-	2000	No test
6(Information)	-	2000	no test
7(Service conditions)	-	1999.99	-
8(Constructional requirements)	-	2000	-
9(Performance requirements)	-	169999.99	EMI/EMC Test is Not Applicable
10(Design verification)	-	170000	-
11(Routine verification)	-	170000	-

11 Apr, 2027

-
Included w.e.f 24.04.2025

IS/IEC 60947 : Part 5 : Sec 5 (2016)

Low - Voltage switchgear and controlgear: Part 5 control circuit devices and switching elements: Sec 5 electrical emergency stop devices with mechanical latching function

1488000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
4(Marking and product information)	-	1000	NOT IN NABL SCOPE
5.1(Utilization categories for switching elements)	-	1000	NOT IN NABL SCOPE
5.2 ( K.8.3.7 of IS/IEC 60947-5-1 : 2009)(Verification of robustness of the actuating system)	-	45000	NOT IN NABL SCOPE
5.3(Degrees of protection of enclosed equipment)	-	25000	NOT IN NABL SCOPE
5.4 (8.3.3.4 of IS 60947-5-1)(Test Sequence I : Dielectric Properties)	-	25000	NOT IN NABL SCOPE
5.4 (8.3.3.5.5 b of IS 60947-5-1)(Test sequence II : Dielectric verification)	-	25000	NOT IN NABL SCOPE
5.4 (8.3.3.5.5 b of IS 60947-5-1)(Test sequence III : Dielectric verification)	-	25000	NOT IN NABL SCOPE
5.4 (8.3.3.5.5 b of IS 60947-5-1)(Test sequence IV : Dielectric verification)	-	25000	NOT IN NABL SCOPE
5.4 (Annex C of IEC 60947-1)(Test sequence V : Degree of protection of enclosed control circuit devices)	-	25000	NOT IN NABL SCOPE
5.4 (8.2.5 of IS 60947-5-1)(Test sequence V : Verification of actuation force or moment)	-	10000	NOT IN NABL SCOPE
5.4 (7.1.3 of IS 60947-5-1)(Test sequence VI : Measurement of clearances and creepage distances)	-	13000	NOT IN NABL SCOPE
7.1(General)	-	1000	NOT IN NABL SCOPE
7.2(General design inspection)	-	1000	NOT IN NABL SCOPE
7.3.1(General)	-	1000	NOT IN NABL SCOPE
7.5(Shock test)	-	60000	NOT IN NABL SCOPE
7.6(Vibration tests)	-	120000	NOT IN NABL SCOPE
7.7.5(Impact test for button type actuators)	-	6000	NOT IN NABL SCOPE
7.8.1(Disengagement of wire or rope)	-	18000	NOT IN NABL SCOPE
A.3.2.1(General)	-	1000	NOT IN NABL SCOPE
5.4 (8.3.3.2 of IS 60947-5-1)("Test Sequence I : Operating Limits of contactor relays")	-	15000	NOT IN NABL SCOPE
5.4 (8.3.3.3 of IS 60947-5-1)(Test Sequence I : Temperature Rise)	-	15000	NOT IN NABL SCOPE
5.2 (K.8.3.4 of IS/IEC 60947-5-1 : 2009)(Performance under conditional short-circuit current)	-	45000	NOT IN NABL SCOPE
5.4 (8.3.4 of IS 60947-5-1)(Test sequence IV : Performance under conditional short-circuit current)	-	45000	NOT IN NABL SCOPE
5.2 (K.8.3.5 of IS/IEC 60947-5-1 : 2009)(Mechanical operation at limits of temperature)	-	240000	NOT IN NABL SCOPE
5.2 (K.8.3.6 of IS/IEC 60947-5-1 : 2009)(Verification of direct opening action)	-	86000	NOT IN NABL SCOPE
5.4 (8.2.4 of IEC 60947-1)(Test Sequence I : Mechanical properties of Terminal)	-	32000	NOT IN NABL SCOPE
5.4 (8.3.3.5.2 of IS 60947-5-1)(Test sequence II : Making and breaking capacities of switching elements under normal conditions)	-	30000	NOT IN NABL SCOPE
5.4 (8.3.3.5.3 of IS 60947-5-1)(Test sequence III : Making and breaking capacities of switching elements under abnormal conditions)	-	50000	NOT IN NABL SCOPE
5.4 (8.2.6 of IS 60947-5-1)(Test sequence VI : Verification of limitation of rotation of a rotary switch)	-	10000	NOT IN NABL SCOPE
5.5(Electrical durability)	-	140000	NOT IN NABL SCOPE
7.3.2(Robustness of a button actuator)	-	6000	NOT IN NABL SCOPE
7.3.3(Durability test)	-	12000	NOT IN NABL SCOPE
7.4(Conditioning procedures)	-	100000	NOT IN NABL SCOPE
7.7.1(General)	-	1000	NOT IN NABL SCOPE
7.7.2(Opening test)	-	6000	NOT IN NABL SCOPE
7.7.3(Latching test for button-type emergency device)	-	6000	NOT IN NABL SCOPE
7.7.4(Resetting test)	-	6000	NOT IN NABL SCOPE
A.3.2.3(Electrical durability)	-	140000	NOT IN NABL SCOPE
A.3.2.2(Mechanical durability)	-	90000	NOT IN NABL SCOPE
4(Marking and product information)	-	-	-
5.1(Utilization categories for switching elements)	-	-	-
5.2 ( K.8.3.7 of IS/IEC 60947-5-1 : 2009)(Verification of robustness of the actuating system)	-	-	-
5.3(Degrees of protection of enclosed equipment)	-	-	-
5.4 (8.3.3.4 of IS 60947-5-1)(Test Sequence I : Dielectric Properties)	-	-	-
5.4 (8.3.3.5.5 b of IS 60947-5-1)(Test sequence II : Dielectric verification)	-	-	-
5.4 (8.3.3.5.5 b of IS 60947-5-1)(Test sequence III : Dielectric verification)	-	-	-
5.4 (8.3.3.5.5 b of IS 60947-5-1)(Test sequence IV : Dielectric verification)	-	-	-
5.4 (Annex C of IEC 60947-1)(Test sequence V : Degree of protection of enclosed control circuit devices)	-	-	-
5.4 (8.2.5 of IS 60947-5-1)(Test sequence V : Verification of actuation force or moment)	-	-	-
5.4 (7.1.3 of IS 60947-5-1)(Test sequence VI : Measurement of clearances and creepage distances)	-	-	-
7.1(General)	-	-	-
7.2(General design inspection)	-	-	-
7.3.1(General)	-	-	-
7.5(Shock test)	-	-	-
7.6(Vibration tests)	-	-	-
7.7.5(Impact test for button type actuators)	-	-	-
7.8.1(Disengagement of wire or rope)	-	-	-
A.3.2.1(General)	-	-	-
5.4 (8.3.3.2 of IS 60947-5-1)("Test Sequence I : Operating Limits of contactor relays")	-	-	-
5.4 (8.3.3.3 of IS 60947-5-1)(Test Sequence I : Temperature Rise)	-	-	-
5.2 (K.8.3.4 of IS/IEC 60947-5-1 : 2009)(Performance under conditional short-circuit current)	-	-	-
5.4 (8.3.4 of IS 60947-5-1)(Test sequence IV : Performance under conditional short-circuit current)	-	-	-
5.2 (K.8.3.5 of IS/IEC 60947-5-1 : 2009)(Mechanical operation at limits of temperature)	-	-	-
5.2 (K.8.3.6 of IS/IEC 60947-5-1 : 2009)(Verification of direct opening action)	-	-	-
5.4 (8.2.4 of IEC 60947-1)(Test Sequence I : Mechanical properties of Terminal)	-	-	-
5.4 (8.3.3.5.2 of IS 60947-5-1)(Test sequence II : Making and breaking capacities of switching elements under normal conditions)	-	-	-
5.4 (8.3.3.5.3 of IS 60947-5-1)(Test sequence III : Making and breaking capacities of switching elements under abnormal conditions)	-	-	-
5.4 (8.2.6 of IS 60947-5-1)(Test sequence VI : Verification of limitation of rotation of a rotary switch)	-	-	-
5.5(Electrical durability)	-	-	-
7.3.2(Robustness of a button actuator)	-	-	-
7.3.3(Durability test)	-	-	-
7.4(Conditioning procedures)	-	-	-
7.7.1(General)	-	-	-
7.7.2(Opening test)	-	-	-
7.7.3(Latching test for button-type emergency device)	-	-	-
7.7.4(Resetting test)	-	-	-
A.3.2.3(Electrical durability)	-	-	-
A.3.2.2(Mechanical durability)	-	-	-

11 Apr, 2027

-
Included w.e.f. 11.09.2024

IS/IEC 60947 : Part 5 : Sec 1 (2016)

Low-Voltage Switchgear And Control Gear : Part 5-1 Control Circuit Devices And Switching Elements Electromechanical Control Circuit Devices

3882000 View breakup
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Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
5.2.1(Marking : General ")	-	2000	NO TEST
5.2.2(Terminal identification and marking)	-	2000	NO TEST
5.2.3(Functional markings)	-	2000	NO TEST
5.2.4(Emergency stop)	-	2000	NO TEST
5.2.5(Operating diagram)	-	2000	NO TEST
5.2.5.1(Position indication)	-	2000	NO TEST
5.2.5.2(Terminal markings for operating diagrams)	-	2000	NO TEST
5.2.6(Time delay markings)	-	2000	NO TEST
5.3(Instructions for installation, operation and maintenance)	-	2000	NO TEST
7.1.2.2(Glow-wire testing)	-	20000	-
7.1.3(Current-carrying parts and their connections)	-	5000	-
7.1.4(Clearances and creepage distances)	-	5000	-
7.3.2.4(Electrostatic discharges)	-	20000	NOT IN NABL SCOPE
7.3.2.5(Radiated radio-frequency electromagnetic fields)	-	20000	NOT IN NABL SCOPE
7.3.2.6(Electrical fast transients/bursts)	-	20000	NOT IN NABL SCOPE
7.3.2.7(Surges)	-	20000	NOT IN NABL SCOPE
7.3.2.8(Conducted disturbances induced by radio-frequency fields)	-	20000	NOT IN NABL SCOPE
7.3.2.9(Power-frequency magnetic fields)	-	20000	NOT IN NABL SCOPE
7.3.2.10(Voltage dips and interruptions)	-	20000	NOT IN NABL SCOPE
7.3.2.11(Harmonics in the supply)	-	20000	NOT IN NABL SCOPE
7.3.3(Emission)	-	20000	NOT IN NABL SCOPE
7.2.3(Dielectric properties)	-	25000	-
8.2.1.1(Test of resistance to abnormal heat and fire)	-	20000	-
8.2.1.1.1(Glow-wire test)	-	20000	-
8.2.1.1.2(Flammability, hot wire ignition and arc ignition tests (on materials))	-	20000	-
8.2.3(Enclosures for equipment)	-	10000	-
8.2.4.2(Tests of mechanical strength of terminals)	-	10000	-
8.2.4.3(Testing for damage to and accidental loosening of conductors (flexion test))	-	10000	-
8.2.4.4(Pull-out test)	-	20000	-
8.2.4.5(Test for insertability of unprepared round copper conductors having the maximum cross-section)	-	10000	-
8.2.5(Verification of actuating force (or moment))	-	10000	-
8.2.6(Verification of limitation of rotation (of a rotary switch))	-	10000	-
8.2.7(Conduit pull-out test, torque test, and bending test with metallic conduits)	-	25000	-
8.3.3.4(Dielectric properties)	-	25000	-
8.4.2.4(Surges)	-	20000	NOT IN NABL SCOPE
8.3.1(Degree of protection of enclosed control circuit devices)	-	25000	-
F 8.1.2.6("Dielectric test after stresses")	-	25000	-
F 8.1.2.4(Impact test)	-	25000	-
F.8.1.2.3("Rapid change of temperature test")	-	50000	-
F.8.1.2.4(Impact test)	-	25000	-
F.8.1.2.1(Dielectric tests in new conditions)	-	25000	-
G.8.2.5(Bend test)	-	10000	-
G.8.2.4(Push test)	-	10000	-
G.8.2.3(Torque test)	-	10000	-
G.8.2.2(Pull-out test)	-	10000	-
H.8.7("Verification of electromagnetic compatibility")	-	20000	NOT IN NABL SCOPE
H.8.4(OFF-state current)	-	10000	NO TEST
H.8.2(Voltage drop test)	-	10000	-
J.8.5("Degree of protection for indicating towers")	-	25000	-
J.8.4.3(Indirect support mounting)	-	10000	-
J.8.4.2.3(Vibration)	-	25000	-
J.8.4.2.2(Shock)	-	25000	-
J.8.3.3.4.3("Dielectric test (indicator lights with built-in transformers)")	-	25000	-
J.8.3.3.4(Dielectric test)	-	25000	-
J.7.1.12(Indicator lights with built-in transformers)	-	2000	NO TEST
J.7("Constructional requirements")	-	10000	-
K 8.3.7(Verification of robustness of the actuating system)	-	10000	-
K 8.3.5(Verification of mechanical operation of position switches at limits of temperature)	-	15000	-
K.8.3.6(Verification of direct opening action)	-	10000	-
L.8.4(Special test for mechanically linked contact elements)	-	10000	-
L.8.4(Special test for mechanically linked contact elements)	-	10000	-
K.8.3.6(Verification of direct opening action)	-	10000	-
5.2.1(" Marking : General ")	-	2000	NO TEST
K 8.3.7(Verification of robustness of the actuating system)	-	10000	-
5.2.2(Terminal identification and marking)	-	2000	NO TEST
J.7("Constructional requirements")	-	10000	-
5.2.3(Functional markings)	-	2000	-
J.7.1.12(Indicator lights with built-in transformers)	-	10000	-
J.8.3.3.4(Dielectric test)	-	25000	-
5.2.4(Emergency stop)	-	2000	NO TEST
J.8.3.3.4.3("Dielectric test (indicator lights with built-in transformers)")	-	25000	-
5.2.5(Operating diagram)	-	2000	NO TEST
J.8.4.2.2(Shock)	-	2000	NO TEST
5.2.5.1(Position indication)	-	2000	NO TEST
J.8.4.2.3(Vibration)	-	25000	-
J.8.4.3(Indirect support mounting)	-	10000	-
5.2.5.2(Terminal markings for operating diagrams)	-	2000	NO TEST
J.8.5("Degree of protection for indicating towers")	-	25000	-
5.2.6(Time delay markings)	-	2000	NO TEST
H.8.2(Voltage drop test)	-	10000	-
5.3(Instructions for installation, operation and maintenance)	-	2000	NO TEST
H.8.4(OFF-state current)	-	2000	NO TEST
7.1.2.2(Glow-wire testing)	-	20000	-
7.1.3(Current-carrying parts and their connections)	-	5000	-
Cl-7.3(Electromagnetic compatibility (EMC))	-	20000	NOT IN NABL SCOPE
G.8.2.2(Pull-out test)	-	10000	-
7.1.4 of IEC 60947-1:2007 (Sequence 6)(Measurement of Clearances and creepage distances)	-	5000	-
G.8.2.3(Torque test)	-	10000	-
G.8.2.4(Push test)	-	10000	-
G.8.2.5(Bend test)	-	10000	-
F.8.1.2.1(Dielectric tests in new conditions)	-	25000	-
F.8.1.2.4(Impact test)	-	25000	-
7.3.2.4(Electrostatic discharges)	-	20000	NOT IN NABL SCOPE
F.8.1.2.5(Damp heat, cyclic)	-	50000	-
F.8.1.2.3("Rapid change of temperature test")	-	50000	-
7.3.2.6(Electrical fast transients/bursts)	-	20000	NOT IN NABL SCOPE
F 8.1.2.4(Impact test)	-	25000	-
F 8.1.2.6("Dielectric test after stresses")	-	25000	-
7.3.2.7(Surges)	-	20000	NOT IN NABL SCOPE
7.3.2.8(Conducted disturbances induced by radio-frequency fields)	-	20000	NOT IN NABL SCOPE
7.3.2.9(Power-frequency magnetic fields)	-	20000	NOT IN NABL SCOPE
Annex C of IEC 60947-1:2007 (Sequence 5)(Degree of protection of enclosed control circuit devices)	-	25000	-
8.4.2.4(Surges)	-	20000	NOT IN NABL SCOPE
7.3.2.10(Voltage dips and interruptions)	-	20000	NOT IN NABL SCOPE
7.3.2.11(Harmonics in the supply)	-	20000	NOT IN NABL SCOPE
7.3.3(Emission)	-	20000	NOT IN NABL SCOPE
7.2.3(Dielectric properties)	-	25000	-
8.3.3.4(Dielectric properties)	-	25000	-
8.2.7(Conduit pull-out test, torque test and bending test with metallic conduits)	-	25000	-
8.2.6 (Sequence 6)(Verification of limitation of rotation (of a rotary switch))	-	10000	-
8.2.1.1(Test of resistance to abnormal heat and fire)	-	50000	-
8.2.5 (Sequence 5)(Verification of actuating force (or moment))	-	10000	-
8.2.4.5(Test for insertability of unprepared round copper conductors having the maximum cross-section)	-	10000	-
8.2.1.1.1(Glow-wire test)	-	20000	-
8.2.4.4(Pull-out test)	-	20000	-
8.2.4.3(Testing for damage to and accidental loosening of conductors (flexion test))	-	10000	-
8.2.1.1.2(Flammability, hot wire ignition and arc ignition tests (on materials))	-	20000	-
8.2.4.2(Tests of mechanical strength of terminals)	-	10000	-
8.2.3(Enclosures for equipment)	-	10000	-
7.2.4.1(Making and breaking capacities)	-	30000	-
7.2.4.1(Making and breaking capacities)	-	30000	-
7.2.4.1(Making and breaking capacities)	-	30000	-
7.2.4.3(Durability)	-	140000	-
7.2.4.3(Durability)	-	140000	-
8.1.5(Special tests)	-	140000	-
8.1.5(Special tests)	-	140000	-
8.2.4(Mechanical and electrical properties of terminals)	-	20000	-
8.2.4(Mechanical and electrical properties of terminals)	-	20000	-
8.3.3.5(Making and breaking capacities)	-	30000	-
8.3.3.5(Making and breaking capacities)	-	30000	-
8.3.3.5.2(Test circuits and connections)	-	10000	-
8.3.3.5.2(Test circuits and connections)	-	10000	-
C.1.2(Observation)	-	10000	-
C.1.2(Observation)	-	10000	-
C.2(Mechanical durability)	-	90000	-
C.2(Mechanical durability)	-	90000	-
C.3(Electrical durability)	-	140000	-
C.3(Electrical durability)	-	140000	-
H.8.5("Making and breaking capacities")	-	30000	-
H.8.5("Making and breaking capacities")	-	30000	-
N.3(Method based on durability test results)	-	30000	-
8.3.4.3(Test circuit and test quantities)	-	10000	-
8.3.4.2(Performance under conditional short-circuit current : Test procedure)	-	45000	-
8.3.4.4 a)(Condition of the switching element after the test)	-	10000	-
8.3.4.4 b)(Condition of the switching element after the test)	-	10000	-
H.8.6("Performance under short circuit current conditions")	-	45000	-
J.8.3.4("Short Circuit test (on built-in transformers, if any)")	-	45000	-
K 8.3.4("Performance under conditional shortcircuit current")	-	45000	-
K 8.3.4("Performance under conditional shortcircuit current")	-	45000	-
J.8.3.4("Short Circuit test (on built-in transformers, if any)")	-	45000	-
8.3.4.4 a)(Condition of the switching element after the test)	-	10000	-
8.3.4.4 b)(Condition of the switching element after the test)	-	10000	-
8.3.4.1(General conditions for short-circuit tests)	-	45000	-
8.3.4.2(Performance under conditional short-circuit current : Test procedure)	-	45000	-
8.3.4.3(Test circuit and test quantities)	-	10000	-
8.3.3.3(Temperature rise)	-	15000	-
J.8.3.3.3(Temp-rise tests)	-	15000	-
J.8.3.3.3(Temp-rise tests)	-	15000	-
8.3.3.3(Temperature rise)	-	15000	-
8.3.3.2(Operating limits of contactor relays)	-	15000	-
K 8.3.5(Verification of mechanical operation of position switches at limits of temperature)	-	15000	-
8.3.3.2(Operating limits of contactor relays)	-	15000	-
8.3.4.1(General conditions for short-circuit tests)	-	45000	-
F.8.1.2.5(Damp heat, cyclic)	-	50000	-
H.8.6("Performance under short circuit current conditions")	-	45000	-
5.2.1(Marking : General ")	-	2000	NO TEST
5.2.2(Terminal identification and marking)	-	2000	NO TEST
5.2.3(Functional markings)	-	2000	NO TEST
5.2.4(Emergency stop)	-	2000	NO TEST
5.2.5(Operating diagram)	-	2000	NO TEST
5.2.5.1(Position indication)	-	2000	NO TEST
5.2.5.2(Terminal markings for operating diagrams)	-	2000	NO TEST
5.2.6(Time delay markings)	-	2000	NO TEST
5.3(Instructions for installation, operation and maintenance)	-	2000	NO TEST
7.1.2.2(Glow-wire testing)	-	20000	-
7.1.3(Current-carrying parts and their connections)	-	5000	-
7.1.4(Clearances and creepage distances)	-	5000	-
7.3.2.4(Electrostatic discharges)	-	20000	NOT IN NABL SCOPE
7.3.2.5(Radiated radio-frequency electromagnetic fields)	-	20000	NOT IN NABL SCOPE
7.3.2.6(Electrical fast transients/bursts)	-	20000	NOT IN NABL SCOPE
7.3.2.7(Surges)	-	20000	NOT IN NABL SCOPE
7.3.2.8(Conducted disturbances induced by radio-frequency fields)	-	20000	NOT IN NABL SCOPE
7.3.2.9(Power-frequency magnetic fields)	-	20000	NOT IN NABL SCOPE
7.3.2.10(Voltage dips and interruptions)	-	20000	NOT IN NABL SCOPE
7.3.2.11(Harmonics in the supply)	-	20000	NOT IN NABL SCOPE
7.3.3(Emission)	-	20000	NOT IN NABL SCOPE
7.2.3(Dielectric properties)	-	25000	-
8.2.1.1(Test of resistance to abnormal heat and fire)	-	20000	-
8.2.1.1.1(Glow-wire test)	-	20000	-
8.2.1.1.2(Flammability, hot wire ignition and arc ignition tests (on materials))	-	20000	-
8.2.3(Enclosures for equipment)	-	10000	-
8.2.4.2(Tests of mechanical strength of terminals)	-	10000	-
8.2.4.3(Testing for damage to and accidental loosening of conductors (flexion test))	-	10000	-
8.2.4.4(Pull-out test)	-	20000	-
8.2.4.5(Test for insertability of unprepared round copper conductors having the maximum cross-section)	-	10000	-
8.2.5(Verification of actuating force (or moment))	-	10000	-
8.2.6(Verification of limitation of rotation (of a rotary switch))	-	10000	-
8.2.7(Conduit pull-out test, torque test, and bending test with metallic conduits)	-	25000	-
8.3.3.4(Dielectric properties)	-	25000	-
8.4.2.4(Surges)	-	20000	-
8.3.1(Degree of protection of enclosed control circuit devices)	-	25000	-
F 8.1.2.6("Dielectric test after stresses")	-	25000	-
F 8.1.2.4(Impact test)	-	25000	-
F.8.1.2.3("Rapid change of temperature test")	-	50000	-
F.8.1.2.4(Impact test)	-	25000	-
F.8.1.2.1(Dielectric tests in new conditions)	-	25000	-
G.8.2.5(Bend test)	-	10000	-
G.8.2.4(Push test)	-	10000	-
G.8.2.3(Torque test)	-	10000	-
G.8.2.2(Pull-out test)	-	10000	-
H.8.7("Verification of electromagnetic compatibility")	-	20000	-
H.8.4(OFF-state current)	-	10000	-
H.8.2(Voltage drop test)	-	10000	-
J.8.5("Degree of protection for indicating towers")	-	25000	-
J.8.4.3(Indirect support mounting)	-	10000	-
J.8.4.2.3(Vibration)	-	25000	-
J.8.4.2.2(Shock)	-	25000	-
J.8.3.3.4.3("Dielectric test (indicator lights with built-in transformers)")	-	25000	-
J.8.3.3.4(Dielectric test)	-	25000	-
J.7.1.12(Indicator lights with built-in transformers)	-	2000	-
J.7("Constructional requirements")	-	10000	-
K 8.3.7(Verification of robustness of the actuating system)	-	10000	-
K 8.3.5(Verification of mechanical operation of position switches at limits of temperature)	-	15000	-
K.8.3.6(Verification of direct opening action)	-	10000	-
L.8.4(Special test for mechanically linked contact elements)	-	10000	-
L.8.4(Special test for mechanically linked contact elements)	-	10000	-
K.8.3.6(Verification of direct opening action)	-	10000	-
5.2.1(" Marking : General ")	-	2000	NO TEST
K 8.3.7(Verification of robustness of the actuating system)	-	25000	-
5.2.2(Terminal identification and marking)	-	2000	-
J.7("Constructional requirements")	-	2000	-
5.2.3(Functional markings)	-	2000	-
J.7.1.12(Indicator lights with built-in transformers)	-	5000	-
J.8.3.3.4(Dielectric test)	-	25000	-
5.2.4(Emergency stop)	-	2000	-
J.8.3.3.4.3("Dielectric test (indicator lights with built-in transformers)")	-	25000	-
5.2.5(Operating diagram)	-	2000	-
J.8.4.2.2(Shock)	-	2000	-
5.2.5.1(Position indication)	-	2000	-
J.8.4.2.3(Vibration)	-	25000	-
J.8.4.3(Indirect support mounting)	-	10000	-
5.2.5.2(Terminal markings for operating diagrams)	-	2000	-
J.8.5("Degree of protection for indicating towers")	-	25000	-
5.2.6(Time delay markings)	-	2000	-
H.8.2(Voltage drop test)	-	10000	-
5.3(Instructions for installation, operation and maintenance)	-	2000	-
H.8.4(OFF-state current)	-	2000	-
7.1.2.2(Glow-wire testing)	-	20000	-
7.1.3(Current-carrying parts and their connections)	-	5000	-
Cl-7.3(Electromagnetic compatibility (EMC))	-	20000	NOT IN NABL SCOPE
G.8.2.2(Pull-out test)	-	10000	-
7.1.4 of IEC 60947-1:2007 (Sequence 6)(Measurement of Clearances and creepage distances)	-	5000	-
G.8.2.3(Torque test)	-	10000	-
G.8.2.4(Push test)	-	10000	-
G.8.2.5(Bend test)	-	10000	-
F.8.1.2.1(Dielectric tests in new conditions)	-	25000	-
F.8.1.2.4(Impact test)	-	25000	-
7.3.2.4(Electrostatic discharges)	-	20000	NOT IN NABL SCOPE
F.8.1.2.5(Damp heat, cyclic)	-	50000	-
F.8.1.2.3("Rapid change of temperature test")	-	50000	-
7.3.2.6(Electrical fast transients/bursts)	-	20000	NOT IN NABL SCOPE
F 8.1.2.4(Impact test)	-	25000	-
F 8.1.2.6("Dielectric test after stresses")	-	25000	-
7.3.2.7(Surges)	-	25000	NOT IN NABL SCOPE
7.3.2.8(Conducted disturbances induced by radio-frequency fields)	-	25000	NOT IN NABL SCOPE
7.3.2.9(Power-frequency magnetic fields)	-	25000	NOT IN NABL SCOPE
Annex C of IEC 60947-1:2007 (Sequence 5)(Degree of protection of enclosed control circuit devices)	-	25000	-
8.4.2.4(Surges)	-	20000	NOT IN NABL SCOPE
7.3.2.10(Voltage dips and interruptions)	-	20000	NOT IN NABL SCOPE
7.3.2.11(Harmonics in the supply)	-	20000	NOT IN NABL SCOPE
7.3.3(Emission)	-	20000	NOT IN NABL SCOPE
7.2.3(Dielectric properties)	-	25000	-
8.3.3.4(Dielectric properties)	-	25000	-
8.2.7(Conduit pull-out test, torque test and bending test with metallic conduits)	-	25000	-
8.2.6 (Sequence 6)(Verification of limitation of rotation (of a rotary switch))	-	10000	-
8.2.1.1(Test of resistance to abnormal heat and fire)	-	50000	-
8.2.5 (Sequence 5)(Verification of actuating force (or moment))	-	10000	-
8.2.4.5(Test for insertability of unprepared round copper conductors having the maximum cross-section)	-	10000	-
8.2.1.1.1(Glow-wire test)	-	20000	-
8.2.4.4(Pull-out test)	-	20000	-
8.2.4.3(Testing for damage to and accidental loosening of conductors (flexion test))	-	10000	-
8.2.1.1.2(Flammability, hot wire ignition and arc ignition tests (on materials))	-	20000	-
8.2.4.2(Tests of mechanical strength of terminals)	-	10000	-
8.2.3(Enclosures for equipment)	-	10000	-
7.2.4.1(Making and breaking capacities)	-	30000	-
7.2.4.1(Making and breaking capacities)	-	30000	-
7.2.4.1(Making and breaking capacities)	-	30000	-
7.2.4.3(Durability)	-	140000	-
7.2.4.3(Durability)	-	140000	-
8.1.5(Special tests)	-	140000	-
8.1.5(Special tests)	-	140000	-
8.2.4(Mechanical and electrical properties of terminals)	-	20000	-
8.2.4(Mechanical and electrical properties of terminals)	-	20000	-
8.3.3.5(Making and breaking capacities)	-	30000	-
8.3.3.5(Making and breaking capacities)	-	30000	-
8.3.3.5.2(Test circuits and connections)	-	10000	-
8.3.3.5.2(Test circuits and connections)	-	10000	-
C.1.2(Observation)	-	10000	-
C.1.2(Observation)	-	10000	-
C.2(Mechanical durability)	-	90000	-
C.2(Mechanical durability)	-	90000	-
C.3(Electrical durability)	-	140000	-
C.3(Electrical durability)	-	140000	-
H.8.5("Making and breaking capacities")	-	30000	-
H.8.5("Making and breaking capacities")	-	30000	-
N.3(Method based on durability test results)	-	30000	-
8.3.4.3(Test circuit and test quantities)	-	10000	-
8.3.4.2(Performance under conditional short-circuit current : Test procedure)	-	45000	-
8.3.4.4 a)(Condition of the switching element after the test)	-	45000	-
8.3.4.4 b)(Condition of the switching element after the test)	-	45000	-
H.8.6("Performance under short circuit current conditions")	-	45000	-
J.8.3.4("Short Circuit test (on built-in transformers, if any)")	-	45000	-
K 8.3.4("Performance under conditional shortcircuit current")	-	4545000000	-
K 8.3.4("Performance under conditional shortcircuit current")	-	45000	-
J.8.3.4("Short Circuit test (on built-in transformers, if any)")	-	45000	-
8.3.4.4 a)(Condition of the switching element after the test)	-	10000	-
8.3.4.4 b)(Condition of the switching element after the test)	-	10000	-
8.3.4.1(General conditions for short-circuit tests)	-	45000	-
8.3.4.2(Performance under conditional short-circuit current : Test procedure)	-	45000	-
8.3.4.3(Test circuit and test quantities)	-	45000	-
8.3.3.3(Temperature rise)	-	15000	-
J.8.3.3.3(Temp-rise tests)	-	15000	-
J.8.3.3.3(Temp-rise tests)	-	15000	-
8.3.3.3(Temperature rise)	-	15000	-
8.3.3.2(Operating limits of contactor relays)	-	15000	-
K 8.3.5(Verification of mechanical operation of position switches at limits of temperature)	-	15000	-
8.3.3.2(Operating limits of contactor relays)	-	15000	-
8.3.4.1(General conditions for short-circuit tests)	-	45000	-
F.8.1.2.5(Damp heat, cyclic)	-	50000	-
H.8.6("Performance under short circuit current conditions")	-	45000	-

11 Apr, 2027

-
Included w.e.f. 17.09.2024 Exclusion: Cl. 7.3.3 (Emission), Cl. 7.3.2.11 (Harmonics in the supply), J.8.4.2.3 (Vibration)

IS/IEC 60947 : Part 4 : Sec 1 (2018)

Low-Voltage switchgear and controlgear : Part 4-1 Contactors and motor starters electromechanical contactors and motor-Starters

2335000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
8.1.2(Materials)	-	0	NO TEST
8.1.2.1(General materials requirements)	-	5000	-
8.1.2.2(Glow wire testing)	-	20000	-
8.1.2.3(Test based on flammability category)	-	20000	-
8.1.3(Current-carrying parts and their connections)	-	10000	-
8.1.4(Clearances and creepage distances)	-	5000	-
8.1.5.1(Insulation)	-	2000	No Test
8.1.5.2(Direction of movement)	-	2000	No Test
8.1.5.3(Mounting)	-	2000	No Test
8.1.5.4(Protection)	-	2000	No Test
8.1.8(Terminals)	-	2000	No Test
8.1.8.1(General)	-	2000	No Test
8.1.8.2(Terminal identification and marking)	-	1000	-
8.1.9(Additional requirements for equipment provided with a neutral pole)	-	1000	-
8.1.10(Provisions for protective earthing)	-	1000	-
8.1.11(Enclosures for equipment)	-	1000	-
8.1.11.1(Design)	-	1000	No Test
8.1.11.2(Insulation)	-	1000	No Test
8.1.12(Degrees of protection of enclosed equipment)	-	30000	-
8.1.13(Conduit pull-out, torque and bending with metallic conduits)	-	25000	-
8.2.3(Dielectric properties)	-	25000	-
8.2.3.2(Voltage limiting components between circuits)	-	25000	-
9.1.5.2(Environment tests)	-	100000	-
9.3.6.3(Dielectric tests)	-	25000	-
M.9.5(Climatic test)	-	50000	-
8.2.4 of IEC 60947-1:2007 (Sequence 5)(Verification of Mechanical properties of terminals)	-	30000	-
Annex C of IEC 60947-1:2007 (Sequence 5)(Verification of Degree of protection of enclosed contactors and starters)	-	30000	-
M.9.11(Clearance and creepage distances)	-	5000	-
P.2.4.2(Test voltage)	-	25000	-
P.2.4.3(Application of the test voltage)	-	25000	-
8.2.2(Temperature-rise)	-	15000	-
8.2.2.3(Accessible parts)	-	15000	-
8.2.2.4(Ambient air temperature)	-	15000	-
8.2.2.5(Main circuit)	-	15000	-
8.2.2.6(Control circuits)	-	15000	-
8.2.2.7.1(Uninterrupted and eight-hour duty windings)	-	15000	-
9.3.3.3.2(Measurement of the temperature of parts)	-	15000	-
9.3.3.3.3(Temperature-rise of a part)	-	15000	-
9.3.3.3.4(Temperature-rise of the main circuit)	-	15000	-
9.3.3.3.5(Temperature-rise of control circuits)	-	15000	-
9.3.3.3.6(Temperature-rise of coils and electromagnets)	-	15000	-
9.3.3.3.7(Temperature-rise of auxiliary circuits)	-	15000	-
9.3.3.3.8(Temperature-rise of starting resistors for rheostatic rotor starters)	-	15000	-
M.9.4(Thermal cycling test)	-	25000	-
8.1.17(Short-circuit and overload protection of ports)	-	45000	-
8.2.5.1(Performance under short-circuit conditions)	-	45000	-
9.3.4.2.3(Test at the rated conditional short-circuit current Iq)	-	45000	-
P.4(Test of MPSD for IT system)	-	45000	-
M.9.7(Critical load current test)	-	45000	-
Q.5.3(Selectivity determined by test)	-	45000	-
8.2.4.3.1(Mechanical durability)	-	90000	-
8.2.4.3.2(Electrical durability)	-	140000	-
9.2.2(Electrical performance of screwless-type clamping units)	-	140000	-
9.3.3.6(Operational performance capability)	-	70000	-
9.3.6.4(Mechanical operation tests of a MPSD)	-	90000	-
P.2.3(Verification of operational performance capability)	-	40000	-
8.2.4.4(Overload current withstand capability of contactors)	-	25000	-
9.3.5(Overload current withstand capability of contactors)	-	25000	-
8.2.4.5(Coil power consumption)	-	15000	-
8.2.4.6(Pole impedance)	-	10000	-
9.3.3.2.1.2(Coil power consumption)	-	10000	-
9.3.3.2.1.3(Pole impedance)	-	10000	-
9.3.3.2.2(Relays and releases)	-	5000	-
9.3.3.3.1(Ambient air temperature)	-	15000	-
8.1.14(Limited energy source)	-	1000	-
8.1.14.1(General)	-	1000	-
8.1.14.2(Limited energy source with galvanic separation)	-	1000	-
8.1.14.3(Limited energy source with current limiting impedance)	-	1000	-
8.1.15(Stored charge energy circuit)	-	1000	-
8.1.16(Fault and abnormal conditions)	-	1000	-
8.2(Performance requirements)	-	20000	-
8.2.1(Operating conditions)	-	45000	-
8.2.1.1.1(General conditions)	-	5000	-
8.2.1.2(Limits of operation of contactors and power-operated starters)	-	5000	-
8.2.1.3(Limits of operation of under-voltage relays and releases)	-	5000	-
8.2.1.4(Limits of operation of shunt-coil operated releases (shunt trip))	-	5000	-
8.2.1.5(Limits of operation of current sensing relays and releases)	-	5000	-
8.2.1.5.1(Limits of operation of time-delay overload relays when all poles are energized)	-	5000	-
8.2.1.5.1.1(General tripping requirements of overload relays)	-	15000	-
8.2.1.5.1.2(Thermal memory test verification)	-	15000	-
8.2.1.5.2(Limits of operation of three-pole time-delay overload relays energized on two poles)	-	5000	-
8.2.1.5.3(Limits of operation of instantaneous magnetic overload relays)	-	5000	-
8.2.1.5.4(Limits of operation of under-current relays and releases for automatic change over)	-	5000	-
8.2.1.5.4.1(Limits of operation of under-current relays)	-	5000	-
8.2.1.5.4.2(Limits of operation of automatic change over by under-current relays)	-	5000	-
9.2.3(Ageing test for screwless-type clamping unit)	-	10000	-
9.3.3.2(Operating limits)	-	20000	-
9.3.6.2(Operation and operating limits)	-	20000	-
F.7.2(Tests on products in a new condition)	-	20000	-
F.7.3(Test after conventional operational performance)	-	20000	-
H.3(Limits of operation of control functions)	-	5000	-
H.4(Test of the control functions)	-	15000	-
8.3(Electromagnetic compatibility (EMC))	-	20000	NOT IN NABL SCOPE
8.3.2(Immunity)	-	20000	NOT IN NABL SCOPE
8.3.3(Emission)	-	20000	NOT IN NABL SCOPE
9.2.4(Limited energy source test)	-	5000	-
9.2.5(Breakdown of components)	-	5000	-
9.2.5.2(Breakdown of components test)	-	5000	-
9.4.2(Immunity)	-	20000	NOT IN NABL SCOPE
9.4.2.2(Electrostatic discharge)	-	20000	NOT IN NABL SCOPE
9.4.2.3(Radiated radio-frequency electromagnetic field)	-	20000	NOT IN NABL SCOPE
9.4.2.4(Conducted disturbances induced by radio-frequency fields)	-	20000	NOT IN NABL SCOPE
9.4.2.5(Electrical fast transient/bursts)	-	20000	NOT IN NABL SCOPE
9.4.2.6(Surges)	-	20000	NOT IN NABL SCOPE
9.4.2.7(Power frequency magnetic field)	-	20000	-
9.4.2.8(Voltage dips and short-time interruptions)	-	20000	NOT IN NABL SCOPE
9.4.2.9(Harmonics in the supply)	-	20000	NOT IN NABL SCOPE
9.4.3(Emission)	-	20000	NOT IN NABL SCOPE
M.8.3(Electromagnetic compatibility (EMC))	-	20000	NOT IN NABL SCOPE
N.3.2(Touch current measurement)	-	5000	-
8.2.4.7(Ability of a MPSD to make and break under short-circuit conditions)	-	45000	-
8.2.5.3(Co-ordination test between AC-3e rated starter and associated SCPD)	-	45000	-
8.2.5.4(Co-ordination between a MPSD and another short-circuit protective device)	-	45000	-
9.3.4.2.2(prospective current)	-	1000	-
8.1.2(Materials)	-	0	NO TEST
8.1.2.1(General materials requirements)	-	5000	-
8.1.2.2(Glow wire testing)	-	20000	-
8.1.2.3(Test based on flammability category)	-	20000	-
8.1.3(Current-carrying parts and their connections)	-	20000	-
8.1.4(Clearances and creepage distances)	-	5000	-
8.1.5.1(Insulation)	-	2000	NO TEST
8.1.5.2(Direction of movement)	-	2000	NO TEST
8.1.5.3(Mounting)	-	2000	NO TEST
8.1.5.4(Protection)	-	2000	NO TEST
8.1.8(Terminals)	-	2000	NO TEST
8.1.8.1(General)	-	2000	NO TEST
8.1.8.2(Terminal identification and marking)	-	1000	-
8.1.9(Additional requirements for equipment provided with a neutral pole)	-	1000	-
8.1.10(Provisions for protective earthing)	-	1000	-
8.1.11(Enclosures for equipment)	-	1000	-
8.1.11.1(Design)	-	2000	-
8.1.11.2(Insulation)	-	2000	-
8.1.12(Degrees of protection of enclosed equipment)	-	30000	-
8.1.13(Conduit pull-out, torque and bending with metallic conduits)	-	25000	-
8.2.3(Dielectric properties)	-	25000	-
8.2.3.2(Voltage limiting components between circuits)	-	25000	-
9.1.5.2(Environment tests)	-	100000	-
9.3.6.3(Dielectric tests)	-	25000	-
M.9.5(Climatic test)	-	50000	-
8.2.4 of IEC 60947-1:2007 (Sequence 5)(Verification of Mechanical properties of terminals)	-	30000	-
Annex C of IEC 60947-1:2007 (Sequence 5)(Verification of Degree of protection of enclosed contactors and starters)	-	30000	-
M.9.11(Clearance and creepage distances)	-	5000	-
P.2.4.2(Test voltage)	-	25000	-
P.2.4.3(Application of the test voltage)	-	25000	-
8.2.2(Temperature-rise)	-	15000	-
8.2.2.3(Accessible parts)	-	15000	-
8.2.2.4(Ambient air temperature)	-	15000	-
8.2.2.5(Main circuit)	-	15000	-
8.2.2.6(Control circuits)	-	15000	-
8.2.2.7.1(Uninterrupted and eight-hour duty windings)	-	15000	-
9.3.3.3.2(Measurement of the temperature of parts)	-	15000	-
9.3.3.3.3(Temperature-rise of a part)	-	15000	-
9.3.3.3.4(Temperature-rise of the main circuit)	-	15000	-
9.3.3.3.5(Temperature-rise of control circuits)	-	15000	-
9.3.3.3.6(Temperature-rise of coils and electromagnets)	-	15000	-
9.3.3.3.7(Temperature-rise of auxiliary circuits)	-	15000	-
9.3.3.3.8(Temperature-rise of starting resistors for rheostatic rotor starters)	-	15000	-
M.9.4(Thermal cycling test)	-	25000	-
8.1.17(Short-circuit and overload protection of ports)	-	45000	-
8.2.5.1(Performance under short-circuit conditions)	-	45000	-
9.3.4.2.3(Test at the rated conditional short-circuit current Iq)	-	45000	-
P.4(Test of MPSD for IT system)	-	45000	-
M.9.7(Critical load current test)	-	45000	-
Q.5.3(Selectivity determined by test)	-	45000	-
8.2.4.3.1(Mechanical durability)	-	90000	-
8.2.4.3.2(Electrical durability)	-	140000	-
9.2.2(Electrical performance of screwless-type clamping units)	-	140000	-
9.3.3.6(Operational performance capability)	-	70000	-
9.3.6.4(Mechanical operation tests of a MPSD)	-	90000	-
P.2.3(Verification of operational performance capability)	-	40000	-
8.2.4.4(Overload current withstand capability of contactors)	-	25000	-
9.3.5(Overload current withstand capability of contactors)	-	25000	-
8.2.4.5(Coil power consumption)	-	15000	-
8.2.4.6(Pole impedance)	-	10000	-
9.3.3.2.1.2(Coil power consumption)	-	15000	-
9.3.3.2.1.3(Pole impedance)	-	10000	-
9.3.3.2.2(Relays and releases)	-	5000	-
9.3.3.3.1(Ambient air temperature)	-	15000	-
8.1.14(Limited energy source)	-	1000	-
8.1.14.1(General)	-	1000	-
8.1.14.2(Limited energy source with galvanic separation)	-	1000	-
8.1.14.3(Limited energy source with current limiting impedance)	-	1000	-
8.1.15(Stored charge energy circuit)	-	1000	-
8.1.16(Fault and abnormal conditions)	-	1000	-
8.2(Performance requirements)	-	1000	-
8.2.1(Operating conditions)	-	45000	-
8.2.1.1.1(General conditions)	-	5000	-
8.2.1.2(Limits of operation of contactors and power-operated starters)	-	5000	-
8.2.1.3(Limits of operation of under-voltage relays and releases)	-	5000	-
8.2.1.4(Limits of operation of shunt-coil operated releases (shunt trip))	-	5000	-
8.2.1.5(Limits of operation of current sensing relays and releases)	-	5000	-
8.2.1.5.1(Limits of operation of time-delay overload relays when all poles are energized)	-	5000	-
8.2.1.5.1.1(General tripping requirements of overload relays)	-	15000	-
8.2.1.5.1.2(Thermal memory test verification)	-	15000	-
8.2.1.5.2(Limits of operation of three-pole time-delay overload relays energized on two poles)	-	5000	-
8.2.1.5.3(Limits of operation of instantaneous magnetic overload relays)	-	5000	-
8.2.1.5.4(Limits of operation of under-current relays and releases for automatic change over)	-	5000	-
8.2.1.5.4.1(Limits of operation of under-current relays)	-	5000	-
8.2.1.5.4.2(Limits of operation of automatic change over by under-current relays)	-	5000	-
9.2.3(Ageing test for screwless-type clamping unit)	-	10000	-
9.3.3.2(Operating limits)	-	5000	-
9.3.6.2(Operation and operating limits)	-	20000	-
F.7.2(Tests on products in a new condition)	-	20000	-
F.7.3(Test after conventional operational performance)	-	20000	-
H.3(Limits of operation of control functions)	-	5000	-
H.4(Test of the control functions)	-	15000	-
8.3(Electromagnetic compatibility (EMC))	-	20000	NOT IN NABL SCOPE
8.3.2(Immunity)	-	20000	NOT IN NABL SCOPE
9.2.4(Limited energy source test)	-	5000	-
9.2.5(Breakdown of components)	-	5000	-
9.2.5.2(Breakdown of components test)	-	5000	-
9.4.2(Immunity)	-	20000	NOT IN NABL SCOPE
9.4.2.2(Electrostatic discharge)	-	20000	NOT IN NABL SCOPE
9.4.2.3(Radiated radio-frequency electromagnetic field)	-	20000	NOT IN NABL SCOPE
9.4.2.5(Electrical fast transient/bursts)	-	20000	NOT IN NABL SCOPE
9.4.2.6(Surges)	-	20000	NOT IN NABL SCOPE
9.4.2.7(Power frequency magnetic field)	-	20000	NOT IN NABL SCOPE
9.4.2.8(Voltage dips and short-time interruptions)	-	20000	NOT IN NABL SCOPE
9.4.2.9(Harmonics in the supply)	-	20000	NOT IN NABL SCOPE
M.8.3(Electromagnetic compatibility (EMC))	-	20000	NOT IN NABL SCOPE
N.3.2(Touch current measurement)	-	5000	-
8.2.4.7(Ability of a MPSD to make and break under short-circuit conditions)	-	45000	-
8.2.5.3(Co-ordination test between AC-3e rated starter and associated SCPD)	-	45000	-
8.2.5.4(Co-ordination between a MPSD and another short-circuit protective device)	-	45000	-
9.3.4.2.2(prospective current)	-	1000	-

11 Apr, 2027

-
Included w.e.f. 17.09.2024 Exclusion: Cl.9.4.3 (Emission), Cl.8.3.3 (Emission), Cl.9.4.2.4 (Conducted disturbances induced by radio-frequency fields)

IS/IEC 60947 : PART 3 (2020)

Low-Voltage Switchgear and Controlgear: Part 3 Switches Disconnectors Switch-Disconnectors and Fuse-Combination Units

2189000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
3.1(General)	-	0	No Test
4(Classification)	-	0	No Test
5.3.2(Rated voltages)	-	2000	No Test
5.3.2.1(Rated operational voltage)	-	2000	No Test
5.3.2.2(Rated insulation voltage)	-	2000	No Test
5.3.2.3(Rated impulse withstand voltage)	-	2000	No Test
5.3.3(Currents)	-	2000	No Test
5.3.3.2(Conventional free air thermal current)	-	2000	No Test
5.3.3.3(Conventional enclosed thermal current)	-	2000	No Test
5.3.3.4(Rated operational current (Ie) or rated operational power)	-	2000	No Test
5.3.3.5(Rated uninterrupted current)	-	2000	No Test
5.3.4(Rated frequency)	-	2000	No Test
5.3.5(Rated duty)	-	2000	No Test
5.3.5.2(Eight-hour duty)	-	2000	No Test
5.3.5.3(Uninterrupted duty)	-	2000	No Test
5.3.6.1(Ability to withstand motor switching overload currents)	-	2000	No Test
5.3.6.2(Rated making capacity)	-	2000	No Test
5.3.6.3(Rated breaking capacity)	-	2000	No Test
5.3.7(Short-circuit characteristics)	-	2000	No Test
5.3.7.1(Rated short-time withstand current)	-	2000	No Test
5.3.7.2(Rated short-circuit making capacity)	-	2000	No Test
5.3.7.4(Rated conditional short-circuit current)	-	2000	No Test
5.4(Utilization category)	-	2000	No Test
5.5(Control circuits)	-	2000	No Test
5.6(Auxiliary circuits)	-	2000	No Test
5.7(Relays and releases)	-	2000	No Test
5.8(Co-ordination with short-circuit protective devices (SCPD))	-	2000	No Test
6.2.2(Marking)	-	1000	-
6.3(Instructions for installation, operation and maintenance, decommissioning and dismantling)	-	1000	-
7(Normal service, mounting and transport conditions)	-	10000	-
8.1.1(General)	-	20000	-
8.1.2.2(Glow wire testing)	-	20000	-
8.1.7.1(General)	-	5000	-
8.2.3(Dielectric properties)	-	25000	-
8.2.3.2(Impulse withstand voltage)	-	25000	-
8.2.3.3(Power-frequency or DC withstand voltage of the main, auxiliary and control circuits)	-	25000	-
8.2.7(Additional performance requirements for equipment suitable for isolation)	-	5000	-
9.1.3.3(Dielectric test)	-	25000	-
9.1.4(Sampling tests)	-	25000	-
9.2(Compliance with constructional requirements)	-	25000	-
9.3.4.3(Test of dielectric properties)	-	25000	-
9.3.4.5(Dielectric verification)	-	25000	-
9.3.4.6(Leakage current)	-	10000	-
8.3(Electromagnetic compatibility tests)	-	20000	NOT IN NABL SCOPE
9.5.4(Damp heat, salt mist, vibration and shock)	-	50000	-
D.7.1.1(Ambient air temperature)	-	1000	-
D.8.1.4(Clearances and creepage distances)	-	5000	-
D.8.1.12(Degrees of protection of enclosed equipment)	-	30000	-
D.9.3.11(Climatic test)	-	50000	-
E.9.3.1(Flexion test)	-	25000	-
E.9.3.2(Pull-out test)	-	25000	-
8.1.7.2(Additional constructional requirements)	-	5000	-
8.1.9(Additional requirements for equipment provided with a neutral pol)	-	1000	-
8.2.5(Ability to make, break or withstand short-circuit currents)	-	45000	-
8.2.8(Critical load current performance: DC equipment)	-	45000	-
8.2.9(Overload requirements for equipment incorporating fuses)	-	45000	-
9.3.3.6(DC test current ripple)	-	45000	-
9.3.6.2(Short-time withstand current test)	-	45000	-
9.3.6.3(Short-circuit making capacity test)	-	45000	-
9.3.7.2(Circuit-breaker protected short-circuit withstand)	-	45000	-
9.3.7.3(Fuse protected short-circuit withstand)	-	45000	-
9.3.9.2(Determination of critical load current)	-	45000	-
8.2.1(Operating conditions)	-	45000	-
8.2.1.1(General)	-	5000	-
8.2.1.2(Limits of operation of power operated equipment)	-	5000	-
8.2.1.3(Limits of operation of under-voltage relays and releases)	-	5000	-
8.2.1.4(Limits of operation of shunt releases)	-	5000	-
8.2.4(Ability to make and break under no-load, normal load and overload conditions)	-	30000	-
8.2.4.1(Making and breaking capacities)	-	30000	-
8.2.4.2(Operational performance)	-	70000	-
8.2.4.3(Mechanical durability)	-	90000	-
8.2.4.4(Electrical durability)	-	140000	-
9.1.3.2(Mechanical operation test)	-	50000	-
9.1.3.2(Mechanical operation test)	-	50000	-
9.1.5Special tests(Special tests)	-	140000	-
9.3.4.4(Making and breaking capacities)	-	40000	-
9.3.4.4.3(Characteristics of transient recovery voltage)	-	20000	-
9.3.5.2(Operational performance test)	-	140000	-
9.3.8.2(Overload test)	-	50000	-
9.5.2(Mechanical durability)	-	90000	-
9.5.3(Electrical durability)	-	140000	-
8.2.2(Temperature-rise)	-	15000	-
9.3.4.2(Temperature-rise)	-	15000	-
D.9.3.10(Thermal cycling test)	-	25000	-
D.9.3.12(Temperature-rise verification with solar effects – Outdoor units only)	-	15000	-
E.9.2(Current cycling test)	-	20000	-
E.9.2.4(Temperature measurements)	-	15000	-
3.1(General)	-	0	No test
4(Classification)	-	0	No test
5.3.2(Rated voltages)	-	2000	-
5.3.2.1(Rated operational voltage)	-	2000	-
5.3.2.2(Rated insulation voltage)	-	2000	-
5.3.2.3(Rated impulse withstand voltage)	-	2000	-
5.3.3(Currents)	-	2000	-
5.3.3.2(Conventional free air thermal current)	-	2000	-
5.3.3.3(Conventional enclosed thermal current)	-	2000	-
5.3.3.4(Rated operational current (Ie) or rated operational power)	-	2000	-
5.3.3.5(Rated uninterrupted current)	-	1999.99	-
5.3.4(Rated frequency)	-	1999.99	-
5.3.5(Rated duty)	-	2000	-
5.3.5.2(Eight-hour duty)	-	2000	-
5.3.5.3(Uninterrupted duty)	-	2000	-
5.3.6.1(Ability to withstand motor switching overload currents)	-	2000	-
5.3.6.2(Rated making capacity)	-	2000	-
5.3.6.3(Rated breaking capacity)	-	2000	-
5.3.7(Short-circuit characteristics)	-	2000	-
5.3.7.1(Rated short-time withstand current)	-	2000	-
5.3.7.2(Rated short-circuit making capacity)	-	2000	-
5.3.7.4(Rated conditional short-circuit current)	-	2000	-
5.4(Utilization category)	-	2000	-
5.5(Control circuits)	-	2000	-
5.6(Auxiliary circuits)	-	2000	-
5.7(Relays and releases)	-	2000	-
5.8(Co-ordination with short-circuit protective devices (SCPD))	-	2000	-
6.2.2(Marking)	-	1000	-
6.3(Instructions for installation, operation and maintenance, decommissioning and dismantling)	-	1000	-
7(Normal service, mounting and transport conditions)	-	10000	-
8.1.1(General)	-	20000	-
8.1.2.2(Glow wire testing)	-	20000	-
8.1.7.1(General)	-	5000	-
8.2.3(Dielectric properties)	-	25000	-
8.2.3.2(Impulse withstand voltage)	-	25000	-
8.2.3.3(Power-frequency or DC withstand voltage of the main, auxiliary and control circuits)	-	25000	-
8.2.7(Additional performance requirements for equipment suitable for isolation)	-	5000	-
9.1.3.3(Dielectric test)	-	25000	-
9.1.4(Sampling tests)	-	25000	-
9.2(Compliance with constructional requirements)	-	25000	-
9.3.4.3(Test of dielectric properties)	-	25000	-
9.3.4.5(Dielectric verification)	-	25000	-
9.3.4.6(Leakage current)	-	10000	-
8.3(Electromagnetic compatibility tests)	-	20000	-
9.5.4(Damp heat, salt mist, vibration and shock)	-	50000	-
D.7.1.1(Ambient air temperature)	-	1000	-
D.8.1.4(Clearances and creepage distances)	-	5000	-
D.8.1.12(Degrees of protection of enclosed equipment)	-	30000	-
D.9.3.11(Climatic test)	-	50000	-
E.9.3.1(Flexion test)	-	25000	-
E.9.3.2(Pull-out test)	-	25000	-
8.1.7.2(Additional constructional requirements)	-	5000	-
8.1.9(Additional requirements for equipment provided with a neutral pol)	-	1000	-
8.2.5(Ability to make, break or withstand short-circuit currents)	-	45000	-
8.2.8(Critical load current performance: DC equipment)	-	45000	-
8.2.9(Overload requirements for equipment incorporating fuses)	-	45000	-
9.3.3.6(DC test current ripple)	-	45000	-
9.3.6.2(Short-time withstand current test)	-	45000	-
9.3.6.3(Short-circuit making capacity test)	-	45000	-
9.3.7.2(Circuit-breaker protected short-circuit withstand)	-	45000	-
9.3.7.3(Fuse protected short-circuit withstand)	-	45000	-
9.3.9.2(Determination of critical load current)	-	45000	-
8.2.1(Operating conditions)	-	45000	-
8.2.1.1(General)	-	5000	-
8.2.1.2(Limits of operation of power operated equipment)	-	5000	-
8.2.1.3(Limits of operation of under-voltage relays and releases)	-	5000	-
8.2.1.4(Limits of operation of shunt releases)	-	5000	-
8.2.4(Ability to make and break under no-load, normal load and overload conditions)	-	30000	-
8.2.4.1(Making and breaking capacities)	-	30000	-
8.2.4.2(Operational performance)	-	70000	-
8.2.4.3(Mechanical durability)	-	90000	-
8.2.4.4(Electrical durability)	-	140000	-
9.1.3.2(Mechanical operation test)	-	50000	-
9.1.3.2(Mechanical operation test)	-	5000	-
9.1.5Special tests(Special tests)	-	140000	-
9.3.4.4(Making and breaking capacities)	-	40000	-
9.3.4.4.3(Characteristics of transient recovery voltage)	-	20000	-
9.3.5.2(Operational performance test)	-	140000	-
9.3.8.2(Overload test)	-	50000	-
9.5.2(Mechanical durability)	-	90000	-
9.5.3(Electrical durability)	-	140000	-
8.2.2(Temperature-rise)	-	14999.99	-
9.3.4.2(Temperature-rise)	-	15000	-
D.9.3.10(Thermal cycling test)	-	25000	-
D.9.3.12(Temperature-rise verification with solar effects – Outdoor units only)	-	15000	-
E.9.2(Current cycling test)	-	20000	-
E.9.2.4(Temperature measurements)	-	15000	-
3.1(General)	-	2000	NO TEST
4(Classification)	-	2000	NO TEST
5.3.2(Rated voltages)	-	2000	NO TEST
5.3.2.1(Rated operational voltage)	-	2000	NO TEST
5.3.2.2(Rated insulation voltage)	-	2000	NO TEST
5.3.2.3(Rated impulse withstand voltage)	-	2000	NO TEST
5.3.3(Currents)	-	2000	NO TEST
5.3.3.2(Conventional free air thermal current)	-	2000	NO TEST
5.3.3.3(Conventional enclosed thermal current)	-	2000	NO TEST
5.3.3.4(Rated operational current (Ie) or rated operational power)	-	2000	NO TEST
5.3.3.5(Rated uninterrupted current)	-	2000	NO TEST
5.3.4(Rated frequency)	-	2000	NO TEST
5.3.5(Rated duty)	-	2000	NO TEST
5.3.5.2(Eight-hour duty)	-	2000	NO TEST
5.3.5.3(Uninterrupted duty)	-	2000	NO TEST
5.3.6.1(Ability to withstand motor switching overload currents)	-	2000	NO TEST
5.3.6.2(Rated making capacity)	-	2000	NO TEST
5.3.6.3(Rated breaking capacity)	-	2000	NO TEST
5.3.7(Short-circuit characteristics)	-	2000	NO TEST
5.3.7.1(Rated short-time withstand current)	-	2000	NO TEST
5.3.7.2(Rated short-circuit making capacity)	-	2000	NO TEST
5.3.7.4(Rated conditional short-circuit current)	-	2000	NO TEST
5.4(Utilization category)	-	2000	NO TEST
5.5(Control circuits)	-	2000	NO TEST
5.6(Auxiliary circuits)	-	2000	N0 TEST
5.7(Relays and releases)	-	2000	NO TEST
5.8(Co-ordination with short-circuit protective devices (SCPD))	-	2000	NO TEST
6.2.2(Marking)	-	1000	-
6.3(Instructions for installation, operation and maintenance, decommissioning and dismantling)	-	1000	-
7(Normal service, mounting and transport conditions)	-	10000	-
8.1.1(General)	-	20000	-
8.1.2.2(Glow wire testing)	-	20000	-
8.1.7.1(General)	-	5000	-
8.2.3(Dielectric properties)	-	25000	-
8.2.3.2(Impulse withstand voltage)	-	25000	-
8.2.3.3(Power-frequency or DC withstand voltage of the main, auxiliary and control circuits)	-	25000	-
8.2.7(Additional performance requirements for equipment suitable for isolation)	-	5000	-
9.1.3.3(Dielectric test)	-	25000	-
9.1.4(Sampling tests)	-	25000	-
9.2(Compliance with constructional requirements)	-	25000	-
9.3.4.3(Test of dielectric properties)	-	25000	-
9.3.4.5(Dielectric verification)	-	25000	-
9.3.4.6(Leakage current)	-	10000	-
8.3(Electromagnetic compatibility tests)	-	20000	NOT IN NABL SCOPE
9.5.4(Damp heat, salt mist, vibration and shock)	-	50000	-
D.7.1.1(Ambient air temperature)	-	50000	-
D.8.1.4(Clearances and creepage distances)	-	5000	-
D.8.1.12(Degrees of protection of enclosed equipment)	-	30000	-
D.9.3.11(Climatic test)	-	50000	-
E.9.3.1(Flexion test)	-	25000	-
E.9.3.2(Pull-out test)	-	25000	-
8.1.7.2(Additional constructional requirements)	-	5000	-
8.1.9(Additional requirements for equipment provided with a neutral pol)	-	1000	-
8.2.5(Ability to make, break or withstand short-circuit currents)	-	30000	-
8.2.8(Critical load current performance: DC equipment)	-	45000	-
8.2.9(Overload requirements for equipment incorporating fuses)	-	45000	-
9.3.3.6(DC test current ripple)	-	45000	-
9.3.6.2(Short-time withstand current test)	-	45000	-
9.3.6.3(Short-circuit making capacity test)	-	45000	-
9.3.7.2(Circuit-breaker protected short-circuit withstand)	-	45000	-
9.3.7.3(Fuse protected short-circuit withstand)	-	45000	-
9.3.9.2(Determination of critical load current)	-	45000	-
8.2.1(Operating conditions)	-	45000	-
8.2.1.1(General)	-	5000	-
8.2.1.2(Limits of operation of power operated equipment)	-	5000	-
8.2.1.3(Limits of operation of under-voltage relays and releases)	-	5000	-
8.2.1.4(Limits of operation of shunt releases)	-	5000	-
8.2.4(Ability to make and break under no-load, normal load and overload conditions)	-	30000	-
8.2.4.1(Making and breaking capacities)	-	30000	-
8.2.4.2(Operational performance)	-	70000	-
8.2.4.3(Mechanical durability)	-	90000	-
8.2.4.4(Electrical durability)	-	140000	-
9.1.3.2(Mechanical operation test)	-	50000	-
9.1.3.2(Mechanical operation test)	-	50000	-
9.1.5Special tests(Special tests)	-	140000	-
9.3.4.4(Making and breaking capacities)	-	40000	-
9.3.4.4.3(Characteristics of transient recovery voltage)	-	20000	-
9.3.5.2(Operational performance test)	-	140000	-
9.3.8.2(Overload test)	-	50000	-
9.5.2(Mechanical durability)	-	90000	-
9.5.3(Electrical durability)	-	140000	-
8.2.2(Temperature-rise)	-	15000	-
9.3.4.2(Temperature-rise)	-	15000	-
D.9.3.10(Thermal cycling test)	-	15000	-
D.9.3.12(Temperature-rise verification with solar effects – Outdoor units only)	-	15000	-
E.9.2(Current cycling test)	-	20000	-
E.9.2.4(Temperature measurements)	-	15000	-
3.1(General)	-	2000	NO TEST
4(Classification)	-	2000	NO TEST
5.3.2(Rated voltages)	-	2000	NO TEST
5.3.2.1(Rated operational voltage)	-	2000	NO TEST
5.3.2.2(Rated insulation voltage)	-	2000	NO TEST
5.3.2.3(Rated impulse withstand voltage)	-	2000	NO TEST
5.3.3(Currents)	-	2000	NO TEST
5.3.3.2(Conventional free air thermal current)	-	2000	NO TEST
5.3.3.3(Conventional enclosed thermal current)	-	2000	NO TEST
5.3.3.4(Rated operational current (Ie) or rated operational power)	-	2000	NO TEST
5.3.3.5(Rated uninterrupted current)	-	2000	NO TEST
5.3.4(Rated frequency)	-	2000	NO TEST
5.3.5(Rated duty)	-	2000	NO TEST
5.3.5.2(Eight-hour duty)	-	2000	NO TEST
5.3.5.3(Uninterrupted duty)	-	2000	NO TEST
5.3.6.1(Ability to withstand motor switching overload currents)	-	2000	NO TEST
5.3.6.2(Rated making capacity)	-	2000	NO TEST
5.3.6.3(Rated breaking capacity)	-	2000	NO TEST
5.3.7(Short-circuit characteristics)	-	2000	NO TEST
5.3.7.1(Rated short-time withstand current)	-	2000	NO TEST
5.3.7.2(Rated short-circuit making capacity)	-	2000	NO TEST
5.3.7.4(Rated conditional short-circuit current)	-	2000	NO TEST
5.4(Utilization category)	-	2000	NO TEST
5.5(Control circuits)	-	2000	NO TEST
5.6(Auxiliary circuits)	-	2000	NO TEST
5.7(Relays and releases)	-	2000	NO TEST
5.8(Co-ordination with short-circuit protective devices (SCPD))	-	2000	NO TEST
6.2.2(Marking)	-	1000	-
6.3(Instructions for installation, operation and maintenance, decommissioning and dismantling)	-	1000	-
7(Normal service, mounting and transport conditions)	-	10000	-
8.1.1(General)	-	20000	-
8.1.2.2(Glow wire testing)	-	20000	-
8.1.7.1(General)	-	5000	-
8.2.3(Dielectric properties)	-	25000	-
8.2.3.2(Impulse withstand voltage)	-	25000	-
8.2.3.3(Power-frequency or DC withstand voltage of the main, auxiliary and control circuits)	-	25000	-
8.2.7(Additional performance requirements for equipment suitable for isolation)	-	5000	-
9.1.3.3(Dielectric test)	-	25000	-
9.1.4(Sampling tests)	-	25000	-
9.2(Compliance with constructional requirements)	-	25000	-
9.3.4.3(Test of dielectric properties)	-	25000	-
9.3.4.5(Dielectric verification)	-	25000	-
9.3.4.6(Leakage current)	-	10000	-
8.3(Electromagnetic compatibility tests)	-	20000	NOT IN NABL SCOPE
9.5.4(Damp heat, salt mist, vibration and shock)	-	50000	-
D.7.1.1(Ambient air temperature)	-	1000	-
D.8.1.4(Clearances and creepage distances)	-	5000	-
D.8.1.12(Degrees of protection of enclosed equipment)	-	30000	-
D.9.3.11(Climatic test)	-	50000	-
E.9.3.1(Flexion test)	-	25000	-
E.9.3.2(Pull-out test)	-	25000	-
8.1.7.2(Additional constructional requirements)	-	5000	-
8.1.9(Additional requirements for equipment provided with a neutral pol)	-	1000	-
8.2.5(Ability to make, break or withstand short-circuit currents)	-	45000	-
8.2.8(Critical load current performance: DC equipment)	-	45000	-
8.2.9(Overload requirements for equipment incorporating fuses)	-	45000	-
9.3.3.6(DC test current ripple)	-	45000	-
9.3.6.2(Short-time withstand current test)	-	45000	-
9.3.6.3(Short-circuit making capacity test)	-	45000	-
9.3.7.2(Circuit-breaker protected short-circuit withstand)	-	45000	-
9.3.7.3(Fuse protected short-circuit withstand)	-	45000	-
9.3.9.2(Determination of critical load current)	-	45000	-
8.2.1(Operating conditions)	-	45000	-
8.2.1.1(General)	-	5000	-
8.2.1.2(Limits of operation of power operated equipment)	-	5000	-
8.2.1.3(Limits of operation of under-voltage relays and releases)	-	5000	-
8.2.1.4(Limits of operation of shunt releases)	-	5000	-
8.2.4(Ability to make and break under no-load, normal load and overload conditions)	-	30000	-
8.2.4.1(Making and breaking capacities)	-	30000	-
8.2.4.2(Operational performance)	-	70000	-
8.2.4.3(Mechanical durability)	-	90000	-
8.2.4.4(Electrical durability)	-	140000	-
9.1.3.2(Mechanical operation test)	-	50000	-
9.1.3.2(Mechanical operation test)	-	50000	-
9.1.5Special tests(Special tests)	-	140000	-
9.3.4.4(Making and breaking capacities)	-	50000	-
9.3.4.4.3(Characteristics of transient recovery voltage)	-	20000	-
9.3.5.2(Operational performance test)	-	140000	-
9.3.8.2(Overload test)	-	50000	-
9.5.2(Mechanical durability)	-	90000	-
9.5.3(Electrical durability)	-	140000	-
8.2.2(Temperature-rise)	-	15000	-
9.3.4.2(Temperature-rise)	-	15000	-
D.9.3.10(Thermal cycling test)	-	25000	-
D.9.3.12(Temperature-rise verification with solar effects – Outdoor units only)	-	15000	-
E.9.2(Current cycling test)	-	20000	-
E.9.2.4(Temperature measurements)	-	15000	-

11 Apr, 2027

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Included w.e.f. 17.09.2024

IS/IEC 60947 : Part 2 (2016)

Low - Voltage switchgear and controlgear: Part 2 circuit - Breakers (First Revision)

642700 View breakup
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Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
8.3.3.4(Mechanical operation and operational performance capability)	-	112000	Cost per sample
8.3.3.5(Overload performance)	-	21300	Cost per sample
8.3.4.3(Verification of operational performance capability)	-	21000	Cost per sample
8.3.8.5(Verification of operational performance capability)	-	21000	Cost per sample
8.4.2(Mechanical operation tests)	-	3500	Cost per sample
8.3.4.1(General)	-	5000	Cost per sample
8.3.4.2(Test of service short circuit breaking capacity)	-	39000	Cost per sample considering half shift upto 50 kA
8.3.5.1(General)	-	5000	Cost per sample
8.3.5.3(Rated ultimate short-circuit breaking capacity)	-	39000	Cost per sample considering half shift upto 50 kA
8.3.6.1(General)	-	5000	cost per sample
8.3.6.3(Rated short-time withstand current)	-	39000	Cost per sample considering half shift upto 50 kA
8.3.6.5(Short-circuit breaking capacity at maximum short-time withstand current)	-	39000	Cost per sample considering half shift upto 50 kA
8.3.7.1(General)	-	5000	cost per sample
8.3.7.2(Short-circuit at the selectivity limit current)	-	39000	Cost per sample considering half shift upto 50 kA
8.3.7.6(Short-circuit at 1,1 times take-over current)	-	39000	Cost per sample considering half shift upto 50 kA
8.3.7.7(Short-circuit at ultimate short-circuit breaking capacity)	-	39000	Cost per sample considering half shift upto 50 kA
8.3.8.1(General)	-	5000	Cost per sample
8.3.8.3(Rated short-time withstand current)	-	39000	Cost per sample considering half shift upto 50 kA
8.3.8.4(Rated service short-circuit breaking capacity*)	-	39000	Cost per sample considering half shift upto 50 kA
8.3.4.2(rated short circuit breaking capacity (sequence II))	-	39000	Cost per sample considering half shift upto 50 kA
8.3.5.1(General)	-	5000	Cost per sample
8.3.5.3(rated short circuit breaking capacity (sequence III))	-	39000	Cost per sample considering half shift upto 50 kA
8.3.6.1(General)	-	5000	Cost per sample
8.3.6.3(rated short circuit withstand current (sequence IV))	-	39000	Cost per sample considering half shift upto 50 kA
8.3.6.5(short circuit breaking capacity at maximum short time withstand current (sequence IV))	-	39000	Cost per sample considering half shift upto 50 kA
8.3.7.1(General)	-	5000	Cost per sample
8.3.7.2((stage 1) short circuit at the selectivity limit current (sequence V))	-	39000	Cost per sample considering half shift upto 50 kA
8.3.7.6((stage 2) short circuit at 1.1 time the take-over current (sequence V))	-	39000	Cost per sample considering half shift upto 50 kA
8.3.7.7((stage 2) short circuit at rated ultimate short circuit breaking capacity (sequence V))	-	39000	Cost per sample considering half shift upto 50 kA
8.3.8.1(General)	-	5000	Cost per sample
8.3.8.3(rated short time withstand current (sequence VI))	-	39000	Cost per sample considering half shift upto 50 kA
8.3.8.4(rated service short circuit breaking capacity (sequence VI))	-	39000	Cost per sample considering half shift upto 50 kA
C.2(individual pole short circuit breaking capacity (Isu))	-	39000	Cost per sample considering half shift upto 50 kA
H.2(individual pole short circuit (IIT))	-	39000	Cost per sample considering half shift upto 50 kA
8.3.9(Critical d.c. load current test)	-	25000	Cost per sample
8.3.3.2(Tripping limits and characteristics)	-	82000	Cost per sample
8.3.3.7(Verification of temperature-rise)	-	26700	Cost per sample up to 1000A
8.3.3.8(Verification of Overload releases)	-	5900	Cost per sample
8.4.3(Verification of the calibration of overcurrent releases)	-	11500	Cost per sample
8.3.4.5(Verifiation of temperature-rise)	-	26700	Cost per sample
8.3.6.4(Verification of temperature-rise)	-	26700	Cost per sample
8.3.7.3(Verification of temperature-rise)	-	26700	Cost per sample
8.3.8.7(Verification of temperature-rise)	-	26700	Cost per sample
8.3.4.6(Verification of Overload releases)	-	5900	Cost per sample
8.3.5.2(Verification of Overload releases)	-	5900	Cost per sample
8.3.5.5(Verification of Overload releases)	-	5900	Cost per sample
8.3.6.2(Verification of Overload releases)	-	5900	Cost per sample
8.3.6.7(Verification of Overload releases)	-	5900	Cost per sample
8.3.7.5(Verification of Overload releases)	-	5900	Cost per sample
8.3.7.9(Verification of Overload releases)	-	5900	Cost per sample
8.3.8.2(Verification of Overload releases)	-	5900	Cost per sample
8.3.8.8(Verification of Overload releases)	-	10000	-
8.3.4.5(verification of temperature-rise (sequence II))	-	26700	Cost per sample
8.3.4.6(verification of overload releases (sequence II))	-	5900	Cost per sample
8.3.5.2(verification of overload releases (sequence III))	-	5900	Cost per sample
8.3.5.5(verification of overload releases (sequence III))	-	5900	Cost per sample
8.3.6.2(verification of overload releases (sequence IV))	-	5900	Cost per sample
8.3.6.4(verification of temperature-rise (sequence IV))	-	26700	Cost per sample
8.3.6.7(verification of overload releases (sequence IV))	-	5900	Cost per sample
8.3.7.3((stage 1) verification of temperature-rise (sequence V))	-	26700	Cost per sample
8.3.7.5((stage 2) verification of overload releases (sequence V))	-	10000	-
8.3.7.9((stage 2) verification of overload releases (sequence V))	-	5900	Cost per sample
8.3.8.2(verification of overload releases (sequence VI))	-	5900	Cost per sample
8.3.8.7(verification of temperature-rise (sequence VI))	-	26700	Cost per sample
8.3.8.8(verification of overload releases (sequence VI))	-	5900	Cost per sample
C.4(verification of overload releases)	-	5900	Cost per sample
H.4(verification of overload releases)	-	5900	Cost per sample
8.3.3.3(Test of dielectric properties)	-	35300	Cost per sample
8.3.3.6(Verification of dielectric withstand)	-	11200	Cost per sample
8.3.3.10(Verification of main contact position)	-	7300	Cost per sample
8.4.6(Dielectric tests)	-	11200	Cost per sample
8.4.7(Test for the verifiacation of clearances less than those corresponding to case A of Table 13 of IEC 60947-1:2007)	-	5300	Cost per sample
8.3.4.4(Verification of dielectric withstand)	-	11200	Cost per sample
8.3.5.4(Verification of dielectric withstand)	-	11200	Cost per sample
8.3.6.6(Verification of dielectric withstand)	-	11200	Cost per sample
8.3.7.4(Verification of dielectric withstand)	-	11200	Cost per sample
8.3.7.8(Verification of dielectric withstand)	-	11200	Cost per sample
8.3.8.6(Verification of dielectric withstand)	-	11200	Cost per sample
B.8.3(Dielectric Properties)	-	35300	Cost per sample
B.8.4(Operation of the test device at the limits of rated voltage)	-	7000	Cost per sample
8.3.4.4(verification of dielectric withstand (sequnce II))	-	11200	Cost per sample
8.3.5.4(verification of dielectric withstand (sequnce III))	-	11200	Cost per sample
8.3.6.6(verification of dielectric withstand (sequence IV))	-	11200	Cost per sample
8.3.7.4((stage 1) verification of dielectric withstand (sequence V))	-	11200	Cost per sample
8.3.7.8((stage 2) verification of dielectric withstand (sequence V))	-	10000	-
8.3.8.6(verification of dielectric withstand (sequence VI))	-	11200	Cost per sample
C.3(verification of dielectric withstand)	-	11200	Cost per sample
H.3(verification of dielectric withstand)	-	11200	Cost per sample
8.3.8.5(verification of operational performance capability (sequence VI))	-	10000	-
8.4.5(Additional tests for CBRs)	-	18200	Cost per sample
B.8.2(Operating characteristics)	-	10000	Cost per sampleCost per sample
B.8.5(Limiting value of the non-operating current under over-current conditions)	-	10000	Cost per sample
8.3.3.9(Verification of undervoltage and shunt releases)	-	5900	Cost per sample
8.4.4(Verification of the operation of undervoltage and shunt releases)	-	5900	Cost per sample
8.3.4.3(verification of operational performance capability (sequence II))	-	21000	Cost per sample
B.8.6(Resistance against unwanted tripping due to surge currents resulting from impulse voltage)	-	5900	Cost per sample
B.8.7(Behavior in the case of an earth fault current comprising a d.c. component)	-	10000	Cost per sample
B.8.8(Behavior in the case of failure of line voltage for CBRs classified under B.3.1.2.1)	-	10000	Cost per sample
B.8.9(Behavior in the case of failure of line voltage for CBRs classified under B.3.1.2.2)	-	10000	Cost per sample
8.3.4.1(General)	-	5000	Cost per sample

11 Apr, 2027

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Exclusion: Cl.7.3 Annexure J Table J.1 (Electrostatic discharges, Radiated radio-frequency electromagnetic fields, Electrical fast transients/bursts, Radiated radio-frequency electromagnetic fields, Surges, Conducted disturbances induced by radio frequency fields, Power frequency magnetic fields, Voltage dips and interruptions), Cl.7.3 Annexure J Table J.3 (Conducted RF disturbances 150 kHz to 30 MHz, Radiated RF disturbances 30 MHz to 1 000 MHz)

Bureau of Indian Standards

The National Standards Body of India

Lauritz Knudsen Switchgear Testing Laboratories, MSW, SEIPL, Mumbai

SCHNEIDER ELECTRIC INDIA PRIVATE LIMITED, PLOT NO. - A600, TTC INDUSTRIAL AREA, MIDC, SHIL-PHATA ROAD, MAHAPE, MAHARASHTRA – 400710., Mumbai, Mumbai Suburban, Maharashtra, 400710

9769979737 somnath.borate@lntebg.com

Scope List