| 8.3.3.2(Tripping limits and characteristics) |
- |
77400 |
|
Sample cost of 1x sample |
| 8.3.8.8(verification of overload releases (sequence VI)) |
- |
3440 |
|
Sample cost of 1x sample |
| 8.3.3.3(Test of dielectric properties) |
- |
32256 |
|
Sample cost of 1x sample |
| 8.3.8.7(verification of temperature-rise (sequence VI)) |
- |
25840 |
|
Sample cost of 1x sample upto 2500A with cable connections including overload release verification post temperature verification in same clause |
| 8.3.8.6(verification of dielectric withstand (sequence VI)) |
- |
8640 |
|
Sample cost of 1x sample |
| 8.3.8.5(verification of operational performance capability (sequence VI)) |
- |
16328 |
|
Estimated cost of 1x sample as vary based on ratings |
| 8.3.8.4(rated service short circuit breaking capacity (sequence VI)) |
- |
33800 |
|
Estimated cost of 1x sample considering half shift |
| 8.3.8.2(verification of overload releases (sequence VI)) |
- |
3440 |
|
Sample cost of 1x sample |
| 8.3.3.4(Mechanical operation and operational performance capability) |
- |
95618 |
|
Estimated cost of 1x sample |
| 8.3.3.5(Overload performance) |
- |
16328 |
|
Estimated cost of 1x sample |
| 8.3.3.6(Verification of dielectric withstand) |
- |
8640 |
|
Estimated cost of 1x sample |
| 8.3.5.5(verification of overload releases (sequence III)) |
- |
3440 |
|
Estimated cost of 1x sample |
| 8.3.5.4(verification of dielectric withstand (sequnce III)) |
- |
8640 |
|
Estimated cost of 1x sample |
| 8.3.5.3(rated short circuit breaking capacity (sequence III)) |
- |
33800 |
|
Estimated cost of 1x sample considering half shift |
| 8.3.5.2(verification of overload releases (sequence III)) |
- |
3440 |
|
Estimated cost of 1x sample |
| 8.3.4.6(verification of overload releases (sequence II)) |
- |
3440 |
|
Estimated cost of 1x sample |
| 8.3.4.5(verification of temperature-rise (sequence II)) |
- |
22400 |
|
Sample cost of 1x sample upto 2500A with cable connections |
| 8.3.4.4(verification of dielectric withstand (sequnce II)) |
- |
8640 |
|
Estimated cost of 1x sample |
| 8.3.4.3(verification of operational performance capability (sequence II)) |
- |
16328 |
|
Estimated cost of 1x sample |
| 8.3.4.2(rated short circuit breaking capacity (sequence II)) |
- |
33800 |
|
Estimated cost of 1x sample considering half shift |
| 8.3.3.7(Verification of temperature-rise) |
- |
22400 |
|
Estimated cost of 1x sample upto 2500A with copper cables |
| 8.3.3.8(Verification of Overload releases) |
- |
3440 |
|
Estimated cost of 1x sample |
| 8.3.3.9(Verification of undervoltage and shunt releases) |
- |
6720 |
|
Estimated cost of 1x sample |
| 8.3.3.10(Verification of main contact position) |
- |
6720 |
|
Estimated cost of 1x sample |
| 8.4.2(Mechanical operation tests) |
- |
3500 |
|
Estimated cost of 1x sample |
| 8.4.3(Verification of the calibration of overcurrent releases) |
- |
11500 |
|
Estimated cost of 1x sample |
| 8.4.4(Verification of the operation of undervoltage and shunt releases) |
- |
3500 |
|
Estimated cost of 1x sample |
| 8.4.5(Additional tests for CBRs) |
- |
11500 |
|
Estimated cost of 1x sample |
| 8.4.6(Dielectric tests) |
- |
8640 |
|
Estimated cost of 1x sample |
| 8.4.7(Test for the verifiacation of clearances less than those corresponding to case A of Table 13 of IEC 60947-1:2007) |
- |
3500 |
|
Estimated cost of 1x sample |
