BIS - LIMS (Laboratory Information Management System)

Novateur Electrical and Digital Systems Pvt Ltd ,Sinnar ,Nasik

A-2, MIDC Malegaon, Sinnar, Nashik, Nashik, Maharashtra, 422113

8657926870 nedspl.lab@legrand.com

Scope List

Reset

4 Results

S.No.

Indian Standard No.

Product

Grade / Type / Size / Designation etc.

Exclusion

Testing Charges (Excl. Of Taxes)

Facility Type

Effective Date

Validity Date

Remark

IS/IEC 60947 : Part 5 : Sec 1 (2016)

Low-Voltage Switchgear And Control Gear : Part 5-1 Control Circuit Devices And Switching Elements Electromechanical Control Circuit Devices

251000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
7.1.2.2(Glow-wire testing)	-	5000	-
7.1.4(Clearances and creepage distances)	-	10000	-
7.2.3(Dielectric properties)	-	20000	-
8.2.1.1.1(Glow-wire test)	-	5000	-
8.2.5(Verification of actuating force (or moment))	-	5000	-
8.3.3.3(Temperature rise)	-	10000	-
8.3.3.4(Dielectric properties)	-	20000	-
8.3.4.2(Performance under conditional short-circuit current : Test procedure)	-	25000	-
F 8.1.2.6("Dielectric test after stresses")	-	14000	-
F.8.1.2.1(Dielectric tests in new conditions)	-	20000	-
K 8.3.4("Performance under conditional shortcircuit current")	-	25000	-
J.8.3.3.3(Temp-rise tests)	-	0	Testing facility not available already mentioned in application.
J.8.3.3.4(Dielectric test)	-	0	Testing facility not available already mentioned in application.
J.8.3.3.4.3("Dielectric test (indicator lights with built-in transformers)")	-	0	Testing facility not available already mentioned in application.
J.8.3.3.4(Dielectric test)	-	0	Testing facility not available already mentioned in application.
J.8.3.3.4.3("Dielectric test (indicator lights with built-in transformers)")	-	0	Testing facility not available already mentioned in application.
J.8.3.3.3(Temp-rise tests)	-	0	Testing facility not available already mentioned in application.
7.1.2.2(Glow-wire testing)	-	5000	-
7.1.4(Clearances and creepage distances)	-	10000	-
F.8.1.2.1(Dielectric tests in new conditions)	-	20000	-
F 8.1.2.6("Dielectric test after stresses")	-	14000	-
8.3.4.2(Performance under conditional short-circuit current : Test procedure)	-	25000	-
7.2.3(Dielectric properties)	-	20000	-
8.3.3.4(Dielectric properties)	-	20000	-
8.3.3.3(Temperature rise)	-	10000	-
8.2.1.1.1(Glow-wire test)	-	5000	-
K 8.3.4("Performance under conditional shortcircuit current")	-	25000	-
8.2.6(Verification of limitation of rotation (of a rotary switch))	-	5000	-
8.2.6(Verification of limitation of rotation (of a rotary switch))	-	5000	-
8.3.4(Performance under Conditional Short-Circuit Current)	-	25000	-
8.3.3.5.6 b(Dielectric verification)	-	14000	-
7.1.2.2(Glow-wire testing)	-	5000	-
7.1.4(Clearances and creepage distances)	-	10000	-
7.2.3(Dielectric properties)	-	20000	-
8.2.1.1.1(Glow-wire test)	-	5000	-
8.2.5(Verification of actuating force (or moment))	-	5000	-
8.3.3.3(Temperature rise)	-	10000	-
8.3.3.4(Dielectric properties)	-	20000	-
8.3.4.2(Performance under conditional short-circuit current : Test procedure)	-	25000	-
F 8.1.2.6("Dielectric test after stresses")	-	14000	-
F.8.1.2.1(Dielectric tests in new conditions)	-	20000	-
K 8.3.4("Performance under conditional shortcircuit current")	-	25000	-
7.1.2.2(Glow-wire testing)	-	5000	-
7.1.4(Clearances and creepage distances)	-	10000	-
F.8.1.2.1(Dielectric tests in new conditions)	-	20000	-
F 8.1.2.6("Dielectric test after stresses")	-	14000	-
8.3.4.2(Performance under conditional short-circuit current : Test procedure)	-	25000	-
7.2.3(Dielectric properties)	-	20000	-
8.3.3.4(Dielectric properties)	-	20000	-
8.3.3.3(Temperature rise)	-	10000	-
8.2.1.1.1(Glow-wire test)	-	5000	-
K 8.3.4("Performance under conditional shortcircuit current")	-	25000	-
8.2.6(Verification of limitation of rotation (of a rotary switch))	-	5000	-
8.2.6(Verification of limitation of rotation (of a rotary switch))	-	5000	-
8.3.4(Performance under Conditional Short-Circuit Current)	-	25000	-
8.3.3.5.6 b(Dielectric verification)	-	14000	-

Complete

29 Feb, 2024

21 Feb, 2027

-
Included .w.e.f.11.02.2025 Capacity: Short Circuit Test: 63A to 50kA @415V Temperature rise test: Upto 4000A Electrical Endurance test: Upto 2500A @ 415V Mechanical Endurance test HV (Upto 15kV AC/DC) Leakage Current (Upto 300mA) Impulse (Upto 20kVp) Glow-wire test (on equipment) only for sequence IV & VI

IS/IEC 60947 : PART 3 (2020)

Low-Voltage Switchgear and Controlgear: Part 3 Switches Disconnectors Switch-Disconnectors and Fuse-Combination Units

1450000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
3.1(General)	-	20000	-
4(Classification)	-	20000	-
5.3.2(Rated voltages)	-	20000	-
5.3.2.1(Rated operational voltage)	-	20000	-
5.3.2.2(Rated insulation voltage)	-	20000	-
5.3.2.3(Rated impulse withstand voltage)	-	20000	-
5.3.3(Currents)	-	20000	-
5.3.3.2(Conventional free air thermal current)	-	20000	-
5.3.3.3(Conventional enclosed thermal current)	-	20000	-
5.3.3.4(Rated operational current (Ie) or rated operational power)	-	20000	-
5.3.3.5(Rated uninterrupted current)	-	50000	-
5.3.4(Rated frequency)	-	20000	-
5.3.5(Rated duty)	-	50000	-
5.3.5.2(Eight-hour duty)	-	50000	-
5.3.5.3(Uninterrupted duty)	-	50000	-
5.3.6.1(Ability to withstand motor switching overload currents)	-	20000	-
5.3.6.2(Rated making capacity)	-	100000	-
5.3.6.3(Rated breaking capacity)	-	100000	-
5.3.7(Short-circuit characteristics)	-	100000	-
5.3.7.1(Rated short-time withstand current)	-	100000	-
5.3.7.2(Rated short-circuit making capacity)	-	100000	-
5.3.7.4(Rated conditional short-circuit current)	-	100000	-
5.4(Utilization category)	-	20000	-
5.5(Control circuits)	-	20000	-
5.6(Auxiliary circuits)	-	20000	-
5.7(Relays and releases)	-	20000	-
5.8(Co-ordination with short-circuit protective devices (SCPD))	-	20000	-
6.2.2(Marking)	-	50000	-
6.3(Instructions for installation, operation and maintenance, decommissioning and dismantling)	-	50000	-
7(Normal service, mounting and transport conditions)	-	20000	-
8.1.1(General)	-	20000	-
8.2.1.2(Limits of operation of power operated equipment)	-	20000	-
8.2.1.3(Limits of operation of under-voltage relays and releases)	-	20000	-
8.2.1.4(Limits of operation of shunt releases)	-	20000	-
8.2.2(Temperature-rise)	-	40000	-
8.2.3(Dielectric properties)	-	50000	-
8.2.3.2(Impulse withstand voltage)	-	50000	-
8.2.3.3(Power-frequency or DC withstand voltage of the main, auxiliary and control circuits)	-	50000	-
8.2.4(Ability to make and break under no-load, normal load and overload conditions)	-	50000	-
8.2.4.1(Making and breaking capacities)	-	100000	-
8.2.4.2(Operational performance)	-	100000	-
8.2.4.3(Mechanical durability)	-	50000	-
8.2.4.4(Electrical durability)	-	100000	-
8.2.5(Ability to make, break or withstand short-circuit currents)	-	100000	-
8.2.7(Additional performance requirements for equipment suitable for isolation)	-	50000	-
8.2.9(Overload requirements for equipment incorporating fuses)	-	50000	-
9.1.3.2(Mechanical operation test)	-	100000	-
9.1.3.3(Dielectric test)	-	50000	-
9.1.4(Sampling tests)	-	20000	-
9.1.5Special tests(Special tests)	-	20000	-
9.2(Compliance with constructional requirements)	-	20000	-
9.3.4.2(Temperature-rise)	-	40000	-
9.3.4.3(Test of dielectric properties)	-	50000	-
9.3.4.4(Making and breaking capacities)	-	100000	-
9.3.4.5(Dielectric verification)	-	50000	-
9.3.4.6(Leakage current)	-	30000	-
9.3.5.2(Operational performance test)	-	50000	-
9.3.6.2(Short-time withstand current test)	-	100000	-
9.3.6.3(Short-circuit making capacity test)	-	100000	-
9.3.7.2(Circuit-breaker protected short-circuit withstand)	-	100000	-
9.3.7.3(Fuse protected short-circuit withstand)	-	150000	-
9.3.8.2(Overload test)	-	100000	-
9.5.2(Mechanical durability)	-	50000	-
9.5.3(Electrical durability)	-	100000	-
D.7.1.1(Ambient air temperature)	-	20000	-
D.8.1.4(Clearances and creepage distances)	-	50000	-
D.9.3.10(Thermal cycling test)	-	0	Already mentioned in Test Facility not available for clause no. D.9.3.10(Thermal cyclic test)
8.1.7.2(Additional constructional requirements)	-	20000	-
8.1.9(Additional requirements for equipment provided with a neutral pol)	-	20000	-
9.3.4.7(Temperature-rise verification)	-	40000	-
9.3.4.8(Strength of actuator mechanism)	-	50000	-
9.3.5.3(Dielectric verification)	-	50000	-
9.3.5.5(Temperature-rise verification)	-	40000	-
9.3.6.4(Dielectric verification)	-	50000	-
9.3.6.6(Temperature-rise verification)	-	40000	-
9.3.7.4(Dielectric verification)	-	50000	-
9.3.7.6(Temperature-rise verification)	-	40000	-
9.3.8.3(Dielectric verification)	-	50000	-
9.3.8.5(Temperature-rise verification)	-	40000	-
9.3.5.4(Leakage current)	-	30000	-
9.3.6.5(Leakage current)	-	30000	-
9.3.7.5(Leakage current)	-	30000	-
9.3.8.4(Leakage current)	-	30000	-
9.1.3.2(Mechanical operation test)	-	100000	-
E.9.2(Current cycling test)	-	150000	-
E.9.2.4(Temperature measurements)	-	40000	-
8.1.2.2(Glow wire testing)	-	50000	-
3.1(General)	-	20000	-
4(Classification)	-	20000	-
5.3.2(Rated voltages)	-	20000	-
5.3.2.1(Rated operational voltage)	-	20000	-
5.3.2.2(Rated insulation voltage)	-	20000	-
5.3.2.3(Rated impulse withstand voltage)	-	50000	-
5.3.3(Currents)	-	20000	-
5.3.3.2(Conventional free air thermal current)	-	20000	-
5.3.3.3(Conventional enclosed thermal current)	-	20000	-
5.3.3.4(Rated operational current (Ie) or rated operational power)	-	20000	-
5.3.3.5(Rated uninterrupted current)	-	50000	-
5.3.4(Rated frequency)	-	20000	-
5.3.5(Rated duty)	-	50000	-
5.3.5.2(Eight-hour duty)	-	50000	-
5.3.5.3(Uninterrupted duty)	-	50000	-
5.3.6.1(Ability to withstand motor switching overload currents)	-	20000	-
5.3.6.2(Rated making capacity)	-	100000	-
5.3.6.3(Rated breaking capacity)	-	100000	-
5.3.7(Short-circuit characteristics)	-	100000	-
5.3.7.1(Rated short-time withstand current)	-	100000	-
5.3.7.2(Rated short-circuit making capacity)	-	100000	-
5.3.7.4(Rated conditional short-circuit current)	-	100000	-
5.4(Utilization category)	-	20000	-
5.5(Control circuits)	-	20000	-
5.6(Auxiliary circuits)	-	20000	-
5.7(Relays and releases)	-	20000	-
5.8(Co-ordination with short-circuit protective devices (SCPD))	-	20000	-
6.2.2(Marking)	-	50000	-
6.3(Instructions for installation, operation and maintenance, decommissioning and dismantling)	-	50000	-
7(Normal service, mounting and transport conditions)	-	20000	-
8.1.1(General)	-	20000	-
8.2.1.2(Limits of operation of power operated equipment)	-	20000	-
8.2.1.3(Limits of operation of under-voltage relays and releases)	-	20000	-
8.2.1.4(Limits of operation of shunt releases)	-	20000	-
8.2.2(Temperature-rise)	-	40000	-
8.2.3(Dielectric properties)	-	50000	-
8.2.3.2(Impulse withstand voltage)	-	50000	-
8.2.3.3(Power-frequency or DC withstand voltage of the main, auxiliary and control circuits)	-	50000	-
8.2.4(Ability to make and break under no-load, normal load and overload conditions)	-	100000	-
8.2.4.1(Making and breaking capacities)	-	100000	-
8.2.4.2(Operational performance)	-	100000	-
8.2.4.3(Mechanical durability)	-	50000	-
8.2.4.4(Electrical durability)	-	50000	-
8.2.5(Ability to make, break or withstand short-circuit currents)	-	100000	-
8.2.7(Additional performance requirements for equipment suitable for isolation)	-	20000	-
8.2.9(Overload requirements for equipment incorporating fuses)	-	100000	-
9.1.3.2(Mechanical operation test)	-	100000	-
9.1.3.3(Dielectric test)	-	50000	-
9.1.4(Sampling tests)	-	20000	-
9.1.5Special tests(Special tests)	-	20000	-
9.2(Compliance with constructional requirements)	-	20000	-
9.3.4.2(Temperature-rise)	-	40000	-
9.3.4.3(Test of dielectric properties)	-	50000	-
9.3.4.4(Making and breaking capacities)	-	100000	-
9.3.4.5(Dielectric verification)	-	50000	-
9.3.4.6(Leakage current)	-	30000	-
9.3.5.2(Operational performance test)	-	100000	-
9.3.6.2(Short-time withstand current test)	-	100000	-
9.3.6.3(Short-circuit making capacity test)	-	100000	-
9.3.7.2(Circuit-breaker protected short-circuit withstand)	-	100000	-
9.3.7.3(Fuse protected short-circuit withstand)	-	150000	-
9.3.8.2(Overload test)	-	100000	-
9.5.2(Mechanical durability)	-	50000	-
9.5.3(Electrical durability)	-	50000	-
D.7.1.1(Ambient air temperature)	-	20000	-
D.8.1.4(Clearances and creepage distances)	-	50000	-
8.1.7.2(Additional constructional requirements)	-	20000	-
8.1.9(Additional requirements for equipment provided with a neutral pol)	-	20000	-
9.3.4.7(Temperature-rise verification)	-	40000	-
9.3.4.8(Strength of actuator mechanism)	-	50000	-
9.3.5.3(Dielectric verification)	-	50000	-
9.3.5.5(Temperature-rise verification)	-	40000	-
9.3.6.4(Dielectric verification)	-	50000	-
9.3.6.6(Temperature-rise verification)	-	40000	-
9.3.7.4(Dielectric verification)	-	50000	-
9.3.7.6(Temperature-rise verification)	-	40000	-
9.3.8.3(Dielectric verification)	-	50000	-
9.3.8.5(Temperature-rise verification)	-	40000	-
9.3.5.4(Leakage current)	-	30000	-
9.3.6.5(Leakage current)	-	30000	-
9.3.7.5(Leakage current)	-	30000	-
9.3.8.4(Leakage current)	-	30000	-
9.1.3.2(Mechanical operation test)	-	100000	-
E.9.2(Current cycling test)	-	150000	-
E.9.2.4(Temperature measurements)	-	40000	-
8.1.2.2(Glow wire testing)	-	50000	-

Complete

29 Feb, 2024

21 Feb, 2027

-
Included. w.e.f.09.12.2024 Exclusion CL 8.1.7.1 (General) CL 8.2.1 (Operating conditions) CL 8.2.1.1 (General) CL 8.2.8 (Critical load current performance: DC equipment) CL 9.3.3.6 (DC test current ripple) CL 9.3.4.4.3 (Characteristics of transient recovery voltage) CL 9.3.9.2 (Determination of critical load current) CL 9.4 (Electromagnetic compatibility tests) CL 9.5.4 (Damp heat, salt mist, vibration and shock) CL D.8.1.12 (Degrees of protection of enclosed equipment) CL D.9.3.11 (Climatic test) CL D.9.3.12 (Temperature-rise verification with solar effects – Outdoor units only) CL CL E.9.3.1 (Flexion test) CL E.9.3.2 (Pull-out test) CL 9.3.9.3 (Critical load current performance) CL D.9.3.10 (Thermal cycling test) CL 9.4.2 (Immunity) CL 9.4.3 (Emission) Capacity: Short Circuit Test: 63A to 50kA @ 415 V Making & Breaking capacities: up to 50kA Short time withstand:50kA Temperature rise test: Upto 4000A Electrical Endurance test: Upto 2500A @ 415V Mechanical Endurance test HV (Upto 15kV AC/DC) Leakage Current (Upto 300mA) Impulse (Upto 20kVp) Voltage source 50 to 1000VAC/DC

IS/IEC 60947 : Part 2 (2016)

Low - Voltage switchgear and controlgear: Part 2 circuit - Breakers (First Revision)

Circuit Breaker

1086000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
8.3.3.3(Test of dielectric properties)	-	60000	Impulse w/s test INR.40,000 High Voltage Power Freq. Withstand INR.14,000 Leakage current INR.3,000 Clearance and creepage INR.3,000
8.3.3.2(Tripping limits and characteristics)	-	132000	Tripping under SC conditions INR.1,10,000 Tripping under O/L conditions INR.22,000
8.3.3.4(Mechanical operation and operational performance capability)	-	90000	Mechanical operation INR.15,000 operational performance INR.75,000
8.3.4.2(Test of service short circuit breaking capacity)	-	92000	Rated ultimate SC breaking capacity INR.92000
8.3.5.3(Rated ultimate short-circuit breaking capacity)	-	92000	Rated ultimate SC breaking capacity INR.92000
8.3.3.6(Verification of dielectric withstand)	-	14000	Verification of dielectric withstand INR.14000
8.3.4.4(verification of dielectric withstand (sequnce II))	-	28000	Dielectric verification INR.28000
8.3.5.4(Verification of dielectric withstand)	-	28000	Dielectric verification INR.28000
8.3.6.6(verification of dielectric withstand (sequence IV))	-	28000	Dielectric verification INR.28000
8.3.7.4((stage 1) verification of dielectric withstand (sequence V))	-	28000	Dielectric verification INR.28000
8.3.7.8(Verification of dielectric withstand)	-	28000	Dielectric verification INR.28000
8.3.8.6(verification of dielectric withstand (sequence VI))	-	28000	Dielectric verification INR.28000
8.3.4.3(verification of operational performance capability (sequence II))	-	48000	Operational performance capability INR.48000
8.3.8.5(verification of operational performance capability (sequence VI))	-	48000	Operational performance capability INR.48000
8.3.4.5(verification of temperature-rise (sequence II))	-	25000	Verification of Temperature rise test INR.25000
8.3.6.4(verification of temperature-rise (sequence IV))	-	25000	Verification of Temperature rise test INR.25000
8.3.7.3((stage 1) verification of temperature-rise (sequence V))	-	25000	Verification of Temperature rise test INR.25000
8.3.8.7(Verification of temperature-rise)	-	25000	Verification of Temperature rise test INR.25000
8.3.3.10(Verification of main contact position)	-	5000	Verification of main contact position INR.5000
8.3.8.4(Rated service short-circuit breaking capacity*)	-	92000	Rated service short circuit breaking capacity INR.92000
8.3.5.3(rated short circuit breaking capacity (sequence III))	-	92000	Rated service short circuit breaking capacity INR.92000
8.3.5.4(verification of dielectric withstand (sequnce III))	-	28000	Dielectric verification INR.28000
8.3.4.5(Verifiation of temperature-rise)	-	25000	Verification of Temperature rise test INR.25000
8.3.3.5(Overload performance)	-	150000	-
8.3.3.9(Verification of undervoltage and shunt releases)	-	10000	-
8.3.3.8(Verification of Overload releases)	-	3700	-
8.3.4.6(Verification of Overload releases)	-	3700	-
8.3.5.2(verification of overload releases (sequence III))	-	3700	-
8.3.5.5(verification of overload releases (sequence III))	-	3700	-
8.3.6.2(Verification of Overload releases)	-	3700	-
8.3.6.7(verification of overload releases (sequence IV))	-	3700	-
8.3.7.5(Verification of Overload releases)	-	3700	-
8.3.7.9(Verification of Overload releases)	-	3700	-
8.3.8.2(Verification of Overload releases)	-	3700	-
8.3.8.8(Verification of Overload releases)	-	3700	-
8.4.4(Verification of the operation of undervoltage and shunt releases)	-	10000	-
8.3.4.2(rated short circuit breaking capacity (sequence II))	-	92000	-
8.4.2(Mechanical operation tests)	-	15000	-
8.4.3(Verification of the calibration of overcurrent releases)	-	10000	-
8.4.5(Additional tests for CBRs)	-	5000	-
8.4.6(Dielectric tests)	-	60000	-
8.4.7(Test for the verifiacation of clearances less than those corresponding to case A of Table 13 of IEC 60947-1:2007)	-	3000	-
8.3.6.3(rated short circuit withstand current (sequence IV))	-	100000	-
8.3.6.5(short circuit breaking capacity at maximum short time withstand current (sequence IV))	-	100000	-
8.3.6.7(Verification of Overload releases)	-	3700	-
8.3.7.2((stage 1) short circuit at the selectivity limit current (sequence V))	-	100000	-
8.3.7.3(Verification of temperature-rise)	-	25000	-
8.3.7.7((stage 2) short circuit at rated ultimate short circuit breaking capacity (sequence V))	-	92000	-
8.3.8.4(rated service short circuit breaking capacity (sequence VI))	-	92000	-
H.2(individual pole short circuit (IIT))	-	92000	-
H.3(verification of dielectric withstand)	-	14000	-
H.4(verification of overload releases)	-	3700	-
C.2(individual pole short circuit breaking capacity (Isu))	-	92000	-
C.3(verification of dielectric withstand)	-	14000	-
C.4(verification of overload releases)	-	3700	-
B.8.2(Operating characteristics)	-	10000	-
B.8.3(Dielectric Properties)	-	60000	-
B.8.4(Operation of the test device at the limits of rated voltage)	-	10000	-
B.8.5(Limiting value of the non-operating current under over-current conditions)	-	10000	-
B.8.8(Behavior in the case of failure of line voltage for CBRs classified under B.3.1.2.1)	-	10000	-
8.3.3.7(Verification of temperature-rise)	-	25000	-
8.3.4.3(Verification of operational performance capability)	-	48000	-
8.3.8.5(Verification of operational performance capability)	-	75000	-
8.3.4.4(Verification of dielectric withstand)	-	14000	-
8.3.6.6(Verification of dielectric withstand)	-	14000	-
8.3.7.4(Verification of dielectric withstand)	-	14000	-
8.3.8.6(Verification of dielectric withstand)	-	14000	-
8.3.6.4(Verification of temperature-rise)	-	25000	-
8.3.5.2(Verification of Overload releases)	-	3700	-
8.3.5.5(Verification of Overload releases)	-	3700	-
8.3.6.3(Rated short-time withstand current)	-	100000	-
8.3.6.5(Short-circuit breaking capacity at maximum short-time withstand current)	-	100000	-
8.3.7.2(Short-circuit at the selectivity limit current)	-	92000	-
8.3.7.6(Short-circuit at 1,1 times take-over current)	-	92000	-
8.3.7.7(Short-circuit at ultimate short-circuit breaking capacity)	-	92000	-
8.3.8.3(Rated short-time withstand current)	-	100000	-
8.3.4.6(verification of overload releases (sequence II))	-	3700	-
8.3.6.2(verification of overload releases (sequence IV))	-	3700	-
8.3.7.5((stage 2) verification of overload releases (sequence V))	-	3700	-
8.3.7.6((stage 2) short circuit at 1.1 time the take-over current (sequence V))	-	92000	-
8.3.7.8((stage 2) verification of dielectric withstand (sequence V))	-	14000	-
8.3.7.9((stage 2) verification of overload releases (sequence V))	-	3700	-
8.3.8.2(verification of overload releases (sequence VI))	-	3700	-
8.3.8.3(rated short time withstand current (sequence VI))	-	100000	-
8.3.8.8(verification of overload releases (sequence VI))	-	3700	-
B.8.9(Behavior in the case of failure of line voltage for CBRs classified under B.3.1.2.2)	-	10000	-
8.3.4.1(General)	-	10000	-
8.3.5.1(General)	-	10000	-
8.3.6.1(General)	-	10000	-
8.3.7.1(General)	-	10000	-
8.3.8.1(General)	-	10000	-
8.3.5.1(General)	-	10000	-
8.3.6.1(General)	-	10000	-
8.3.8.1(General)	-	10000	-
8.3.7.1(General)	-	10000	-
8.3.4.1(General)	-	10000	-
8.3.8.7(verification of temperature-rise (sequence VI))	-	25000	-

Complete

29 Feb, 2024

21 Feb, 2027

-
Exclusion: Cl.7.3 Annexure J Table J.1 (Electrostatic discharges), Cl.7.3 Annexure J Table J.1 ("Radiated radio-frequency electromagnetic fields"), Cl.7.3 Annexure J Table J.1 ("Electrical fast transients/bursts"), Cl.7.3 Annexure J Table J.1 ("Radiated radio-frequency electromagnetic fields"), Cl.7.3 Annexure J Table J.1 (Surges), Cl.7.3 Annexure J Table J.1 ("Conducted disturbances induced by radio frequency fields"), Cl.7.3 Annexure J Table J.1 ("Power frequency magnetic fields"), Cl.7.3 Annexure J Table J.1 ("Voltage dips and interruptions"), Cl.7.3 Annexure J Table J.3 ("Conducted RF disturbances 150 kHz to 30 MHz"), Cl.7.3 Annexure J Table J.3 ("Radiated RF disturbances 30 MHz to 1 000 MHz"), B.8.6 (Resistance against unwanted tripping due to surge currents resulting from impulse voltage), Cl.B.8.7 (Behavior in the case of an earth fault current comprising a d.c. component), Cl.8.3.9 (Critical d.c. load current test) Capacity: Short Circuit Test: 63A to 50kA @ 415 V Temperature rise test: Upto 4000A Electrical Endurance test: Upto 2500A @ 415V Mechanical Endurance test HV (Upto 15kV AC/DC) Leakage Current (Upto 300mA) Impulse (Upto 20kVp) Overload release (Upto 6000A) Short-circuit releases (Upto 25000A) Voltage source 50 to 1000VAC/DC Overload performance: 50kA Short time withstand:50kA

IS/IEC 60898 : PART 1 (2015)

Electrical accessories - Circuit - Breakers for overcurrent protection for household and similar installations: Part 1 circuit - Breakers for a.c. operation (First Revision)

800000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
6(Marking and other product information, IS 60898-1)	-	10000	-
8.1.1(General, IS 60898-1)	-	10000	-
8.1.2(Mechanism, IS 60898-1)	-	10000	-
8.1.3(Clearances and creepage distances, IS 60898-1)	-	25000	-
9.4(Test of reliability of screws, current-carrying parts and connections, IS 60898-1)	-	15000	-
9.5.1(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	15000	-
9.5.2(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	15000	-
9.5.3(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	15000	-
9.5.4(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	15000	-
9.6(Test of protection against electric shock, IS 60898-1)	-	10000	-
9.14.1(Test of resistance to heat, IS 60898-1)	-	20000	-
9.14.2(Test of resistance to heat, IS 60898-1)	-	20000	-
9.14.3(Test of resistance to heat, IS 60898-1)	-	20000	-
9.16(Test of resistance to rusting)	-	30000	-
9.3(Test of indelibility of marking, IS 60898-1)	-	6000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	12000	-
9.8.5(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	12000	-
9.9(28- day test, IS 60898-1)	-	50000	-
9.15(Resistance to abnormal heat and to fire)	-	20000	-
9.11(Verification of mechanical and electrical endurance, IS 60898-1)	-	50000	-
9.12.11.2.1(Performance at reduced short-circuit currents)	-	15000	-
9.12(Short- Circuit tests, IS 60898-1)	-	40000	-
9.12(Short- Circuit tests, IS 60898-1)	-	40000	-
9.12(Short- Circuit tests, IS 60898-1)	-	40000	-
9.10.2(Test of tripping characteristic, IS 60898-1)	-	20000	-
9.10.3(Test of tripping characteristic, IS 60898-1)	-	20000	-
9.10.4(Test of tripping characteristic, IS 60898-1)	-	20000	-
9.10.5(Test of tripping characteristic, IS 60898-1)	-	20000	-
9.13.1(Mechanical Stress, IS 60898-1)	-	10000	-
9.13(Resistance to mechanical shock and impact)	-	10000	-
9.13.2.2(Mechanical Stress, IS 60898-1)	-	10000	-
9.13.2.3(Mechanical Stress, IS 60898-1)	-	10000	-
9.13.2.4(Mechanical Stress, IS 60898-1)	-	10000	-
9.13.2.5(Mechanical Stress, IS 60898-1)	-	10000	-
9.12.11.3(Short-circuit performance at 1 500 A)	-	25000	-
9.12.11.4.2(Service short-circuit capacity (Ics))	-	40000	-
9.12.11.4.3(Performance at rated short-circuit capacity (Icn))	-	30000	-
9.12.11.4.4(Performance at rated making and breaking capacity (Icn1) on an individual pole of multipole circuit-breakers)	-	20000	-
8.1.4.1(Reliability of Screws current carrying parts and connections IS 60898-1)	-	15000	-
8.1.4.2(Reliability of Screws current carrying parts and connections IS 60898-1)	-	15000	-
8.1.4.3(Reliability of Screws current carrying parts and connections IS 60898-1)	-	15000	-
8.1.4.4(Reliability of Screws current carrying parts and connections IS 60898-1)	-	15000	-
8.1.5.1(Reliability of terminals for external conductors, IS 60898-1)	-	15000	-
8.1.5.2(Reliability of terminals for external conductors, IS 60898-1)	-	15000	-
8.1.5.3(Reliability of terminals for external conductors, IS 60898-1)	-	15000	-
8.1.5.4(Reliability of terminals for external conductors, IS 60898-1)	-	15000	-
8.1.5.5(Reliability of terminals for external conductors, IS 60898-1)	-	15000	-
8.1.5.6(Reliability of terminals for external conductors, IS 60898-1)	-	15000	-
8.1.5.7(Reliability of terminals for external conductors, IS 60898-1)	-	15000	-
8.1.5.8(Reliability of terminals for external conductors, IS 60898-1)	-	15000	-
8.1.5.9(Reliability of terminals for external conductors, IS 60898-1)	-	15000	-
8.1.5.10(Reliability of terminals for external conductors, IS 60898-1)	-	15000	-
8.1.5.11(Reliability of terminals for external conductors, IS 60898-1)	-	15000	-
8.1.5.12(Reliability of terminals for external conductors, IS 60898-1)	-	15000	-
8.2(Protection against Electric Shock, IS 60898-1)	-	15000	-
8.3.2(Dielectric strength at power frequency, IS 60898-1)	-	20000	-
8.3.3(Isolating capability, IS 60898-1)	-	20000	-
8.3.4(Dielectric strength at rated impulse withstand voltage ( Uimp), IS 60898-1)	-	20000	-
8.4(Temperature-rise, IS 60898-1)	-	30000	-
8.5(Uninterrupted duty, IS 60898-1)	-	30000	-
8.6(Automatic operation, IS 60898-1)	-	30000	-
8.7(Mechanical and electrical endurance, IS 60898-1)	-	50000	-
8.8(Performance at short-circuit currents, IS 60898-1)	-	40000	-
8.9(Resistance to mechanical shock and impact, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
6(Marking and other product information, IS 60898-1)	-	10000	-
8.1.2(Mechanism, IS 60898-1)	-	10000	-
8.1.2(Mechanism, IS 60898-1)	-	10000	-
8.1.2(Mechanism, IS 60898-1)	-	10000	-
8.1.2(Mechanism, IS 60898-1)	-	10000	-
8.1.2(Mechanism, IS 60898-1)	-	10000	-
8.1.2(Mechanism, IS 60898-1)	-	10000	-
8.1.2(Mechanism, IS 60898-1)	-	10000	-
8.1.2(Mechanism, IS 60898-1)	-	10000	-
8.1.2(Mechanism, IS 60898-1)	-	10000	-
8.1.2(Mechanism, IS 60898-1)	-	10000	-
8.11(Resistance to abnormal heat and to fire, IS 60898-1)	-	10000	-
8.12(Resistance to rusting, IS 60898-1)	-	10000	-
8.13(Power loss, IS 60898-1)	-	10000	-
9.7.1(Test of protection against electric shock, IS 60898-1)	-	10000	-
9.7.2(Test of protection against electric shock, IS 60898-1)	-	10000	-
9.7.3(Test of protection against electric shock, IS 60898-1)	-	10000	-
9.7.4(Test of protection against electric shock, IS 60898-1)	-	10000	-
9.7.5.2(Test of protection against electric shock, IS 60898-1)	-	10000	-
I.2(Tripping tests)	-	10000	-
I.3(Verification of clearances between open contacts)	-	10000	-
8.1.3(Clearances and creepage distances, IS 60898-1)	-	10000	-
8.4(Temperature-rise, IS 60898-1)	-	15000	-
9.5.2(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	10000	-
9.5.2(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	10000	-
9.5.2(Tests of reliability of screw-type terminals for external copper conductors, IS 60898-1)	-	10000	-
9.7.5.3(Test of protection against electric shock, IS 60898-1)	-	10000	-
9.7.5.4(Test of protection against electric shock, IS 60898-1)	-	10000	-
9.6(Test of protection against electric shock, IS 60898-1)	-	10000	-
9.6(Test of protection against electric shock, IS 60898-1)	-	10000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	10000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	10000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	10000	-
9.8(Test of temperature-rise and measurement of power loss, IS 60898-1)	-	10000	-
9.12(Short- Circuit tests, IS 60898-1)	-	40000	-
9.12(Short- Circuit tests, IS 60898-1)	-	40000	-
9.12(Short- Circuit tests, IS 60898-1)	-	40000	-
9.12(Short- Circuit tests, IS 60898-1)	-	40000	-
9.12(Short- Circuit tests, IS 60898-1)	-	40000	-
9.12.12(Verification of the circuit-breaker after short-circuit tests)	-	15000	-
9.12.11.2.2(Short-circuit test for verifying the suitability of circuit-breakers for use in IT systems)	-	40000	-
9.7.5.1(Test of protection against electric shock, IS 60898-1)	-	10000	-
8.1.6(Non-interchangeability)	-	10000	-

Complete

29 Feb, 2024

21 Feb, 2027

-
included w.e.f.07.11.2024 Exclusion 8.1 (Resistance to heat, IS 60898-1) 4.2 to 4.7 (Classification, IS 60898-1)

Bureau of Indian Standards

The National Standards Body of India

Novateur Electrical and Digital Systems Pvt Ltd ,Sinnar ,Nasik

A-2, MIDC Malegaon, Sinnar, Nashik, Nashik, Maharashtra, 422113

8657926870 nedspl.lab@legrand.com

Scope List