8.3.3.3(Test of dielectric properties) |
- |
60000 |
|
Impulse w/s test INR.40,000
High Voltage Power Freq. Withstand INR.14,000
Leakage current INR.3,000
Clearance and creepage INR.3,000 |
8.3.3.2(Tripping limits and characteristics) |
- |
132000 |
|
Tripping under SC conditions INR.1,10,000
Tripping under O/L conditions INR.22,000 |
8.3.3.4(Mechanical operation and operational performance capability) |
- |
90000 |
|
Mechanical operation INR.15,000
operational performance INR.75,000 |
8.3.4.2(Test of service short circuit breaking capacity) |
- |
92000 |
|
Rated ultimate SC breaking capacity INR.92000 |
8.3.5.3(Rated ultimate short-circuit breaking capacity) |
- |
92000 |
|
Rated ultimate SC breaking capacity INR.92000 |
8.3.3.6(Verification of dielectric withstand) |
- |
14000 |
|
Verification of dielectric withstand INR.14000 |
8.3.4.4(verification of dielectric withstand (sequnce II)) |
- |
28000 |
|
Dielectric verification INR.28000 |
8.3.5.4(Verification of dielectric withstand) |
- |
28000 |
|
Dielectric verification INR.28000 |
8.3.6.6(verification of dielectric withstand (sequence IV)) |
- |
28000 |
|
Dielectric verification INR.28000 |
8.3.7.4((stage 1) verification of dielectric withstand (sequence V)) |
- |
28000 |
|
Dielectric verification INR.28000 |
8.3.7.8(Verification of dielectric withstand) |
- |
28000 |
|
Dielectric verification INR.28000 |
8.3.8.6(verification of dielectric withstand (sequence VI)) |
- |
28000 |
|
Dielectric verification INR.28000 |
8.3.4.3(verification of operational performance capability (sequence II)) |
- |
48000 |
|
Operational performance capability INR.48000 |
8.3.8.5(verification of operational performance capability (sequence VI)) |
- |
48000 |
|
Operational performance capability INR.48000 |
8.3.4.5(verification of temperature-rise (sequence II)) |
- |
25000 |
|
Verification of Temperature rise test INR.25000 |
8.3.6.4(verification of temperature-rise (sequence IV)) |
- |
25000 |
|
Verification of Temperature rise test INR.25000 |
8.3.7.3((stage 1) verification of temperature-rise (sequence V)) |
- |
25000 |
|
Verification of Temperature rise test INR.25000 |
8.3.8.7(Verification of temperature-rise) |
- |
25000 |
|
Verification of Temperature rise test INR.25000 |
8.3.3.10(Verification of main contact position) |
- |
5000 |
|
Verification of main contact position INR.5000 |
8.3.8.4(Rated service short-circuit breaking capacity*) |
- |
92000 |
|
Rated service short circuit breaking capacity INR.92000 |
8.3.5.3(rated short circuit breaking capacity (sequence III)) |
- |
92000 |
|
Rated service short circuit breaking capacity INR.92000 |
8.3.5.4(verification of dielectric withstand (sequnce III)) |
- |
28000 |
|
Dielectric verification INR.28000 |
8.3.4.5(Verifiation of temperature-rise) |
- |
25000 |
|
Verification of Temperature rise test INR.25000 |
8.3.3.5(Overload performance) |
- |
150000 |
|
- |
8.3.3.9(Verification of undervoltage and shunt releases) |
- |
10000 |
|
- |
8.3.3.8(Verification of Overload releases) |
- |
3700 |
|
- |
8.3.4.6(Verification of Overload releases) |
- |
3700 |
|
- |
8.3.5.2(verification of overload releases (sequence III)) |
- |
3700 |
|
- |
8.3.5.5(verification of overload releases (sequence III)) |
- |
3700 |
|
- |
8.3.6.2(Verification of Overload releases) |
- |
3700 |
|
- |
8.3.6.7(verification of overload releases (sequence IV)) |
- |
3700 |
|
- |
8.3.7.5(Verification of Overload releases) |
- |
3700 |
|
- |
8.3.7.9(Verification of Overload releases) |
- |
3700 |
|
- |
8.3.8.2(Verification of Overload releases) |
- |
3700 |
|
- |
8.3.8.8(Verification of Overload releases) |
- |
3700 |
|
- |
8.4.4(Verification of the operation of undervoltage and shunt releases) |
- |
10000 |
|
- |
8.3.4.2(rated short circuit breaking capacity (sequence II)) |
- |
92000 |
|
- |
8.4.2(Mechanical operation tests) |
- |
15000 |
|
- |
8.4.3(Verification of the calibration of overcurrent releases) |
- |
10000 |
|
- |
8.4.5(Additional tests for CBRs) |
- |
5000 |
|
- |
8.4.6(Dielectric tests) |
- |
60000 |
|
- |
8.4.7(Test for the verifiacation of clearances less than those corresponding to case A of Table 13 of IEC 60947-1:2007) |
- |
3000 |
|
- |
8.3.6.3(rated short circuit withstand current (sequence IV)) |
- |
100000 |
|
- |
8.3.6.5(short circuit breaking capacity at maximum short time withstand current (sequence IV)) |
- |
100000 |
|
- |
8.3.6.7(Verification of Overload releases) |
- |
3700 |
|
- |
8.3.7.2((stage 1) short circuit at the selectivity limit current (sequence V)) |
- |
100000 |
|
- |
8.3.7.3(Verification of temperature-rise) |
- |
25000 |
|
- |
8.3.7.7((stage 2) short circuit at rated ultimate short circuit breaking capacity (sequence V)) |
- |
92000 |
|
- |
8.3.8.4(rated service short circuit breaking capacity (sequence VI)) |
- |
92000 |
|
- |
H.2(individual pole short circuit (IIT)) |
- |
92000 |
|
- |
H.3(verification of dielectric withstand) |
- |
14000 |
|
- |
H.4(verification of overload releases) |
- |
3700 |
|
- |
C.2(individual pole short circuit breaking capacity (Isu)) |
- |
92000 |
|
- |
C.3(verification of dielectric withstand) |
- |
14000 |
|
- |
C.4(verification of overload releases) |
- |
3700 |
|
- |
B.8.2(Operating characteristics) |
- |
10000 |
|
- |
B.8.3(Dielectric Properties) |
- |
60000 |
|
- |
B.8.4(Operation of the test device at the limits of rated voltage) |
- |
10000 |
|
- |
B.8.5(Limiting value of the non-operating current under over-current conditions) |
- |
10000 |
|
- |
B.8.8(Behavior in the case of failure of line voltage for CBRs classified under B.3.1.2.1) |
- |
10000 |
|
- |
8.3.3.7(Verification of temperature-rise) |
- |
25000 |
|
- |
8.3.4.3(Verification of operational performance capability) |
- |
48000 |
|
- |
8.3.8.5(Verification of operational performance capability) |
- |
75000 |
|
- |
8.3.4.4(Verification of dielectric withstand) |
- |
14000 |
|
- |
8.3.6.6(Verification of dielectric withstand) |
- |
14000 |
|
- |
8.3.7.4(Verification of dielectric withstand) |
- |
14000 |
|
- |
8.3.8.6(Verification of dielectric withstand) |
- |
14000 |
|
- |
8.3.6.4(Verification of temperature-rise) |
- |
25000 |
|
- |
8.3.5.2(Verification of Overload releases) |
- |
3700 |
|
- |
8.3.5.5(Verification of Overload releases) |
- |
3700 |
|
- |
8.3.6.3(Rated short-time withstand current) |
- |
100000 |
|
- |
8.3.6.5(Short-circuit breaking capacity at maximum short-time withstand current) |
- |
100000 |
|
- |
8.3.7.2(Short-circuit at the selectivity limit current) |
- |
92000 |
|
- |
8.3.7.6(Short-circuit at 1,1 times take-over current) |
- |
92000 |
|
- |
8.3.7.7(Short-circuit at ultimate short-circuit breaking capacity) |
- |
92000 |
|
- |
8.3.8.3(Rated short-time withstand current) |
- |
100000 |
|
- |
8.3.4.6(verification of overload releases (sequence II)) |
- |
3700 |
|
- |
8.3.6.2(verification of overload releases (sequence IV)) |
- |
3700 |
|
- |
8.3.7.5((stage 2) verification of overload releases (sequence V)) |
- |
3700 |
|
- |
8.3.7.6((stage 2) short circuit at 1.1 time the take-over current (sequence V)) |
- |
92000 |
|
- |
8.3.7.8((stage 2) verification of dielectric withstand (sequence V)) |
- |
14000 |
|
- |
8.3.7.9((stage 2) verification of overload releases (sequence V)) |
- |
3700 |
|
- |
8.3.8.2(verification of overload releases (sequence VI)) |
- |
3700 |
|
- |
8.3.8.3(rated short time withstand current (sequence VI)) |
- |
100000 |
|
- |
8.3.8.8(verification of overload releases (sequence VI)) |
- |
3700 |
|
- |
B.8.9(Behavior in the case of failure of line voltage for CBRs classified under B.3.1.2.2) |
- |
10000 |
|
- |
8.3.4.1(General) |
- |
10000 |
|
- |
8.3.5.1(General) |
- |
10000 |
|
- |
8.3.6.1(General) |
- |
10000 |
|
- |
8.3.7.1(General) |
- |
10000 |
|
- |
8.3.8.1(General) |
- |
10000 |
|
- |
8.3.5.1(General) |
- |
10000 |
|
- |
8.3.6.1(General) |
- |
10000 |
|
- |
8.3.8.1(General) |
- |
10000 |
|
- |
8.3.7.1(General) |
- |
10000 |
|
- |
8.3.4.1(General) |
- |
10000 |
|
- |
8.3.8.7(verification of temperature-rise (sequence VI)) |
- |
25000 |
|
- |