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S.No.

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Indian Standard No.

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Testing Charges (Excl. Of Taxes)

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Effective Date

Validity Date

Remark

TUV Rheinland (India) Pvt., Ltd.

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

850000.00 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
10.1(Visual inspection)	-	25000.00	-
10.2(Maximum power determination)	-	50000.00	-
10.3(Insulation test)	-	25000.00	-
10.4(Measurement of temperature coefficients)	-	50000.00	-
10.5(Measurement of NOCT)	-	50000.00	-
10.6(Performance at STC and NOCT)	-	10000.00	-
10.7(Performance at low irradiance)	-	7500.00	-
10.8(Outdoor exposure test)	-	7500.00	-
10.9(Hot-spot endurance test)	-	75000.00	-
10.10(UV preconditioning)	-	50000.00	-
10.11(Thermal cycling test)	-	150000.00	-
10.12(Humidity freeze test)	-	75000.00	-
10.13(Damp heat test)	-	75000.00	-
10.14(Robustness of termination test)	-	25000.00	-
10.15(Wet leakage current test)	-	25000.00	-
10.16(Mechanical load test)	-	50000.00	-
10.17(Hail test)	-	50000.00	-
10.18(Bypass diode thermal' test)	-	40000.00	-
4(Marking)	-	10000.00	-

Complete

10 Sep, 2024

Hi Physix Laboratory India Private Limited

IS 14286 : Part 1 : Sec 2 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-2: Special requirements for testing of thin-film Cadmium Telluride CdTe based photovoltaic PV modules Third Revision

1985000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection)	-	20000	-
Cl-11.2(Maximum power determination)	-	30000	-
Cl-11.3(Insulation tes)	-	15000	-
Cl-11.4(Measurement of temperature coefficients)	-	60000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	0	-
Cl-11.6(Performance at STC and NMOT)	-	30000	-
Cl-11.7(Performance at low irradiance)	-	30000	-
Cl-11.8(Outdoor exposure test)	-	30000	-
Cl-11.9(Hot-spot endurance test)	-	200000	-
Cl-11.10(UV preconditioning test)	-	150000	-
Cl-11.11(Thermal cycling test)	-	250000	-
Cl-11.12(Humidity-freeze test)	-	100000	-
Cl-11.13(Damp heat test)	-	150000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current test)	-	20000	-
Cl-11.16(Static mechanical load test)	-	40000	-
Cl-11.17(Hail test)	-	20000	-
Cl-11.18(Bypass diode testing)	-	80000	-
Cl-11.19(Stabilization)	-	300000	-
5(Marking and documentation)	-	5000	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	120000	-
11.21(Potential induced degradation test (MQT 21))	-	300000	-
11.22(Bending test (MQT 22))	-	20000	-

Complete

20 Jun, 2025

Included w.e.f.08.11.2024

Hi Physix Laboratory India Private Limited

IS 14286 : Part 1 : Sec 1 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-1: Special requirements for testing of crystalline silicon photovoltaic PV modules Third Revision

1835000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection)	-	20000	-
Cl-11.2(Maximum power determination)	-	30000	-
Cl-11.3(Insulation test)	-	15000	-
Cl-11.4(Measurement of temperature coefficients)	-	60000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	0	-
Cl-11.6(Performance at STC)	-	30000	-
Cl-11.7(Performance at low irradiance)	-	30000	-
Cl-11.8(Outdoor exposure test)	-	30000	-
Cl-11.9(Hot-spot endurance test)	-	200000	-
Cl-11.10(UV preconditioning test)	-	150000	-
Cl-11.11(Thermal cycling test)	-	250000	-
Cl-11.12(Humidity-freeze test)	-	100000	-
Cl-11.13(Damp heat test)	-	150000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current tes)	-	20000	-
Cl-11.16(Static mechanical load test)	-	40000	-
Cl-11.17(Hail test)	-	20000	-
Cl-11.18(Bypass diode thermal test)	-	80000	-
Cl-11.19(Stabilization)	-	150000	-
5(Marking and documentation)	-	5000	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	120000	-
11.21(Potential induced degradation test (MQT 21))	-	300000	-
11.22(Bending test (MQT 22))	-	20000	-

Complete

20 Jun, 2025

Included w.e.f 05.11.2024

UL INDIA PRIVATE LIMITED

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

CRYSTALLINE SILICON TERRESTRIAL PHOTOVOLTAIC (PV) MODUL

800000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
10.1(Visual inspection)	-	2000	-
10.2(Maximum power determination)	-	4000	-
10.3(Insulation test)	-	4000	-
10.5(Measurement of NOCT)	-	30000	-
10.6(Performance at STC and NOCT)	-	9000	-
10.7(Performance at low irradiance)	-	4000	-
10.8(Outdoor exposure test)	-	20000	-
10.9(Hot-spot endurance test)	-	15000	-
10.10(UV preconditioning)	-	35000	-
10.11(Thermal cycling test)	-	230000	-
10.12(Humidity freeze test)	-	150000	-
10.13(Damp heat test)	-	230000	-
10.14(Robustness of termination test)	-	10000	-
10.15(Wet leakage current test)	-	7000	-
10.16(Mechanical load test)	-	10000	-
10.17(Hail test)	-	10000	-
10.18(Bypass diode thermal' test)	-	10000	-
10.4(Measurement of temperature coefficients)	-	20000	-

Complete

12 May, 2027

Hi Physix Laboratory India Private Limited

IS 14286 : Part 1 : Sec 4 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-4: Special requirements for testing of thin-film CuInGASSe2 based photovoltaic PV modules Third Revision

1985000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection (MQT 01))	-	20000	-
Cl-11.2(Maximum power determination (MQT 02))	-	30000	-
Cl-11.3(Insulation test (MQT 03))	-	15000	-
Cl-11.4(Measurement of temperature coefficients (MQT 04))	-	60000	-
Cl-11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	0	-
Cl-11.6(Performance at STC (MQT 06.1) and NMOT (MQT 06.2)	-	30000	-
Cl-11.7(Performance at low irradiance (MQT 07))	-	30000	-
Cl-11.8(Outdoor exposure test (MQT 08))	-	30000	-
Cl-11.9(Hot-spot endurance test (MQT 09))	-	200000	-
Cl-11.10(UV preconditioning test (MQT 10))	-	150000	-
Cl-11.11(Thermal cycling test (MQT 11))	-	250000	-
Cl-11.12(As per IEC 61215-1:2016)	-	100000	11.12 (Humidity-freeze test (MQT 12))
Cl-11.13(Damp heat test (MQT 13))	-	150000	-
Cl-11.14(Robustness of terminations test (MQT 14))	-	15000	-
Cl-11.15(Robustness of terminations test (MQT 14))	-	20000	11.15 (Wet leakage current test (MQT 15))
Cl-11.16(Static mechanical load test (MQT 16))	-	40000	-
Cl-11.17(Hail test (MQT 17))	-	20000	-
Cl-11.18(Bypass diode testing (MQT 18))	-	80000	-
Cl-11.19(Stabilization (MQT 19))	-	300000	-
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection (MQT 01))	-	0	-
Cl-11.2(Maximum power determination (MQT 02))	-	0	-
Cl-11.3(Insulation test (MQT 03))	-	0	-
Cl-11.4(Measurement of temperature coefficients (MQT 04))	-	0	-
Cl-11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	0	-
Cl-11.6(Performance at STC (MQT 06.1) and NMOT (MQT 06.2)	-	0	-
Cl-11.7(Performance at low irradiance (MQT 07))	-	0	-
Cl-11.8(Outdoor exposure test (MQT 08))	-	0	-
Cl-11.9(Hot-spot endurance test (MQT 09))	-	0	-
Cl-11.10(UV preconditioning test (MQT 10))	-	0	-
Cl-11.11(Thermal cycling test (MQT 11))	-	0	-
Cl-11.12(As per IEC 61215-1:2016)	-	0	-
Cl-11.13(Damp heat test (MQT 13))	-	0	-
Cl-11.14(Robustness of terminations test (MQT 14))	-	0	-
Cl-11.15(Robustness of terminations test (MQT 14))	-	0	-
Cl-11.16(Static mechanical load test (MQT 16))	-	0	-
Cl-11.17(Hail test (MQT 17))	-	0	-
Cl-11.18(Bypass diode testing (MQT 18))	-	0	-
Cl-11.19(Stabilization (MQT 19))	-	0	-
5(Marking and documentation)	-	5000	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	120000	-
11.21(Potential induced degradation test (MQT 21))	-	300000	-
11.22(Bending test (MQT 22))	-	20000	-

Complete

20 Jun, 2025

Included w.e.f 05.11.2024

ACE TEST LAB

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

740000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
4(Marking)	-	39333.33	-
10.1(Visual inspection)	-	39333.33	-
10.2(Maximum power determination)	-	39333.33	-
10.3(Insulation test)	-	39333.33	-
10.4(Measurement of temperature coefficients)	-	39333.33	-
10.5(Measurement of NOCT)	-	39333.33	-
10.6(Performance at STC and NOCT)	-	39333.33	-
10.7(Performance at low irradiance)	-	39333.33	-
10.8(Outdoor exposure test)	-	39333.33	-
10.9(Hot-spot endurance test)	-	39333.33	-
10.10(UV preconditioning)	-	39333.33	-
10.11(Thermal cycling test)	-	36888.90	-
10.12(Humidity freeze test)	-	36888.90	-
10.13(Damp heat test)	-	36888.92	-
10.14(Robustness of termination test)	-	39333.33	-
10.15(Wet leakage current test)	-	39333.33	-
10.16(Mechanical load test)	-	39333.33	-
10.17(Hail test)	-	39333.33	-
10.18(Bypass diode thermal' test)	-	39333.33	-

Complete

07 Jan, 2027

Hi Physix Laboratory India Private Limited

IS 14286 : Part 1 : Sec 3 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-3: Special requirements for testing of thin-film amorphous silicon based photovoltaic PV modules Third Revision

1985000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection)	-	20000	-
Cl-11.2(Maximum power determination)	-	30000	-
Cl-11.3(Insulation test)	-	15000	-
Cl-11.4(Measurement of temperature coefficients)	-	60000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	0	-
Cl-11.6(Performance at STC and NMOT)	-	30000	-
Cl-11.7(Performance at low irradiance)	-	30000	-
Cl-11.8(Outdoor exposure test)	-	30000	-
Cl-11.9(Hot-spot endurance test)	-	200000	-
Cl-11.10(UV preconditioning test)	-	150000	-
Cl-11.11(Thermal cycling test)	-	250000	-
Cl-11.12(Humidity-freeze test)	-	100000	-
Cl-11.13(Damp heat test)	-	150000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current test)	-	20000	-
Cl-11.16(Static mechanical load test)	-	40000	-
Cl-11.17(Hail test)	-	20000	-
Cl-11.18(Bypass diode testing)	-	80000	-
Cl-11.19(Stabilization)	-	300000	-
Cl-8(Major visual defects)	-	0	-
Cl-11.1(Visual inspection)	-	0	-
Cl-11.2(Maximum power determination)	-	0	-
Cl-11.3(Insulation test)	-	0	-
Cl-11.4(Measurement of temperature coefficients)	-	0	-
Cl-11.5(Measurement of nominal module operating temperature)	-	0	-
Cl-11.6(Performance at STC and NMOT)	-	0	-
Cl-11.7(Performance at low irradiance)	-	0	-
Cl-11.8(Outdoor exposure test)	-	0	-
Cl-11.9(Hot-spot endurance test)	-	0	-
Cl-11.10(UV preconditioning test)	-	0	-
Cl-11.11(Thermal cycling test)	-	0	-
Cl-11.12(Humidity-freeze test)	-	0	-
Cl-11.13(Damp heat test)	-	0	-
Cl-11.14(Robustness of terminations test)	-	0	-
Cl-11.15(Wet leakage current test)	-	0	-
Cl-11.16(Static mechanical load test)	-	0	-
Cl-11.17(Hail test)	-	0	-
Cl-11.18(Bypass diode testing)	-	0	-
Cl-11.19(Stabilization)	-	0	-
5(Marking and documentation)	-	5000	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	120000	-
11.21(Potential induced degradation test (MQT 21))	-	300000	-
11.22(Bending test (MQT 22))	-	20000	-

Complete

20 Jun, 2025

Included w.e.f 05.11.2024

DELHI TEST HOUSE KUNDLI

IS 14286 : Part 1 : Sec 1 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-1: Special requirements for testing of crystalline silicon photovoltaic PV modules Third Revision

2005000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	6000	-
Cl-11.1(Visual inspection)	-	2000	-
Cl-11.2(Maximum power determination)	-	7000	-
Cl-11.3(Insulation test)	-	20000	-
Cl-11.4(Measurement of temperature coefficients)	-	110000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	5000	-
Cl-11.6(Performance at STC)	-	2500	-
Cl-11.7(Performance at low irradiance)	-	10000	-
Cl-11.8(Outdoor exposure test)	-	50000	-
Cl-11.9(Hot-spot endurance test)	-	125000	-
Cl-11.10(UV preconditioning test)	-	125000	-
Cl-11.11(Thermal cycling test)	-	160000	-
Cl-11.12(Humidity-freeze test)	-	80000	-
Cl-11.13(Damp heat test)	-	160000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current tes)	-	25000	-
Cl-11.16(Static mechanical load test)	-	50000	-
Cl-11.17(Hail test)	-	50000	-
Cl-11.18(Bypass diode thermal test)	-	75000	-
Cl-11.19(Stabilization)	-	95000	-
Cl-8(Major visual defects)	-	6000	-
Cl-11.1(Visual inspection)	-	2000	-
Cl-11.2(Maximum power determination)	-	7000	-
Cl-11.3(Insulation test)	-	20000	-
Cl-11.4(Measurement of temperature coefficients)	-	110000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	5000	-
Cl-11.6(Performance at STC)	-	2500	-
Cl-11.7(Performance at low irradiance)	-	10000	-
Cl-11.8(Outdoor exposure test)	-	50000	-
Cl-11.9(Hot-spot endurance test)	-	125000	-
Cl-11.10(UV preconditioning test)	-	125000	-
Cl-11.11(Thermal cycling test)	-	160000	-
Cl-11.12(Humidity-freeze test)	-	80000	-
Cl-11.13(Damp heat test)	-	160000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current tes)	-	25000	-
Cl-11.16(Static mechanical load test)	-	50000	-
Cl-11.17(Hail test)	-	50000	-
Cl-11.18(Bypass diode thermal test)	-	75000	-
Cl-11.19(Stabilization)	-	95000	-
5(Marking and documentation)	-	10000	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	25000	-
11.21(Potential induced degradation test (MQT 21))	-	400000	-
11.22(Bending test (MQT 22))	-	70000	-
Cl-8(Major visual defects)	-	6000	-
Cl-11.1(Visual inspection)	-	2000	-
Cl-11.2(Maximum power determination)	-	7000	-
Cl-11.3(Insulation test)	-	20000	-
Cl-11.4(Measurement of temperature coefficients)	-	110000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	5000	-
Cl-11.6(Performance at STC)	-	2500	-
Cl-11.7(Performance at low irradiance)	-	10000	-
Cl-11.8(Outdoor exposure test)	-	50000	-
Cl-11.9(Hot-spot endurance test)	-	125000	-
Cl-11.10(UV preconditioning test)	-	125000	-
Cl-11.11(Thermal cycling test)	-	160000	-
Cl-11.12(Humidity-freeze test)	-	80000	-
Cl-11.13(Damp heat test)	-	160000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current tes)	-	25000	-
Cl-11.16(Static mechanical load test)	-	50000	-
Cl-11.17(Hail test)	-	50000	-
Cl-11.18(Bypass diode thermal test)	-	75000	-
Cl-11.19(Stabilization)	-	95000	-
5(Marking and documentation)	-	10000	-
11.20(Cyclic (dynamic) mechanical load test (MQT 20))	-	25000	-
11.21(Potential induced degradation test (MQT 21))	-	400000	-
11.22(Bending test (MQT 22))	-	70000	-

Complete

Included w.e.f.26.11.2024

Bharat Test House Pvt Ltd 1474 Haryana

IS 14286 : Part 1 : Sec 4 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-4: Special requirements for testing of thin-film CuInGASSe2 based photovoltaic PV modules Third Revision

1502500 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	6000	-
Cl-11.1(Visual inspection (MQT 01))	-	2000	-
Cl-11.2(Maximum power determination (MQT 02))	-	7000	-
Cl-11.3(Insulation test (MQT 03))	-	20000	-
Cl-11.4(Measurement of temperature coefficients (MQT 04))	-	110000	-
Cl-11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	5000	-
Cl-11.6(Performance at STC (MQT 06.1) and NMOT (MQT 06.2)	-	2500	-
Cl-11.7(Performance at low irradiance (MQT 07))	-	10000	-
Cl-11.8(Outdoor exposure test (MQT 08))	-	50000	-
Cl-11.9(Hot-spot endurance test (MQT 09))	-	125000	-
Cl-11.10(UV preconditioning test (MQT 10))	-	125000	-
Cl-11.11(Thermal cycling test (MQT 11))	-	160000	-
Cl-11.12(As per IEC 61215-1:2016)	-	80000	-
Cl-11.13(Damp heat test (MQT 13))	-	160000	-
Cl-11.14(Robustness of terminations test (MQT 14))	-	15000	-
Cl-11.15(Robustness of terminations test (MQT 14))	-	25000	-
Cl-11.16(Static mechanical load test (MQT 16))	-	50000	-
Cl-11.17(Hail test (MQT 17))	-	50000	-
Cl-11.18(Bypass diode testing (MQT 18))	-	75000	-
Cl-11.19(Stabilization (MQT 19))	-	95000	-

Complete

19 Mar, 2026

Bharat Test House Pvt Ltd 1474 Haryana

IS 14286 : Part 1 : Sec 3 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-3: Special requirements for testing of thin-film amorphous silicon based photovoltaic PV modules Third Revision

1502500 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	6000	-
Cl-11.1(Visual inspection)	-	2000	-
Cl-11.2(Maximum power determination)	-	7000	-
Cl-11.3(Insulation test)	-	20000	-
Cl-11.4(Measurement of temperature coefficients)	-	110000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	5000	-
Cl-11.6(Performance at STC and NMOT)	-	2500	-
Cl-11.7(Performance at low irradiance)	-	10000	-
Cl-11.8(Outdoor exposure test)	-	50000	-
Cl-11.9(Hot-spot endurance test)	-	125000	-
Cl-11.10(UV preconditioning test)	-	125000	-
Cl-11.11(Thermal cycling test)	-	160000	-
Cl-11.12(Humidity-freeze test)	-	80000	-
Cl-11.13(Damp heat test)	-	160000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current test)	-	25000	-
Cl-11.16(Static mechanical load test)	-	50000	-
Cl-11.17(Hail test)	-	50000	-
Cl-11.18(Bypass diode testing)	-	75000	-
Cl-11.19(Stabilization)	-	95000	-

Complete

19 Mar, 2026

Bharat Test House Pvt Ltd 1474 Haryana

IS 14286 : Part 1 : Sec 2 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-2: Special requirements for testing of thin-film Cadmium Telluride CdTe based photovoltaic PV modules Third Revision

Thin-film Cadmium Telluride CdTe based PV Modules

1502500 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	6000	-
Cl-11.1(Visual inspection)	-	2000	-
Cl-11.2(Maximum power determination)	-	7000	-
Cl-11.3(Insulation tes)	-	20000	-
Cl-11.4(Measurement of temperature coefficients)	-	110000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	5000	-
Cl-11.6(Performance at STC and NMOT)	-	2500	-
Cl-11.7(Performance at low irradiance)	-	10000	-
Cl-11.8(Outdoor exposure test)	-	50000	-
Cl-11.9(Hot-spot endurance test)	-	125000	-
Cl-11.10(UV preconditioning test)	-	125000	-
Cl-11.11(Thermal cycling test)	-	160000	-
Cl-11.12(Humidity-freeze test)	-	80000	-
Cl-11.13(Damp heat test)	-	160000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current test)	-	25000	-
Cl-11.16(Static mechanical load test)	-	50000	-
Cl-11.17(Hail test)	-	50000	-
Cl-11.18(Bypass diode testing)	-	75000	-
Cl-11.19(Stabilization)	-	95000	-

Complete

19 Mar, 2026

Bharat Test House Pvt Ltd 1474 Haryana

IS 14286 : Part 1 : Sec 1 (2023)

Terrestrial photovoltaic PV modules Design qualification and type approval Part 1-1: Special requirements for testing of crystalline silicon photovoltaic PV modules Third Revision

1502500 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl-8(Major visual defects)	-	6000	-
Cl-11.1(Visual inspection)	-	2000	-
Cl-11.2(Maximum power determination)	-	7000	-
Cl-11.3(Insulation test)	-	20000	-
Cl-11.4(Measurement of temperature coefficients)	-	110000	-
Cl-11.5(Measurement of nominal module operating temperature)	-	5000	-
Cl-11.6(Performance at STC)	-	2500	-
Cl-11.7(Performance at low irradiance)	-	10000	-
Cl-11.8(Outdoor exposure test)	-	50000	-
Cl-11.9(Hot-spot endurance test)	-	125000	-
Cl-11.10(UV preconditioning test)	-	125000	-
Cl-11.11(Thermal cycling test)	-	160000	-
Cl-11.12(Humidity-freeze test)	-	80000	-
Cl-11.13(Damp heat test)	-	160000	-
Cl-11.14(Robustness of terminations test)	-	15000	-
Cl-11.15(Wet leakage current tes)	-	25000	-
Cl-11.16(Static mechanical load test)	-	50000	-
Cl-11.17(Hail test)	-	50000	-
Cl-11.18(Bypass diode thermal test)	-	75000	-
Cl-11.19(Stabilization)	-	95000	-

Complete

19 Mar, 2026

including w.e.f. 09.10.2024

Mitsui Chemicals India Pvt. Ltd.

IS 14286 : Part 1 : Sec 1 (2019)

Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 1 special requirements for testing of crystalline silicon photovoltaic (Pv) modules (Second Revision)

1298050 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
11.1(Visual inspection (MQT 01))	-	45500	-
11.2(Maximum power determination (MQT 02))	-	45000	-
11.3(Insulation test (MQT 03))	-	10000	-
11.4(Measurement of temperature coefficients (MQT 04))	-	65000	-
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	18200	-
11.6(Performance at STC and NMOT (MQT 06))	-	5000	-
11.7(Performance at low irradiance (MQT 07))	-	5000	-
11.8(Outdoor exposure test (MQT 08))	-	52200	-
11.9(Hot-spot endurance test (MQT 09))	-	36400	-
11.1(UV preconditioning test (MQT 10))	-	36400	-
11.11(Thermal cycling test (MQT 11))	-	400000	-
11.12(Humidity-freeze test (MQT 12))	-	118800	-
11.13(Damp heat test (MQT 13))	-	18000	-
11.14(Robustness of terminations (MQT 14))	-	45500	-
11.15(Wet leakage current test (MQT 15))	-	63800	-
11.16(Static mechanical load test (MQT 16))	-	18200	-
11.17(Hail test (MQT 17))	-	22750	-
11.18(Bypass diode thermal test (MQT 18))	-	42300	-
11.19(Stabilization (MQT 19))	-	250000	-
11.1(Visual inspection (MQT 01))	-	45500	-
11.2(Maximum power determination (MQT 02))	-	45000	-
11.3(Insulation test (MQT 03))	-	10000	-
11.4(Measurement of temperature coefficients (MQT 04))	-	65000	-
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	18200	-
11.6(Performance at STC and NMOT (MQT 06))	-	5000	-
11.7(Performance at low irradiance (MQT 07))	-	5000	-
11.8(Outdoor exposure test (MQT 08))	-	52200	-
11.9(Hot-spot endurance test (MQT 09))	-	36400	-
11.1(UV preconditioning test (MQT 10))	-	36400	-
11.11(Thermal cycling test (MQT 11))	-	400000	-
11.12(Humidity-freeze test (MQT 12))	-	118800	-
11.13(Damp heat test (MQT 13))	-	18000	-
11.14(Robustness of terminations (MQT 14))	-	45500	-
11.15(Wet leakage current test (MQT 15))	-	63800	-
11.16(Static mechanical load test (MQT 16))	-	18200	-
11.17(Hail test (MQT 17))	-	22750	-
11.18(Bypass diode thermal test (MQT 18))	-	42300	-
11.19(Stabilization (MQT 19))	-	250000	-
5(Marking and documentation)	-	0	-
8(Major visual defects)	-	0	-
5(Marking and documentation)	-	0	-
8(Major visual defects)	-	0	-
11.1(Visual inspection (MQT 01))	-	-	-
11.2(Maximum power determination (MQT 02))	-	-	-
11.3(Insulation test (MQT 03))	-	-	-
11.4(Measurement of temperature coefficients (MQT 04))	-	-	-
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	-	-
11.6(Performance at STC and NMOT (MQT 06))	-	-	-
11.7(Performance at low irradiance (MQT 07))	-	-	-
11.8(Outdoor exposure test (MQT 08))	-	-	-
11.9(Hot-spot endurance test (MQT 09))	-	-	-
11.1(UV preconditioning test (MQT 10))	-	-	-
11.11(Thermal cycling test (MQT 11))	-	-	-
11.12(Humidity-freeze test (MQT 12))	-	-	-
11.13(Damp heat test (MQT 13))	-	-	-
11.14(Robustness of terminations (MQT 14))	-	-	-
11.15(Wet leakage current test (MQT 15))	-	-	-
11.16(Static mechanical load test (MQT 16))	-	-	-
11.17(Hail test (MQT 17))	-	-	-
11.18(Bypass diode thermal test (MQT 18))	-	-	-
11.19(Stabilization (MQT 19))	-	-	-
5(Marking and documentation)	-	-	-
8(Major visual defects)	-	-	-

Complete

02 Dec, 2026

Mitsui Chemicals India Pvt. Ltd.

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

Solar Photovoltaic Modules

1280550 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
4(Marking)	-	50000	-
10.1(Visual inspection)	-	39033	-
10.2(Maximum power determination)	-	49662	-
10.3(Insulation test)	-	20840	-
10.4(Measurement of temperature coefficients)	-	65000	-
10.5(Measurement of NOCT)	-	38200	-
10.6(Performance at STC and NOCT)	-	49662	-
10.7(Performance at low irradiance)	-	7500	-
10.8(Outdoor exposure test)	-	52200	-
10.9(Hot-spot endurance test)	-	33318	-
10.10(UV preconditioning)	-	36400	-
10.11(Thermal cycling test)	-	372400	-
10.12(Humidity freeze test)	-	136400	-
10.13(Damp heat test)	-	318000	-
10.14(Robustness of termination test)	-	45500	-
10.15(Wet leakage current test)	-	163800	-
10.16(Mechanical load test)	-	38200	-
10.17(Hail test)	-	22750	-
10.18(Bypass diode thermal' test)	-	42300	-

Complete

02 Dec, 2026

URS PRODUCTS AND TESTING PVT. LTD.

IS 14286 : Part 1 : Sec 1 (2019)

930000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
5(Marking and documentation)	-	2000	-
8(Major visual defects)	-	5000	-
11.1(Visual inspection (MQT 01))	-	15000	-
11.2(Maximum power determination (MQT 02))	-	25000	-
11.3(Insulation test (MQT 03))	-	25000	-
11.4(Measurement of temperature coefficients (MQT 04))	-	25000	-
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	30000	-
11.6(Performance at STC and NMOT (MQT 06))	-	35000	-
11.7(Performance at low irradiance (MQT 07))	-	25000	-
11.8(Outdoor exposure test (MQT 08))	-	25000	-
11.9(Hot-spot endurance test (MQT 09))	-	40000	-
11.1(UV preconditioning test (MQT 10))	-	75000	-
11.11(Thermal cycling test (MQT 11))	-	175000	-
11.12(Humidity-freeze test (MQT 12))	-	93000	-
11.13(Damp heat test (MQT 13))	-	150000	-
11.14(Robustness of terminations (MQT 14))	-	20000	-
11.15(Wet leakage current test (MQT 15))	-	25000	-
11.16(Static mechanical load test (MQT 16))	-	55000	-
11.17(Hail test (MQT 17))	-	25000	-
11.18(Bypass diode thermal test (MQT 18))	-	35000	-
11.19(Stabilization (MQT 19))	-	25000	-
5(Marking and documentation)	-	-	-
8(Major visual defects)	-	-	-
11.1(Visual inspection (MQT 01))	-	-	-
11.2(Maximum power determination (MQT 02))	-	-	-
11.3(Insulation test (MQT 03))	-	-	-
11.4(Measurement of temperature coefficients (MQT 04))	-	-	-
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	-	-
11.6(Performance at STC and NMOT (MQT 06))	-	-	-
11.7(Performance at low irradiance (MQT 07))	-	-	-
11.8(Outdoor exposure test (MQT 08))	-	-	-
11.9(Hot-spot endurance test (MQT 09))	-	-	-
11.1(UV preconditioning test (MQT 10))	-	-	-
11.11(Thermal cycling test (MQT 11))	-	-	-
11.12(Humidity-freeze test (MQT 12))	-	-	-
11.13(Damp heat test (MQT 13))	-	-	-
11.14(Robustness of terminations (MQT 14))	-	-	-
11.15(Wet leakage current test (MQT 15))	-	-	-
11.16(Static mechanical load test (MQT 16))	-	-	-
11.17(Hail test (MQT 17))	-	-	-
11.18(Bypass diode thermal test (MQT 18))	-	-	-
11.19(Stabilization (MQT 19))	-	-	-

Complete

26 Sep, 2024

Included w.e.f. 20.12.2023

URS PRODUCTS AND TESTING PVT. LTD.

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

900000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
4(Marking)	-	2000	-
10.1(Visual inspection)	-	15000	-
10.2(Maximum power determination)	-	25000	-
10.3(Insulation test)	-	25000	-
10.4(Measurement of temperature coefficients)	-	25000	-
10.5(Measurement of NOCT)	-	30000	-
10.6(Performance at STC and NOCT)	-	35000	-
10.7(Performance at low irradiance)	-	25000	-
10.8(Outdoor exposure test)	-	25000	-
10.9(Hot-spot endurance test)	-	40000	-
10.10(UV preconditioning)	-	75000	-
10.11(Thermal cycling test)	-	175000	-
10.12(Humidity freeze test)	-	93000	-
10.13(Damp heat test)	-	150000	-
10.14(Robustness of termination test)	-	20000	-
10.15(Wet leakage current test)	-	25000	-
10.16(Mechanical load test)	-	55000	-
10.17(Hail test)	-	25000	-
10.18(Bypass diode thermal' test)	-	35000	-

Complete

26 Sep, 2024

Included w.e.f. 20.12.2023

Bharat Test House Pvt Ltd 1474 Haryana

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

Crystalline Silicon Terrestrial Photovoltaic Module

700000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
4(Marking)	-	0	NA
10.1(Visual inspection)	-	2000	5% discount for BIS
10.2(Maximum power determination)	-	5000	5% discount for BIS
10.3(Insulation test)	-	3000	5% discount for BIS
10.4(Measurement of temperature coefficients)	-	10000	5% discount for BIS
10.5(Measurement of NOCT)	-	5000	5% discount for BIS
10.6(Performance at STC and NOCT)	-	9000	5% discount for BIS
10.7(Performance at low irradiance)	-	5000	5% discount for BIS
10.8(Outdoor exposure test)	-	8000	5% discount for BIS
10.9(Hot-spot endurance test)	-	10000	5% discount for BIS
10.10(UV preconditioning)	-	55000	5% discount for BIS
10.11(Thermal cycling test)	-	255000	5% discount for BIS
10.12(Humidity freeze test)	-	95000	5% discount for BIS
10.13(Damp heat test)	-	200000	5% discount for BIS
10.14(Robustness of termination test)	-	5000	5% discount for BIS
10.15(Wet leakage current test)	-	6000	5% discount for BIS
10.16(Mechanical load test)	-	12000	5% discount for BIS
10.17(Hail test)	-	8000	5% discount for BIS
10.18(Bypass diode thermal' test)	-	7000	5% discount for BIS

Complete

19 Mar, 2026

Bharat Test House Pvt Ltd 1474 Haryana

IS 14286 : Part 1 : Sec 2 (2019)

Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 2 special requirements for testing of thin - Film cadmium telluride (CdTe) based photovoltaic (Pv) modules (Second Revision)

Terrestrial Photovoltaic (PV) Modules

750000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
11.19(Stabilization (MQT 19))	-	42500	5% discount for BIS
11.18(Bypass diode thermal test (MQT 18))	-	27500	5% discount for BIS
11.19 IS 14286( Stabilization )	-	42500	5% discount for BIS
11.18 IS 14286( Bypass diode testing)	-	27500	5% discount for BIS
11.17, Table 3 & 4, IS 14286( Hail test)	-	52500	5% discount for BIS
11.16 IS 14286( Static Mechanical load test)	-	25000	5% discount for BIS
11.15 IS 14286( Wet leakage current test)	-	25000	5% discount for BIS
11.14, Table 1 IS 14286( Robutness of terminations test - Retention of Junction Box on Mounting Surface - Test of Cord Anchorage)	-	20000	5% discount for BIS
11.13 IS 14286(Damp heat test)	-	42500	5% discount for BIS
11.12 IS 14286( Humidity-freeze test)	-	57500	5% discount for BIS
11.11 IS 14286( Thermal cycling test)	-	50000	5% discount for BIS
11.10 IS 14286( UV Preconditioning test )	-	37500	5% discount for BIS
11.9 IS 14286( Hot-spot endurance test)	-	80000	5% discount for BIS
11.8 IS 14286( Outdoor exposure Test)	-	32500	5% discount for BIS
11.7 IS 14286( Performance at low irradiance)	-	57500	5% discount for BIS
11.6 IS 14286( Performance at STC and NMOT)	-	60000	5% discount for BIS
11.5 IS 14286( Measurement of nominal module operating temperature (NMOT))	-	55000	5% discount for BIS
11.4 IS 14286( Measurement of temperature coefficients)	-	55000	5% discount for BIS
11.3 IS 14286( Insulation Test)	-	15000	5% discount for BIS
11.2 IS 14286( Maximum power determination)	-	7500	5% discount for BIS
11.1 IS 14286( Visual inspection)	-	7500	5% discount for BIS
5 IS 14286( Marking and Documentation)	-	0	5% discount for BIS

Complete

19 Mar, 2026

Electrical Research and Development Association, gujurat

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

963359 View breakup
Rs. 9,63,359/- (For complete testing)

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
10.1(Visual inspection)	-	9217	-
10.2(Maximum power determination)	-	28173	-
10.3(Insulation test)	-	4488	-
4(Marking)	-	0	-
10.4(Measurement of temperature coefficients)	-	32669	-
10.5(Measurement of NOCT)	-	52133	-
10.6(Performance at STC and NOCT)	-	28173	-
10.7(Performance at low irradiance)	-	5245	-
10.8(Outdoor exposure test)	-	66472	-
10.9(Hot-spot endurance test)	-	61005	-
10.10(UV preconditioning)	-	47327	-
10.11(Thermal cycling test)	-	272058	-
10.12(Humidity freeze test)	-	96055	-
10.13(Damp heat test)	-	107667	-
10.14(Robustness of termination test)	-	19176	-
10.15(Wet leakage current test)	-	9507	-
10.16(Mechanical load test)	-	38498	-
10.17(Hail test)	-	42422	-
10.18(Bypass diode thermal' test)	-	43074	-

Complete

Included w.e.f. 05.12.2023

Central Power Research Institute (CPRI), Bangalore

IS 14286 : Part 1 : Sec 1 (2019)

1295440 View breakup
-

Clause No.	Exclusion	Remark
11.1(Visual inspection (MQT 01))	-	Individual charge not available
11.2(Maximum power determination (MQT 02))	-	Individual charge not available
11.3(Insulation test (MQT 03))	-	Individual charge not available
11.4(Measurement of temperature coefficients (MQT 04))	-	Individual charge not available
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	Individual charge not available
11.6(Performance at STC and NMOT (MQT 06))	-	Individual charge not available
11.7(Performance at low irradiance (MQT 07))	-	Individual charge not available
11.8(Outdoor exposure test (MQT 08))	-	Individual charge not available
11.9(Hot-spot endurance test (MQT 09))	-	Individual charge not available
11.1(UV preconditioning test (MQT 10))	-	Individual charge not available
11.11(Thermal cycling test (MQT 11))	-	Individual charge not available
11.12(Humidity-freeze test (MQT 12))	-	Individual charge not available
11.13(Damp heat test (MQT 13))	-	Individual charge not available
11.14(Robustness of terminations (MQT 14))	-	Individual charge not available
11.15(Wet leakage current test (MQT 15))	-	Individual charge not available
11.16(Static mechanical load test (MQT 16))	-	Individual charge not available
11.17(Hail test (MQT 17))	-	Individual charge not available
11.18(Bypass diode thermal test (MQT 18))	-	Individual charge not available
11.19(Stabilization (MQT 19))	-	Individual charge not available
5(Marking and documentation)	-	Individual charge not available
8(Major visual defects)	-	Individual charge not available

Complete

Included w.e.f 16.05.2024

DELHI TEST HOUSE KUNDLI

IS 14286 : Part 1 : Sec 1 (2019)

700000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
11.1(Visual inspection (MQT 01))	-	20000	-
11.2(Maximum power determination (MQT 02))	-	20000	-
11.3(Insulation test (MQT 03))	-	10000	-
11.4(Measurement of temperature coefficients (MQT 04))	-	30000	-
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	30000	-
11.6(Performance at STC and NMOT (MQT 06))	-	30000	-
11.7(Performance at low irradiance (MQT 07))	-	30000	-
11.8(Outdoor exposure test (MQT 08))	-	30000	-
11.9(Hot-spot endurance test (MQT 09))	-	45000	-
11.1(UV preconditioning test (MQT 10))	-	30000	-
11.11(Thermal cycling test (MQT 11))	-	70000	-
11.12(Humidity-freeze test (MQT 12))	-	85000	-
11.13(Damp heat test (MQT 13))	-	100000	-
11.14(Robustness of terminations (MQT 14))	-	20000	-
11.15(Wet leakage current test (MQT 15))	-	20000	-
11.16(Static mechanical load test (MQT 16))	-	30000	-
11.17(Hail test (MQT 17))	-	30000	-
11.18(Bypass diode thermal test (MQT 18))	-	40000	-
11.19(Stabilization (MQT 19))	-	30000	-

Complete

DELHI TEST HOUSE KUNDLI

IS 14286 : Part 1 (2019)

Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements (Second Revision)

1100000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
11(Test flow and procedures)	-	100000	-
5(Marking and documentation)	-	100000	-
7(Pass criteria)	-	300000	-
6(Testing)	-	100000	-
8(Major visual defects)	-	200000	-
8(Major visual defects)	-	200000	-
9(Report)	-	150000	-
10(Modifications)	-	150000	-

Complete

DELHI TEST HOUSE KUNDLI

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

750000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
10.1(Visual inspection)	-	4000.0	--
10.2(Maximum power determination)	-	20000	-
10.3(Insulation test)	-	5000	-
10.4(Measurement of temperature coefficients)	-	20000	-
10.5(Measurement of NOCT)	-	20000	-
10.6(Performance at STC and NOCT)	-	15000	-
10.7(Performance at low irradiance)	-	15000	-
10.8(Outdoor exposure test)	-	35000	-
10.9(Hot-spot endurance test)	-	20000	-
10.10(UV preconditioning)	-	20000	-
10.11(Thermal cycling test)	-	200000	-
10.12(Humidity freeze test)	-	120000	-
10.13(Damp heat test)	-	220000	-
10.14(Robustness of termination test)	-	5000	-
10.15(Wet leakage current test)	-	5000	-
10.16(Mechanical load test)	-	15000	-
10.17(Hail test)	-	5000	-
10.18(Bypass diode thermal' test)	-	5000	-
4(Marking)	-	1000	-

Complete

Hi Physix Laboratory India Private Limited

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

740000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
4(Marking)	-	0	-
10.1(Visual inspection)	-	5000	-
10.2(Maximum power determination)	-	10000	-
10.3(Insulation test)	-	5000	-
10.4(Measurement of temperature coefficients)	-	20000	-
10.5(Measurement of NOCT)	-	20000	-
10.6(Performance at STC and NOCT)	-	20000	-
10.7(Performance at low irradiance)	-	10000	-
10.8(Outdoor exposure test)	-	30000	-
10.9(Hot-spot endurance test)	-	50000	-
10.10(UV preconditioning)	-	100000	-
10.11(Thermal cycling test)	-	150000	-
10.12(Humidity freeze test)	-	100000	-
10.13(Damp heat test)	-	150000	-
10.14(Robustness of termination test)	-	5000	-
10.15(Wet leakage current test)	-	5000	-
10.16(Mechanical load test)	-	20000	-
10.17(Hail test)	-	10000	-
10.18(Bypass diode thermal' test)	-	30000	-

Complete

20 Jun, 2025

Hi Physix Laboratory India Private Limited

IS 14286 : Part 1 : Sec 1 (2019)

1315000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
11.1(Visual inspection (MQT 01))	-	5000	-
11.2(Maximum power determination (MQT 02))	-	10000	-
11.3(Insulation test (MQT 03))	-	5000	-
11.4(Measurement of temperature coefficients (MQT 04))	-	60000	-
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	20000	-
11.6(Performance at STC and NMOT (MQT 06))	-	80000	-
11.7(Performance at low irradiance (MQT 07))	-	30000	-
11.8(Outdoor exposure test (MQT 08))	-	30000	-
11.9(Hot-spot endurance test (MQT 09))	-	200000	-
11.1(UV preconditioning test (MQT 10))	-	100000	-
11.11(Thermal cycling test (MQT 11))	-	250000	-
11.12(Humidity-freeze test (MQT 12))	-	100000	-
11.13(Damp heat test (MQT 13))	-	150000	-
11.14(Robustness of terminations (MQT 14))	-	10000	-
11.15(Wet leakage current test (MQT 15))	-	5000	-
11.16(Static mechanical load test (MQT 16))	-	20000	-
11.17(Hail test (MQT 17))	-	10000	-
11.18(Bypass diode thermal test (MQT 18))	-	80000	-
11.19(Stabilization (MQT 19))	-	150000	-

Complete

20 Jun, 2025

Including testing of IS 14286 (Part 1& 2):2019

Hi Physix Laboratory India Private Limited

IS 14286 : Part 1 : Sec 2 (2019)

1465000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
5 IS 14286( Marking and Documentation)	-	0	-
11.1 IS 14286( Visual inspection)	-	5000	-
11.2 IS 14286( Maximum power determination)	-	10000	-
11.3 IS 14286( Insulation Test)	-	5000	-
11.4 IS 14286( Measurement of temperature coefficients)	-	60000	-
11.5 IS 14286( Measurement of nominal module operating temperature (NMOT))	-	20000	-
11.6 IS 14286( Performance at STC and NMOT)	-	80000	-
11.7 IS 14286( Performance at low irradiance)	-	30000	-
11.8 IS 14286( Outdoor exposure Test)	-	30000	-
11.9 IS 14286( Hot-spot endurance test)	-	200000	-
11.10 IS 14286( UV Preconditioning test )	-	100000	-
11.11 IS 14286( Thermal cycling test)	-	250000	-
11.12 IS 14286( Humidity-freeze test)	-	100000	-
11.13 IS 14286(Damp heat test)	-	150000	-
11.14, Table 1 IS 14286( Robutness of terminations test - Retention of Junction Box on Mounting Surface - Test of Cord Anchorage)	-	10000	-
11.15 IS 14286( Wet leakage current test)	-	5000	-
11.16 IS 14286( Static Mechanical load test)	-	20000	-
11.17, Table 3 & 4, IS 14286( Hail test)	-	10000	-
11.18 IS 14286( Bypass diode testing)	-	80000	-
11.19 IS 14286( Stabilization )	-	300000	-

Complete

20 Jun, 2025

Including testing of IS 14286 (Part 1& 2):2019

Hi Physix Laboratory India Private Limited

IS 14286 : Part 1 : Sec 3 (2019)

Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 3 special requirements for testing of thin - Film amorphous silicon based photovoltaic (Pv) modules (Second Revision)

1465000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
5 IS 14286( Marking and Documentation)	-	0	-
11.1 IS 14286( Visual inspection)	-	5000	-
11.2 IS 14286( Maximum power determination)	-	10000	-
11.3 IS 14286( Insulation Test)	-	5000	-
11.4 IS 14286( Measurement of temperature coefficients)	-	60000	-
11.5 IS 14286( Measurement of nominal module operating temperature (NMOT))	-	20000	-
11.6 IS 14286( Performance at STC and NMOT)	-	80000	-
11.7 IS 14286( Performance at low irradiance)	-	30000	-
11.8 IS 14286( Outdoor exposure Test)	-	30000	-
11.9 IS 14286( Hot-spot endurance test)	-	200000	-
11.10 IS 14286( UV Preconditioning test )	-	100000	-
11.11 IS 14286( Thermal cycling test)	-	250000	-
11.12 IS 14286( Humidity-freeze test)	-	100000	-
11.13 IS 14286(Damp heat test)	-	150000	-
11.14, Table 1 IS 14286( Robutness of terminations test - Retention of Junction Box on Mounting Surface - Test of Cord Anchorage)	-	10000	-
11.15 IS 14286( Wet leakage current test)	-	5000	-
11.16 IS 14286( Static Mechanical load test)	-	20000	-
11.17, Table 3 & 4, IS 14286( Hail test)	-	10000	-
11.18 IS 14286( Bypass diode testing)	-	80000	-
11.19(Stabilization (MQT 19))	-	300000	-

Complete

20 Jun, 2025

Including testing of IS 14286 (Part 1& 2):2019

Hi Physix Laboratory India Private Limited

IS 14286 : Part 1 : Sec 4 (2019)

Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements: Sec 4 special requirements for testing of thin - Film Cu(In,ga)(S,se)2 based photovoltaic (Pv) modules (Second Revision)

1465000 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
11.3(Insulation test (MQT 03))	-	5000	-
11.4(Measurement of temperature coefficients (MQT 04))	-	60000	-
11.5(Measurement of nominal module operating temperature (NMOT) (MQT 05))	-	20000	-
11.6(Performance at STC and NMOT (MQT 06))	-	80000	-
11.7(Performance at low irradiance (MQT 07))	-	30000	-
11.8(Outdoor exposure test (MQT 08))	-	30000	-
11.9(Hot-spot endurance test (MQT 09))	-	200000	-
11.1(UV preconditioning test (MQT 10))	-	100000	-
11.11(Thermal cycling test (MQT 11))	-	250000	-
11.12(Humidity-freeze test (MQT 12))	-	100000	-
11.13(Damp heat test (MQT 13))	-	150000	-
11.14(Robustness of terminations (MQT 14))	-	10000	-
11.15(Wet leakage current test (MQT 15))	-	5000	-
11.16(Static mechanical load test (MQT 16))	-	20000	-
11.17(Hail test (MQT 17))	-	10000	-
11.18(Bypass diode thermal test (MQT 18))	-	80000	-
11.19(Stabilization (MQT 19))	-	300000	-

Complete

20 Jun, 2025

Including testing of IS 14286 (Part 1& 2):2019

Central Power Research Institute (CPRI), Bangalore

IS 14286 : Part 1 (2019)

Terrestrial photovoltaic (PV) modules - Design qualification and type approval: Part 1 test requirements (Second Revision)

SOLAR PHOTOVOLTAIC MODULE

1175000 View breakup
-

Clause No.	Exclusion	Remark
5(Marking and documentation)	-	The complete test charges will be provided through a proforma invoice.
6(Testing)	-	The complete test charges will be provided through a proforma invoice.
7(Pass criteria)	-	The complete test charges will be provided through a proforma invoice.
8(Major visual defects)	-	The complete test charges will be provided through a proforma invoice.
8(Major visual defects)	-	The complete test charges will be provided through a proforma invoice.
9(Report)	-	The complete test charges will be provided through a proforma invoice.
10(Modifications)	-	The complete test charges will be provided through a proforma invoice.
11(Test flow and procedures)	-	The complete test charges will be provided through a proforma invoice.

Complete

Included w.e.f, 23/04/2020

National Institute of Solar Energy Gurugram

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

- View breakup
Rs.11,20,000/-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Effective Date	Remark
No Record Found

Complete

(Lab of national repute and eminence, facilities of which are being utilized by BIS.)

Bureau of Indian Standards

The National Standards Body of India

Search by IS Number

No Record Found