BIS - LIMS (Laboratory Information Management System)

Electrical Research and Development Association, gujarat

ERDA Road, GIDC, Makarpura, Vadodara, VADODARA, Vadodara, Gujarat, 390010

9987940719 uday.puntambekar@erda.org

Scope List

Reset

154 Results

S.No.

Indian Standard No.

Product

Grade / Type / Size / Designation etc.

Exclusion

Testing Charges (Excl. Of Taxes)

Facility Type

Effective Date

Validity Date

Remark

151

IS 1180 : Part 1 (2014)

Outdoor Type Oil Immersed Distribution Transformers Upto and Including 2 500 kVA, 33kV - Specification Part 1 Mineral Oil Immersed (Fourth Revision)

DISTRIBUTON TRANSFORMER

203805 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
21.2 b)( Measurement of voltage ratio and check of phase displacemen)	-	800	Test charges for subsequent tap Rs. 400
14.1(MOUNTING ARRANGEMENT)	-	800	-
14.2(MOUNTING ARRANGEMENT)	-	800	-
14.3(MOUNTING ARRANGEMENT)	-	800	-
14.4(MOUNTING ARRANGEMENT)	-	800	-
21.2 a)(Measurement of winding resistance )	-	600	Test charges for subsequent tap Rs. 300
21.2 c)( Measurement of short-circuit impedance (principal tapping, when applicable) and load loss at 50 percent and 100 percent load)	-	3750	Test charges for subsequent tap Rs. 2500
21.2 d)(Measurement of no-load loss and current)	-	2500	Test charges for subsequent tap Rs. 1250
21.2 e)(Measurement of insulation resistance)	-	500	Test charges for subsequent tap Rs. 500
21.3(b)(Temperature-rise test)	-	15000	-
21.2 f)(Induced over-voltage withstand test)	-	1000	Test charges for subsequent tap Rs. 1000
21.2 g)( Separate-source voltage withstand test)	-	1000	Test charges for subsequent tap Rs. 1000
21.3(c)(Short-circuit withstand test)	-	59800	Test charges may vary as per KVA rating. Given charges upto 250 KVA, 11 KV.
21.5.1.1(Pressure test-Type test (For Transformers up to 200 kVA ))	-	6000	-
21.5.1.2(Pressure test-routine test (For Transformers up to 200 kVA ))	-	6000	-
21.5.2.1(Type test : For Transformers Above 200 kVA and Up to Including 2 500 kVA)	-	6000	-
21.5.2.2(routine test :For Transformers Above 200 kVA and Up to Including 2 500 kVA)	-	6000	-
21.5.2.3( Oil leakage test (routine test))	-	5000	-
21.5.3.1(For Single Phase Distribution Transformers Up to Including 25 kVA : pressure test (type test))	-	6000	-
21.5.3.2(For Single Phase Distribution Transformers Up to Including 25 kVA : pressure test (routine test))	-	6000	-
21.5.3.3(Oil leakage test (routine test))	-	5000	-
15.5(Total Dry Film Paint Thickness)	-	3000	-
21.4 e(BDV and moisture content of oil in the transformer)	-	3000	-
21.4 d(Paint adhesion tests)	-	3000	-
6.9, 7.9, 8.9(Permissible Flux Density and Over Fluxing)	-	5000	-
21.4 c(No load current at 112.5 percent voltage.)	-	1600	Test charges for subsequent tap Rs. 800
11(Minimum clearance in Air)	-	1000	-
16(Conservator for Non-sealed type Transformers)	-	800	-
20(Fittings)	-	800	-
21.3(a )(Lightning impulse test)	-	33000	Charges given for above 250 KVA to 500 KVA. so test charges vary by rating of transformer
21.4 b(Short-circuit withstand test IS 2026 (Part 5) (above 200 kVA))	-	78200	-
21.4 a)( Determination of sound levels)	-	2275	Additional tap - 2275
6.8 (50%)(Total losses at 50 % load (Watts))	-	0	-
7.8 (50%)(Total losses at 50 % load (Watts))	-	0	-
8.8 (50%)(Total losses at 50 % load (Watts))	-	0	-
6.8 (100%)(Total losses at 100 % load (Watts))	-	0	-
7.8 (100%)(Total losses at 100 % load (Watts))	-	0	-
8.8 (100%)(Total losses at 100 % load (Watts))	-	0	-
21.5.1.3(Oil leakage test upto 200 KVA)	-	5000	-

Complete

30 Nov, 2025

-
-

152

IS 14286 (2010)

Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval (First Revision)

963359 View breakup
Rs. 9,63,359/- (For complete testing)

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
10.1(Visual inspection)	-	9217	-
10.2(Maximum power determination)	-	28173	-
10.3(Insulation test)	-	4488	-
4(Marking)	-	0	-
10.4(Measurement of temperature coefficients)	-	32669	-
10.5(Measurement of NOCT)	-	52133	-
10.6(Performance at STC and NOCT)	-	28173	-
10.7(Performance at low irradiance)	-	5245	-
10.8(Outdoor exposure test)	-	66472	-
10.9(Hot-spot endurance test)	-	61005	-
10.10(UV preconditioning)	-	47327	-
10.11(Thermal cycling test)	-	272058	-
10.12(Humidity freeze test)	-	96055	-
10.13(Damp heat test)	-	107667	-
10.14(Robustness of termination test)	-	19176	-
10.15(Wet leakage current test)	-	9507	-
10.16(Mechanical load test)	-	38498	-
10.17(Hail test)	-	42422	-
10.18(Bypass diode thermal' test)	-	43074	-

Complete

30 Nov, 2025

-
Included w.e.f. 05.12.2023

153

IS/IEC 60947 : Part 2 (2016)

Low - Voltage switchgear and controlgear: Part 2 circuit - Breakers (First Revision)

4744707 View breakup
Test sequence – I (Up to 200A AC)= Rs. 1,15,850/- Test sequence – I (201 to 1000A AC)= Rs. 1,46,185/- Test sequence – I (1001 to 2000A AC)= Rs. 1,77,494/- Test sequence – I (2001 to 6300A AC)= Rs. 7,31,815/- Test sequence – I (Up to 100A AC)= Rs. 1,89,725/- Test sequence – I (101 to 315A DC)= Rs. 1,99,525/- Test sequence – I (3016 to 630A DC)= Rs. 2,04,525/- Test sequence – I (631 to 2000A DC)=Rs. 2,27,425/- Test sequence – II (Up to 50kA)= Rs. 1,81,524/- Test sequence – II (Above 50kA to 80kA)= Rs. 2,31,032/- Test sequence – II (Above 80kA to 120kA)= Rs. 4,55,282/- Test sequence – III (Up to 50kA)= Rs. 1,85,089/- Test sequence – III (Above 50kA to 80kA)= Rs. 2,18,094/- Test sequence – III (Above 80kA to 120kA)= Rs. 3,67,594/- Test sequence – IV (Up to 50kA)= Rs. 3,16,476/- Test sequence – IV (Above 50kA to 80kA)=Rs. 3,96,344/- Test sequence – IV (Above 80kA to 120kA)= Rs. 7,17,194/- Test sequence – V (Up to 50kA)= Rs. 3,32,228/- Test sequence – V (Above 50kA to 80kA)= Rs. 3,98,238/- Test sequence – V (Above 80kA to 120kA)= Rs. 6,97,238/- Test sequence – VI (Up to 50kA)= Rs. 3,50,861/- Test sequence – VI (Above 50kA to 80kA)= Rs. 4,47,232/- Test sequence – VI (Above 80kA to 120kA)= Rs. 8,42,832/- Routine Test= Rs. 67,757/- Annexure B= Rs. 65,838/- Annexure C (Up to 50kA)= Rs. 93,779/- Annexure C (Above 50kA to 80kA)= Rs. 1,10,282/- Annexure C (Above 80kA to 120kA)= Rs. 1,85,032/- Annexure H (Up to 50kA)= Rs. 69,593/- Annexure H (Above 50kA to 80kA)= Rs. 1,02,599/- Annexure H (Above 80kA to 120kA)= Rs. 2,52,098/- Annexure J= Rs. 1,30,400/-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
8.3.3.2(Tripping limits and characteristics)	-	52434	AC Breaker: Rs.30993: Upto 200A,Rs.36685:201A-1000A,Rs.45540:1001-2000A,Rs.52434:2001-6300A DC Breaker:Rs.38300:upto 2000A
8.3.3.3(Test of dielectric properties)	-	17400	AC Breaker: Rs. 11315 DC Breaker: Rs.17400
8.3.3.4(Mechanical operation and operational performance capability)	-	317173	AC Breaker: Rs.21796: Upto 200A,Rs.36343:201A-1000A,Rs.51523:1001-2000A,Rs.317173:2001-6300A DC Breaker:Rs.37100:upto 100A,Rs.40700:101A-315A,Rs.46400:316A-630A,Rs.66900:631A-1500A
8.3.3.5(Overload performance)	-	309925	AC Breaker: Rs.44275 per shift : Upto 2000A,Rs.309925:2001A-6300A DC Breaker:Rs.44275 per shift:upto 2000A
8.3.3.6(Verification of dielectric withstand)	-	6500	AC Breaker: Rs. 550 DC Breaker; Rs. 6500
8.3.3.7(Verification of temperature-rise)	-	18975	AC Breaker: Rs.3542: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.12200:upto 200A,Rs.13800:201A-1000A,Rs.16600:1001A-2000A
8.3.3.8(Verification of Overload releases)	-	18975	AC Breaker: Rs.911: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.9700:upto 2000A
8.3.3.9(Verification of undervoltage and shunt releases)	-	6900	AC Breaker: Rs. 1233 DC Breaker: Rs. 6900
8.3.3.10(Verification of main contact position)	-	6900	AC Breaker: Rs. 1233 DC Breaker: Rs. 6900
B.8.2(Operating characteristics)	-	16445	For one sample only
B.8.3(Dielectric Properties)	-	11315	For one sample only
B.8.4(Operation of the test device at the limits of rated voltage)	-	2404	For one sample and one setting only
B.8.5(Limiting value of the non-operating current under over-current conditions)	-	7843	1) For one sample only 2) For Functionally Independent of line voltage only
B.8.6(Resistance against unwanted tripping due to surge currents resulting from impulse voltage)	-	14548	For one sample only
B.8.7(Behavior in the case of an earth fault current comprising a d.c. component)	-	13283	For one sample only
8.4.2(Mechanical operation tests)	-	2900	-
8.4.3(Verification of the calibration of overcurrent releases)	-	36053	AC Breaker: Rs.18343:Upto 200A, Rs. 29728:201A-1000A, Rs. 36053: 1001A-2000A, Rs. 39784:2001A-6300A DC Breaker: Rs.29100: Upto 2000A
8.4.4(Verification of the operation of undervoltage and shunt releases)	-	6900	AC Breaker: Rs. 1233 DC Breaker: Rs. 6900
8.4.5(Additional tests for CBRs)	-	2404	-
8.4.6(Dielectric tests)	-	17400	AC Breaker: Rs. 11315 DC Breaker: Rs. 17400
8.4.7(Test for the verifiacation of clearances less than those corresponding to case A of Table 13 of IEC 60947-1:2007)	-	2100	AC Breaker: Rs. 727 DC Breaker: Rs. 2100
8.3.4.4(Verification of dielectric withstand)	-	3300	AC Breaker: Rs. 550 DC Breaker: Rs.3300
8.3.5.4(Verification of dielectric withstand)	-	3300	AC Breaker: Rs. 550 DC Breaker: Rs.3300
8.3.6.6(Verification of dielectric withstand)	-	3300	AC Breaker: Rs. 550 DC Breaker: Rs.3300
8.3.7.4(Verification of dielectric withstand)	-	3300	AC Breaker: Rs. 550 DC Breaker: Rs.3300
8.3.7.8(Verification of dielectric withstand)	-	3300	AC Breaker: Rs. 550 DC Breaker: Rs.3300
8.3.8.6(Verification of dielectric withstand)	-	3300	AC Breaker: Rs. 550 DC Breaker: Rs.3300
8.3.4.5(Verifiation of temperature-rise)	-	18975	AC Breaker: Rs.3542: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.12200:upto 200A,Rs.13800:201A-1000A,Rs.16600:1001A-2000A
8.3.6.4(Verification of temperature-rise)	-	18975	AC Breaker: Rs.3542: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.12200:upto 200A,Rs.13800:201A-1000A,Rs.16600:1001A-2000A
8.3.7.3(Verification of temperature-rise)	-	18975	AC Breaker: Rs.3542: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.12200:upto 200A,Rs.13800:201A-1000A,Rs.16600:1001A-2000A
8.3.8.7(Verification of temperature-rise)	-	18975	AC Breaker: Rs.3542: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.12200:upto 200A,Rs.13800:201A-1000A,Rs.16600:1001A-2000A
8.3.4.6(Verification of Overload releases)	-	18975	AC Breaker: Rs.911: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.9700:upto 2000A
8.3.5.2(Verification of Overload releases)	-	18975	AC Breaker: Rs.911: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.9700:upto 2000A
8.3.5.5(Verification of Overload releases)	-	18975	AC Breaker: Rs.911: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.9700:upto 2000A
8.3.6.2(Verification of Overload releases)	-	18975	AC Breaker: Rs.911: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.9700:upto 2000A
8.3.6.7(Verification of Overload releases)	-	18975	AC Breaker: Rs.911: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.9700:upto 2000A
8.3.7.5(Verification of Overload releases)	-	18975	AC Breaker: Rs.911: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.9700:upto 2000A
8.3.7.9(Verification of Overload releases)	-	18975	AC Breaker: Rs.911: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.9700:upto 2000A
8.3.8.2(Verification of Overload releases)	-	18975	AC Breaker: Rs.911: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.9700:upto 2000A
8.3.8.8(Verification of Overload releases)	-	18975	AC Breaker: Rs.911: Upto 200A,Rs.7274:201A-1000A,Rs.10911:1001-2000A,Rs.18975:2001-6300A DC Breaker:Rs.9700:upto 2000A
8.3.4.1(General)	-	89401	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
8.3.4.2(Test of service short circuit breaking capacity)	-	89401	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
8.3.5.1(General)	-	68770	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
8.3.5.3(Rated ultimate short-circuit breaking capacity)	-	68770	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
8.3.6.1(General)	-	146136	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
8.3.6.3(Rated short-time withstand current)	-	146136	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
8.3.6.5(Short-circuit breaking capacity at maximum short-time withstand current)	-	89401	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
8.3.7.1(General)	-	89401	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
8.3.7.2(Short-circuit at the selectivity limit current)	-	89401	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
8.3.7.6(Short-circuit at 1,1 times take-over current)	-	68770	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
8.3.7.7(Short-circuit at ultimate short-circuit breaking capacity)	-	68770	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
8.3.8.1(General)	-	146136	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
8.3.8.3(Rated short-time withstand current)	-	146136	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
8.3.8.4(Rated service short-circuit breaking capacity*)	-	89401	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
C.2(individual pole short circuit breaking capacity (Isu))	-	68770	AC Breaker: 500A-50kA DC Breaker: 250A-30kA
7.3 Annexure J Table J.1(Electrostatic discharges)	-	8500	-
7.3 Annexure J Table J.1("Radiated radio-frequency electromagnetic fields")	-	25000	-
7.3 Annexure J Table J.1("Electrical fast transients/bursts")	-	8500	-
7.3 Annexure J Table J.1("Radiated radio-frequency electromagnetic fields")	-	18000	-
7.3 Annexure J Table J.1(Surges)	-	16000	-
7.3 Annexure J Table J.1("Conducted disturbances induced by radio frequency fields")	-	9500	-
7.3 Annexure J Table J.1("Power frequency magnetic fields")	-	10000	-
7.3 Annexure J Table J.1("Voltage dips and interruptions")	-	7900	-
7.3 Annexure J Table J.3("Conducted RF disturbances 150 kHz to 30 MHz")	-	9000	-
7.3 Annexure J Table J.3("Radiated RF disturbances 30 MHz to 1 000 MHz")	-	18000	-
8.3.4.1(General)	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.4.2(rated short circuit breaking capacity (sequence II))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.4.3(verification of operational performance capability (sequence II))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.4.4(verification of dielectric withstand (sequnce II))	-	823	Up to 5kV
8.3.4.5(verification of temperature-rise (sequence II))	-	18975	Rs. 3606: Upto 200A, Rs. 7274: 201A-1000A, Rs. 10911:1001A-2000A, Rs.16003:2001A-3000A,Rs. 18975: 3001A-4000A
8.3.4.6(verification of overload releases (sequence II))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.5.1(General)	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.5.2(verification of overload releases (sequence III))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.5.3(rated short circuit breaking capacity (sequence III))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.5.4(verification of dielectric withstand (sequnce III))	-	823	Up to 5kV
8.3.5.5(verification of overload releases (sequence III))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.6.1(General)	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.6.2(verification of overload releases (sequence IV))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.6.3(rated short circuit withstand current (sequence IV))	-	165313	Rs. 34385: Up to 50000A (1sec.) Rs. 50917: Above 50001A to 80000A (1Sec.) Rs. 125638: Above 80001A to 120000A (1Sec.) Rs. 56206: Up to 50000A (3sec.) Rs. 79638: Above 50001A to 80000A (3Sec.) Rs. 165313: Above 80001A to 120000A (3Sec.)
8.3.6.4(verification of temperature-rise (sequence IV))	-	18975	Rs. 3606: Upto 200A, Rs. 7274: 201A-1000A, Rs. 10911:1001A-2000A, Rs.16003:2001A-3000A,Rs. 18975: 3001A-4000A
8.3.6.5(short circuit breaking capacity at maximum short time withstand current (sequence IV))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.6.6(verification of dielectric withstand (sequence IV))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.6.7(verification of overload releases (sequence IV))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.7.1(General)	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.7.2((stage 1) short circuit at the selectivity limit current (sequence V))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.7.3((stage 1) verification of temperature-rise (sequence V))	-	18975	Rs. 3606: Upto 200A, Rs. 7274: 201A-1000A, Rs. 10911:1001A-2000A, Rs.16003:2001A-3000A,Rs. 18975: 3001A-4000A
8.3.7.4((stage 1) verification of dielectric withstand (sequence V))	-	823	Up to 5kV
8.3.7.5((stage 2) verification of overload releases (sequence V))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.7.6((stage 2) short circuit at 1.1 time the take-over current (sequence V))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.7.7((stage 2) short circuit at rated ultimate short circuit breaking capacity (sequence V))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.7.8((stage 2) verification of dielectric withstand (sequence V))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.7.9((stage 2) verification of overload releases (sequence V))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.8.1(General)	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.8.2(verification of overload releases (sequence VI))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.8.3(rated short time withstand current (sequence VI))	-	165313	Rs. 34385: Up to 50000A (1sec.) Rs. 50917: Above 50001A to 80000A (1Sec.) Rs. 125638: Above 80001A to 120000A (1Sec.) Rs. 56206: Up to 50000A (3sec.) Rs. 79638: Above 50001A to 80000A (3Sec.) Rs. 165313: Above 80001A to 120000A (3Sec.)
8.3.8.4(rated service short circuit breaking capacity (sequence VI))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.8.5(verification of operational performance capability (sequence VI))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.8.6(verification of dielectric withstand (sequence VI))	-	823	Up to 5kV
8.3.8.7(verification of temperature-rise (sequence VI))	-	18975	Rs. 3606: Upto 200A, Rs. 7274: 201A-1000A, Rs. 10911:1001A-2000A, Rs.16003:2001A-3000A,Rs. 18975: 3001A-4000A
8.3.8.8(verification of overload releases (sequence VI))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
C.3(verification of dielectric withstand)	-	823	Up to 5kV
C.4(verification of overload releases)	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
H.2(individual pole short circuit (IIT))	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
H.3(verification of dielectric withstand)	-	823	Up to 5kV
H.4(verification of overload releases)	-	125638	Rs. 34385: Up to 50000A Rs. 50917: Above 50001A to 80000A Rs. 125638: Above 80001A to 120000A
8.3.3.2(Tripping limits and characteristics)	-	52434	-
8.3.3.3(Test of dielectric properties)	-	17400	-
8.3.3.4(Mechanical operation and operational performance capability)	-	317173	-
8.3.3.5(Overload performance)	-	309925	-
8.3.3.6(Verification of dielectric withstand)	-	6500	-
8.3.3.7(Verification of temperature-rise)	-	18975	-
8.3.3.8(Verification of Overload releases)	-	18975	-
8.3.3.9(Verification of undervoltage and shunt releases)	-	6900	-
8.3.3.10(Verification of main contact position)	-	6900	-
B.8.2(Operating characteristics)	-	16445	-
B.8.3(Dielectric Properties)	-	11315	-
B.8.4(Operation of the test device at the limits of rated voltage)	-	2404	-
B.8.5(Limiting value of the non-operating current under over-current conditions)	-	7843	-
B.8.6(Resistance against unwanted tripping due to surge currents resulting from impulse voltage)	-	14548	-
B.8.7(Behavior in the case of an earth fault current comprising a d.c. component)	-	13283	-
8.4.2(Mechanical operation tests)	-	2900	-
8.4.3(Verification of the calibration of overcurrent releases)	-	36053	-
8.4.4(Verification of the operation of undervoltage and shunt releases)	-	6900	-
8.4.5(Additional tests for CBRs)	-	2404	-
8.4.6(Dielectric tests)	-	17400	-
8.4.7(Test for the verifiacation of clearances less than those corresponding to case A of Table 13 of IEC 60947-1:2007)	-	2100	-
8.3.4.4(Verification of dielectric withstand)	-	3300	-
8.3.5.4(Verification of dielectric withstand)	-	3300	-
8.3.6.6(Verification of dielectric withstand)	-	3300	-
8.3.7.4(Verification of dielectric withstand)	-	3300	-
8.3.7.8(Verification of dielectric withstand)	-	3300	-
8.3.8.6(Verification of dielectric withstand)	-	3300	-
8.3.4.5(Verifiation of temperature-rise)	-	18975	-
8.3.6.4(Verification of temperature-rise)	-	18975	-
8.3.7.3(Verification of temperature-rise)	-	18975	-
8.3.8.7(Verification of temperature-rise)	-	18975	-
8.3.4.6(Verification of Overload releases)	-	18975	-
8.3.5.2(Verification of Overload releases)	-	18975	-
8.3.5.5(Verification of Overload releases)	-	18975	-
8.3.6.2(Verification of Overload releases)	-	18975	-
8.3.6.7(Verification of Overload releases)	-	18975	-
8.3.7.5(Verification of Overload releases)	-	18975	-
8.3.7.9(Verification of Overload releases)	-	18975	-
8.3.8.2(Verification of Overload releases)	-	18975	-
8.3.8.8(Verification of Overload releases)	-	18975	-
8.3.4.1(General)	-	89401	-
8.3.4.2(Test of service short circuit breaking capacity)	-	89401	-
8.3.5.1(General)	-	68770	-
8.3.5.3(Rated ultimate short-circuit breaking capacity)	-	68770	-
8.3.6.1(General)	-	146136	-
8.3.6.3(Rated short-time withstand current)	-	146136	-
8.3.6.5(Short-circuit breaking capacity at maximum short-time withstand current)	-	89401	-
8.3.7.1(General)	-	89401	-
8.3.7.2(Short-circuit at the selectivity limit current)	-	89401	-
8.3.7.6(Short-circuit at 1,1 times take-over current)	-	68770	-
8.3.7.7(Short-circuit at ultimate short-circuit breaking capacity)	-	68770	-
8.3.8.1(General)	-	146136	-
8.3.8.3(Rated short-time withstand current)	-	146136	-
8.3.8.4(Rated service short-circuit breaking capacity*)	-	89401	-
C.2(individual pole short circuit breaking capacity (Isu))	-	68770	-
7.3 Annexure J Table J.1(Electrostatic discharges)	-	8500	-
7.3 Annexure J Table J.1("Radiated radio-frequency electromagnetic fields")	-	25000	-
7.3 Annexure J Table J.1("Electrical fast transients/bursts")	-	8500	-
7.3 Annexure J Table J.1("Radiated radio-frequency electromagnetic fields")	-	18000	-
7.3 Annexure J Table J.1(Surges)	-	16000	-
7.3 Annexure J Table J.1("Conducted disturbances induced by radio frequency fields")	-	9500	-
7.3 Annexure J Table J.1("Power frequency magnetic fields")	-	10000	-
7.3 Annexure J Table J.1("Voltage dips and interruptions")	-	7900	-
7.3 Annexure J Table J.3("Conducted RF disturbances 150 kHz to 30 MHz")	-	9000	-
7.3 Annexure J Table J.3("Radiated RF disturbances 30 MHz to 1 000 MHz")	-	18000	-
8.3.4.1(General)	-	125638	-
8.3.4.2(rated short circuit breaking capacity (sequence II))	-	125638	-
8.3.4.3(verification of operational performance capability (sequence II))	-	125638	-
8.3.4.4(verification of dielectric withstand (sequnce II))	-	823	-
8.3.4.5(verification of temperature-rise (sequence II))	-	18975	-
8.3.4.6(verification of overload releases (sequence II))	-	125638	-
8.3.5.1(General)	-	125638	-
8.3.5.2(verification of overload releases (sequence III))	-	125638	-
8.3.5.3(rated short circuit breaking capacity (sequence III))	-	125638	-
8.3.5.4(verification of dielectric withstand (sequnce III))	-	823	-
8.3.5.5(verification of overload releases (sequence III))	-	125638	-
8.3.6.1(General)	-	125638	-
8.3.6.2(verification of overload releases (sequence IV))	-	125638	-
8.3.6.3(rated short circuit withstand current (sequence IV))	-	165313	-
8.3.6.4(verification of temperature-rise (sequence IV))	-	18975	-
8.3.6.5(short circuit breaking capacity at maximum short time withstand current (sequence IV))	-	125638	-
8.3.6.6(verification of dielectric withstand (sequence IV))	-	125638	-
8.3.6.7(verification of overload releases (sequence IV))	-	125638	-
8.3.7.1(General)	-	125638	-
8.3.7.2((stage 1) short circuit at the selectivity limit current (sequence V))	-	125638	-
8.3.7.3((stage 1) verification of temperature-rise (sequence V))	-	18975	-
8.3.7.4((stage 1) verification of dielectric withstand (sequence V))	-	823	-
8.3.7.5((stage 2) verification of overload releases (sequence V))	-	125638	-
8.3.7.6((stage 2) short circuit at 1.1 time the take-over current (sequence V))	-	125638	-
8.3.7.7((stage 2) short circuit at rated ultimate short circuit breaking capacity (sequence V))	-	125638	-
8.3.7.8((stage 2) verification of dielectric withstand (sequence V))	-	125638	-
8.3.7.9((stage 2) verification of overload releases (sequence V))	-	125638	-
8.3.8.1(General)	-	125638	-
8.3.8.2(verification of overload releases (sequence VI))	-	125638	-
8.3.8.3(rated short time withstand current (sequence VI))	-	165313	-
8.3.8.4(rated service short circuit breaking capacity (sequence VI))	-	125638	-
8.3.8.5(verification of operational performance capability (sequence VI))	-	125638	-
8.3.8.6(verification of dielectric withstand (sequence VI))	-	823	-
8.3.8.7(verification of temperature-rise (sequence VI))	-	18975	-
8.3.8.8(verification of overload releases (sequence VI))	-	125638	-
C.3(verification of dielectric withstand)	-	823	-
C.4(verification of overload releases)	-	125638	-
H.2(individual pole short circuit (IIT))	-	125638	-
H.3(verification of dielectric withstand)	-	823	-
H.4(verification of overload releases)	-	125638	-
8.3.3.2(Tripping limits and characteristics)	-	52400	-
8.3.3.3(Test of dielectric properties)	-	17400	-
8.3.3.4(Mechanical operation and operational performance capability)	-	317173	-
8.3.3.5(Overload performance)	-	309925	-
8.3.3.6(Verification of dielectric withstand)	-	6500	-
8.3.3.7(Verification of temperature-rise)	-	18975	-
8.3.3.8(Verification of Overload releases)	-	18975	-
8.3.3.9(Verification of undervoltage and shunt releases)	-	6900	-
8.3.3.10(Verification of main contact position)	-	6900	-
B.8.2(Operating characteristics)	-	16445	-
B.8.3(Dielectric Properties)	-	11315	-
B.8.4(Operation of the test device at the limits of rated voltage)	-	2404	-
B.8.5(Limiting value of the non-operating current under over-current conditions)	-	7843	-
B.8.6(Resistance against unwanted tripping due to surge currents resulting from impulse voltage)	-	14548	-
B.8.7(Behavior in the case of an earth fault current comprising a d.c. component)	-	13283	-
8.4.2(Mechanical operation tests)	-	2900	-
8.4.3(Verification of the calibration of overcurrent releases)	-	36053	-
8.4.4(Verification of the operation of undervoltage and shunt releases)	-	6900	-
8.4.5(Additional tests for CBRs)	-	2404	-
8.4.6(Dielectric tests)	-	17400	-
8.4.7(Test for the verifiacation of clearances less than those corresponding to case A of Table 13 of IEC 60947-1:2007)	-	2100	-
8.3.4.4(Verification of dielectric withstand)	-	3300	-
8.3.5.4(Verification of dielectric withstand)	-	3300	-
8.3.6.6(Verification of dielectric withstand)	-	3300	-
8.3.7.4(Verification of dielectric withstand)	-	3300	-
8.3.7.8(Verification of dielectric withstand)	-	3300	-
8.3.8.6(Verification of dielectric withstand)	-	3300	-
8.3.4.5(Verifiation of temperature-rise)	-	18975	-
8.3.6.4(Verification of temperature-rise)	-	18975	-
8.3.7.3(Verification of temperature-rise)	-	18975	-
8.3.8.7(Verification of temperature-rise)	-	18975	-
8.3.4.6(Verification of Overload releases)	-	18975	-
8.3.5.2(Verification of Overload releases)	-	18975	-
8.3.5.5(Verification of Overload releases)	-	18975	-
8.3.6.2(Verification of Overload releases)	-	18975	-
8.3.6.7(Verification of Overload releases)	-	18975	-
8.3.7.5(Verification of Overload releases)	-	18975	-
8.3.7.9(Verification of Overload releases)	-	18975	-
8.3.8.2(Verification of Overload releases)	-	18975	-
8.3.8.8(Verification of Overload releases)	-	18975	-
8.3.4.1(General)	-	89401	-
8.3.4.2(Test of service short circuit breaking capacity)	-	89401	-
8.3.5.1(General)	-	68770	-
8.3.5.3(Rated ultimate short-circuit breaking capacity)	-	68770	-
8.3.6.1(General)	-	146136	-
8.3.6.3(Rated short-time withstand current)	-	146136	-
8.3.6.5(Short-circuit breaking capacity at maximum short-time withstand current)	-	89401	-
8.3.7.1(General)	-	89401	-
8.3.7.2(Short-circuit at the selectivity limit current)	-	89401	-
8.3.7.6(Short-circuit at 1,1 times take-over current)	-	68770	-
8.3.7.7(Short-circuit at ultimate short-circuit breaking capacity)	-	68770	-
8.3.8.1(General)	-	146136	-
8.3.8.3(Rated short-time withstand current)	-	146136	-
8.3.8.4(Rated service short-circuit breaking capacity*)	-	89401	-
C.2(individual pole short circuit breaking capacity (Isu))	-	68770	-
7.3 Annexure J Table J.1(Electrostatic discharges)	-	8500	-
7.3 Annexure J Table J.1("Radiated radio-frequency electromagnetic fields")	-	25000	-
7.3 Annexure J Table J.1("Electrical fast transients/bursts")	-	8500	-
7.3 Annexure J Table J.1("Radiated radio-frequency electromagnetic fields")	-	18000	-
7.3 Annexure J Table J.1(Surges)	-	16000	-
7.3 Annexure J Table J.1("Conducted disturbances induced by radio frequency fields")	-	9500	-
7.3 Annexure J Table J.1("Power frequency magnetic fields")	-	10000	-
7.3 Annexure J Table J.1("Voltage dips and interruptions")	-	7900	-
7.3 Annexure J Table J.3("Conducted RF disturbances 150 kHz to 30 MHz")	-	9000	-
7.3 Annexure J Table J.3("Radiated RF disturbances 30 MHz to 1 000 MHz")	-	18000	-
8.3.4.1(General)	-	125638	-
8.3.4.2(rated short circuit breaking capacity (sequence II))	-	125638	-
8.3.4.3(verification of operational performance capability (sequence II))	-	125638	-
8.3.4.4(verification of dielectric withstand (sequnce II))	-	823	-
8.3.4.5(verification of temperature-rise (sequence II))	-	18975	-
8.3.4.6(verification of overload releases (sequence II))	-	125638	-
8.3.5.1(General)	-	125638	-
8.3.5.2(verification of overload releases (sequence III))	-	125638	-
8.3.5.3(rated short circuit breaking capacity (sequence III))	-	125638	-
8.3.5.4(verification of dielectric withstand (sequnce III))	-	823	-
8.3.5.5(verification of overload releases (sequence III))	-	125638	-
8.3.6.1(General)	-	125638	-
8.3.6.2(verification of overload releases (sequence IV))	-	125638	-
8.3.6.3(rated short circuit withstand current (sequence IV))	-	165313	-
8.3.6.4(verification of temperature-rise (sequence IV))	-	18975	-
8.3.6.5(short circuit breaking capacity at maximum short time withstand current (sequence IV))	-	125638	-
8.3.6.6(verification of dielectric withstand (sequence IV))	-	125638	-
8.3.6.7(verification of overload releases (sequence IV))	-	125638	-
8.3.7.1(General)	-	125638	-
8.3.7.2((stage 1) short circuit at the selectivity limit current (sequence V))	-	125638	-
8.3.7.3((stage 1) verification of temperature-rise (sequence V))	-	18975	-
8.3.7.4((stage 1) verification of dielectric withstand (sequence V))	-	823	-
8.3.7.5((stage 2) verification of overload releases (sequence V))	-	125638	-
8.3.7.6((stage 2) short circuit at 1.1 time the take-over current (sequence V))	-	125638	-
8.3.7.7((stage 2) short circuit at rated ultimate short circuit breaking capacity (sequence V))	-	125638	-
8.3.7.8((stage 2) verification of dielectric withstand (sequence V))	-	125638	-
8.3.7.9((stage 2) verification of overload releases (sequence V))	-	125638	-
8.3.8.1(General)	-	125638	-
8.3.8.2(verification of overload releases (sequence VI))	-	125638	-
8.3.8.3(rated short time withstand current (sequence VI))	-	165313	-
8.3.8.4(rated service short circuit breaking capacity (sequence VI))	-	125638	-
8.3.8.5(verification of operational performance capability (sequence VI))	-	125638	-
8.3.8.6(verification of dielectric withstand (sequence VI))	-	823	-
8.3.8.7(verification of temperature-rise (sequence VI))	-	18975	-
8.3.8.8(verification of overload releases (sequence VI))	-	125638	-
C.3(verification of dielectric withstand)	-	823	-
C.4(verification of overload releases)	-	125638	-
H.2(individual pole short circuit (IIT))	-	125638	-
H.3(verification of dielectric withstand)	-	823	-
H.4(verification of overload releases)	-	125638	-
8.3.3.2(Tripping limits and characteristics)	-	52434	-
8.3.3.3(Test of dielectric properties)	-	17400	-
8.3.3.4(Mechanical operation and operational performance capability)	-	317173	-
8.3.3.5(Overload performance)	-	309925	-
8.3.3.6(Verification of dielectric withstand)	-	6500	-
8.3.3.7(Verification of temperature-rise)	-	18975	-
8.3.3.8(Verification of Overload releases)	-	18975	-
8.3.3.9(Verification of undervoltage and shunt releases)	-	6900	-
8.3.3.10(Verification of main contact position)	-	6900	-
B.8.2(Operating characteristics)	-	16445	-
B.8.3(Dielectric Properties)	-	11315	-
B.8.4(Operation of the test device at the limits of rated voltage)	-	2404	-
B.8.5(Limiting value of the non-operating current under over-current conditions)	-	7843	-
B.8.6(Resistance against unwanted tripping due to surge currents resulting from impulse voltage)	-	14548	-
B.8.7(Behavior in the case of an earth fault current comprising a d.c. component)	-	13283	-
8.4.2(Mechanical operation tests)	-	2900	-
8.4.3(Verification of the calibration of overcurrent releases)	-	36053	-
8.4.4(Verification of the operation of undervoltage and shunt releases)	-	6900	-
8.4.5(Additional tests for CBRs)	-	2404	-
8.4.6(Dielectric tests)	-	17400	-
8.4.7(Test for the verifiacation of clearances less than those corresponding to case A of Table 13 of IEC 60947-1:2007)	-	2100	-
8.3.4.4(Verification of dielectric withstand)	-	3300	-
8.3.5.4(Verification of dielectric withstand)	-	3300	-
8.3.6.6(Verification of dielectric withstand)	-	3300	-
8.3.7.4(Verification of dielectric withstand)	-	3300	-
8.3.7.8(Verification of dielectric withstand)	-	3300	-
8.3.8.6(Verification of dielectric withstand)	-	3300	-
8.3.4.5(Verifiation of temperature-rise)	-	18975	-
8.3.6.4(Verification of temperature-rise)	-	18975	-
8.3.7.3(Verification of temperature-rise)	-	18975	-
8.3.8.7(Verification of temperature-rise)	-	18975	-
8.3.4.6(Verification of Overload releases)	-	18975	-
8.3.5.2(Verification of Overload releases)	-	18975	-
8.3.5.5(Verification of Overload releases)	-	18975	-
8.3.6.2(Verification of Overload releases)	-	18975	-
8.3.6.7(Verification of Overload releases)	-	18975	-
8.3.7.5(Verification of Overload releases)	-	18975	-
8.3.7.9(Verification of Overload releases)	-	18975	-
8.3.8.2(Verification of Overload releases)	-	18975	-
8.3.8.8(Verification of Overload releases)	-	18975	-
8.3.4.1(General)	-	89401	-
8.3.4.2(Test of service short circuit breaking capacity)	-	89401	-
8.3.5.1(General)	-	68770	-
8.3.5.3(Rated ultimate short-circuit breaking capacity)	-	68770	-
8.3.6.1(General)	-	146136	-
8.3.6.3(Rated short-time withstand current)	-	146136	-
8.3.6.5(Short-circuit breaking capacity at maximum short-time withstand current)	-	89401	-
8.3.7.1(General)	-	89401	-
8.3.7.2(Short-circuit at the selectivity limit current)	-	89401	-
8.3.7.6(Short-circuit at 1,1 times take-over current)	-	68770	-
8.3.7.7(Short-circuit at ultimate short-circuit breaking capacity)	-	68770	-
8.3.8.1(General)	-	146136	-
8.3.8.3(Rated short-time withstand current)	-	146136	-
8.3.8.4(Rated service short-circuit breaking capacity*)	-	89401	-
C.2(individual pole short circuit breaking capacity (Isu))	-	68770	-
7.3 Annexure J Table J.1(Electrostatic discharges)	-	8500	-
7.3 Annexure J Table J.1("Radiated radio-frequency electromagnetic fields")	-	25000	-
7.3 Annexure J Table J.1("Electrical fast transients/bursts")	-	8500	-
7.3 Annexure J Table J.1("Radiated radio-frequency electromagnetic fields")	-	18000	-
7.3 Annexure J Table J.1(Surges)	-	16000	-
7.3 Annexure J Table J.1("Conducted disturbances induced by radio frequency fields")	-	9500	-
7.3 Annexure J Table J.1("Power frequency magnetic fields")	-	10000	-
7.3 Annexure J Table J.1("Voltage dips and interruptions")	-	7900	-
7.3 Annexure J Table J.3("Conducted RF disturbances 150 kHz to 30 MHz")	-	9000	-
7.3 Annexure J Table J.3("Radiated RF disturbances 30 MHz to 1 000 MHz")	-	18000	-
8.3.4.1(General)	-	125638	-
8.3.4.2(rated short circuit breaking capacity (sequence II))	-	125638	-
8.3.4.3(verification of operational performance capability (sequence II))	-	125638	-
8.3.4.4(verification of dielectric withstand (sequnce II))	-	823	-
8.3.4.5(verification of temperature-rise (sequence II))	-	18975	-
8.3.4.6(verification of overload releases (sequence II))	-	125638	-
8.3.5.1(General)	-	125638	-
8.3.5.2(verification of overload releases (sequence III))	-	125638	-
8.3.5.3(rated short circuit breaking capacity (sequence III))	-	125638	-
8.3.5.4(verification of dielectric withstand (sequnce III))	-	823	-
8.3.5.5(verification of overload releases (sequence III))	-	125638	-
8.3.6.1(General)	-	125638	-
8.3.6.2(verification of overload releases (sequence IV))	-	125638	-
8.3.6.3(rated short circuit withstand current (sequence IV))	-	165313	-
8.3.6.4(verification of temperature-rise (sequence IV))	-	18975	-
8.3.6.5(short circuit breaking capacity at maximum short time withstand current (sequence IV))	-	125638	-
8.3.6.6(verification of dielectric withstand (sequence IV))	-	125638	-
8.3.6.7(verification of overload releases (sequence IV))	-	125638	-
8.3.7.1(General)	-	125638	-
8.3.7.2((stage 1) short circuit at the selectivity limit current (sequence V))	-	125638	-
8.3.7.3((stage 1) verification of temperature-rise (sequence V))	-	18975	-
8.3.7.4((stage 1) verification of dielectric withstand (sequence V))	-	823	-
8.3.7.5((stage 2) verification of overload releases (sequence V))	-	125638	-
8.3.7.6((stage 2) short circuit at 1.1 time the take-over current (sequence V))	-	125638	-
8.3.7.7((stage 2) short circuit at rated ultimate short circuit breaking capacity (sequence V))	-	125638	-
8.3.7.8((stage 2) verification of dielectric withstand (sequence V))	-	125638	-
8.3.7.9((stage 2) verification of overload releases (sequence V))	-	125638	-
8.3.8.1(General)	-	125638	-
8.3.8.2(verification of overload releases (sequence VI))	-	125638	-
8.3.8.3(rated short time withstand current (sequence VI))	-	165313	-
8.3.8.4(rated service short circuit breaking capacity (sequence VI))	-	125638	-
8.3.8.5(verification of operational performance capability (sequence VI))	-	125638	-
8.3.8.6(verification of dielectric withstand (sequence VI))	-	823	-
8.3.8.7(verification of temperature-rise (sequence VI))	-	18975	-
8.3.8.8(verification of overload releases (sequence VI))	-	125638	-
C.3(verification of dielectric withstand)	-	823	-
C.4(verification of overload releases)	-	125638	-
H.2(individual pole short circuit (IIT))	-	125638	-
H.3(verification of dielectric withstand)	-	823	-
H.4(verification of overload releases)	-	125638	-
8.3.3.2(Tripping limits and characteristics)	-	-	-
8.3.3.3(Test of dielectric properties)	-	-	-
8.3.3.4(Mechanical operation and operational performance capability)	-	-	-
8.3.3.5(Overload performance)	-	-	-
8.3.3.6(Verification of dielectric withstand)	-	-	-
8.3.3.7(Verification of temperature-rise)	-	-	-
8.3.3.8(Verification of Overload releases)	-	-	-
8.3.3.9(Verification of undervoltage and shunt releases)	-	-	-
8.3.3.10(Verification of main contact position)	-	-	-
B.8.2(Operating characteristics)	-	-	-
B.8.3(Dielectric Properties)	-	-	-
B.8.4(Operation of the test device at the limits of rated voltage)	-	-	-
B.8.5(Limiting value of the non-operating current under over-current conditions)	-	-	-
B.8.6(Resistance against unwanted tripping due to surge currents resulting from impulse voltage)	-	-	-
B.8.7(Behavior in the case of an earth fault current comprising a d.c. component)	-	-	-
8.4.2(Mechanical operation tests)	-	-	-
8.4.3(Verification of the calibration of overcurrent releases)	-	-	-
8.4.4(Verification of the operation of undervoltage and shunt releases)	-	-	-
8.4.5(Additional tests for CBRs)	-	-	-
8.4.6(Dielectric tests)	-	-	-
8.4.7(Test for the verifiacation of clearances less than those corresponding to case A of Table 13 of IEC 60947-1:2007)	-	-	-
8.3.4.4(Verification of dielectric withstand)	-	-	-
8.3.5.4(Verification of dielectric withstand)	-	-	-
8.3.6.6(Verification of dielectric withstand)	-	-	-
8.3.7.4(Verification of dielectric withstand)	-	-	-
8.3.7.8(Verification of dielectric withstand)	-	-	-
8.3.8.6(Verification of dielectric withstand)	-	-	-
8.3.4.5(Verifiation of temperature-rise)	-	-	-
8.3.6.4(Verification of temperature-rise)	-	-	-
8.3.7.3(Verification of temperature-rise)	-	-	-
8.3.8.7(Verification of temperature-rise)	-	-	-
8.3.4.6(Verification of Overload releases)	-	-	-
8.3.5.2(Verification of Overload releases)	-	-	-
8.3.5.5(Verification of Overload releases)	-	-	-
8.3.6.2(Verification of Overload releases)	-	-	-
8.3.6.7(Verification of Overload releases)	-	-	-
8.3.7.5(Verification of Overload releases)	-	-	-
8.3.7.9(Verification of Overload releases)	-	-	-
8.3.8.2(Verification of Overload releases)	-	-	-
8.3.8.8(Verification of Overload releases)	-	-	-
8.3.4.1(General)	-	-	-
8.3.4.2(Test of service short circuit breaking capacity)	-	-	-
8.3.5.1(General)	-	-	-
8.3.5.3(Rated ultimate short-circuit breaking capacity)	-	-	-
8.3.6.1(General)	-	-	-
8.3.6.3(Rated short-time withstand current)	-	-	-
8.3.6.5(Short-circuit breaking capacity at maximum short-time withstand current)	-	-	-
8.3.7.1(General)	-	-	-
8.3.7.2(Short-circuit at the selectivity limit current)	-	-	-
8.3.7.6(Short-circuit at 1,1 times take-over current)	-	-	-
8.3.7.7(Short-circuit at ultimate short-circuit breaking capacity)	-	-	-
8.3.8.1(General)	-	-	-
8.3.8.3(Rated short-time withstand current)	-	-	-
8.3.8.4(Rated service short-circuit breaking capacity*)	-	-	-
C.2(individual pole short circuit breaking capacity (Isu))	-	-	-
7.3 Annexure J Table J.1(Electrostatic discharges)	-	-	-
7.3 Annexure J Table J.1("Radiated radio-frequency electromagnetic fields")	-	-	-
7.3 Annexure J Table J.1("Electrical fast transients/bursts")	-	-	-
7.3 Annexure J Table J.1("Radiated radio-frequency electromagnetic fields")	-	-	-
7.3 Annexure J Table J.1(Surges)	-	-	-
7.3 Annexure J Table J.1("Conducted disturbances induced by radio frequency fields")	-	-	-
7.3 Annexure J Table J.1("Power frequency magnetic fields")	-	-	-
7.3 Annexure J Table J.1("Voltage dips and interruptions")	-	-	-
7.3 Annexure J Table J.3("Conducted RF disturbances 150 kHz to 30 MHz")	-	-	-
7.3 Annexure J Table J.3("Radiated RF disturbances 30 MHz to 1 000 MHz")	-	-	-
8.3.4.1(General)	-	-	-
8.3.4.2(rated short circuit breaking capacity (sequence II))	-	-	-
8.3.4.3(verification of operational performance capability (sequence II))	-	-	-
8.3.4.4(verification of dielectric withstand (sequnce II))	-	-	-
8.3.4.5(verification of temperature-rise (sequence II))	-	-	-
8.3.4.6(verification of overload releases (sequence II))	-	-	-
8.3.5.1(General)	-	-	-
8.3.5.2(verification of overload releases (sequence III))	-	-	-
8.3.5.3(rated short circuit breaking capacity (sequence III))	-	-	-
8.3.5.4(verification of dielectric withstand (sequnce III))	-	-	-
8.3.5.5(verification of overload releases (sequence III))	-	-	-
8.3.6.1(General)	-	-	-
8.3.6.2(verification of overload releases (sequence IV))	-	-	-
8.3.6.3(rated short circuit withstand current (sequence IV))	-	-	-
8.3.6.4(verification of temperature-rise (sequence IV))	-	-	-
8.3.6.5(short circuit breaking capacity at maximum short time withstand current (sequence IV))	-	-	-
8.3.6.6(verification of dielectric withstand (sequence IV))	-	-	-
8.3.6.7(verification of overload releases (sequence IV))	-	-	-
8.3.7.1(General)	-	-	-
8.3.7.2((stage 1) short circuit at the selectivity limit current (sequence V))	-	-	-
8.3.7.3((stage 1) verification of temperature-rise (sequence V))	-	-	-
8.3.7.4((stage 1) verification of dielectric withstand (sequence V))	-	-	-
8.3.7.5((stage 2) verification of overload releases (sequence V))	-	-	-
8.3.7.6((stage 2) short circuit at 1.1 time the take-over current (sequence V))	-	-	-
8.3.7.7((stage 2) short circuit at rated ultimate short circuit breaking capacity (sequence V))	-	-	-
8.3.7.8((stage 2) verification of dielectric withstand (sequence V))	-	-	-
8.3.7.9((stage 2) verification of overload releases (sequence V))	-	-	-
8.3.8.1(General)	-	-	-
8.3.8.2(verification of overload releases (sequence VI))	-	-	-
8.3.8.3(rated short time withstand current (sequence VI))	-	-	-
8.3.8.4(rated service short circuit breaking capacity (sequence VI))	-	-	-
8.3.8.5(verification of operational performance capability (sequence VI))	-	-	-
8.3.8.6(verification of dielectric withstand (sequence VI))	-	-	-
8.3.8.7(verification of temperature-rise (sequence VI))	-	-	-
8.3.8.8(verification of overload releases (sequence VI))	-	-	-
C.3(verification of dielectric withstand)	-	-	-
C.4(verification of overload releases)	-	-	-
H.2(individual pole short circuit (IIT))	-	-	-
H.3(verification of dielectric withstand)	-	-	-
H.4(verification of overload releases)	-	-	-

Complete

30 Nov, 2025

-
Included w.e.f. 19.07.2023. Exclusion: Cl.B.8.8 (Voltage) Behaviour in the case of failure of line voltage for CBRs classified under B.3.1.2.1, Cl. Cl.B.8.9 (Voltage) Behaviour in the case of failure of line voltage for CBRs classified under B.3.1.2.2

154

IS 648 (2022)

Cold rolled non-oriented electrical steel sheet and strip - Fully processed type - Specification Sixth Revision

All Grades as Per Table-1

36535 View breakup
-

Clause No.	Exclusion	Testing Charges (Excl. Of Taxes)	Remark
Cl. No. 6.3.2(Adherence test for CRNO strips)	-	575	Adherence for CRNO Strips
Cl. No. 7.1.1.1 & Table-1(AC Magnetization for CRNO Strips)	-	4695	A.C. Magnetization for CRNO Strips (At 2500, 5000 & 10000 AT/m)
Cl. No. 7.1.2.1 , 7.1.2.2 & Table-1(Specific Core Loss Measurement with Annealing & with Ageing for CRNO strips)	-	11290	Specific Core Loss (At 1.0 T & 1.5 T) With Annealing & With Ageing
Cl. No. 7.1.2.1 & Table-1(Specific Core Loss Measurement without Annealing & with Ageing for CRNO strips)	-	9620	Specific Core Loss (At 1.0 T & 1.5 T) Without Annealing & With Ageing
Cl. No. 7.1.2.1 & Table-1(Specific Core Loss Measurement without Annealing & without Ageing for CRNO strips)	-	2030	Specific Core Loss (At 1.0 T & 1.5 T) Without Annealing & Without Ageing
Cl. No. 7.1.2.3 & Table-1(Anisotropy of Losses for CRNO Strips)	-	2185	Anisotropy of Losses for CRNO strips
Cl. No. 7.2.5(Surface Insulation Resistivity for CRNO Strips)	-	2230	Surface Insulation Resistivity for CRNO Strips
Cl. No. 7.2.6(Thermal Effect on Coating for CRNO Strips)	-	11385	Thermal Effect on Coating for CRNO Strips
Cl. No. 9.1 &Table-1(Stacking Factor for CRNO Strips)	-	575	Stacking Factor for CRNO Strips
Cl. No. 9.2 & Table-1(Ductility (Bend test) for CRNO Strips)	-	575	Ductility (Bend Test) for CRNO Strips
Cl. No. 7.2.7(Resistance to Solvent for CRNO Strips)	-	2450	Resistance to Solvents for CRNO Strips
Cl. No. 8.1(Thickness for CRNO Strips)	-	575	Lamination Thickness for CRNO Strips
Cl. No. 6.3.2(Adherence test for CRNO strips)	-	575	Adherence for CRNO Strips
Cl. No. 7.1.1.1 & Table-1(AC Magnetization for CRNO Strips)	-	4695	A.C. Magnetization for CRNO Strips (At 2500, 5000 & 10000 AT/m)
Cl. No. 7.1.2.1 , 7.1.2.2 & Table-1(Specific Core Loss Measurement with Annealing & with Ageing for CRNO strips)	-	11290	Specific Core Loss (At 1.0 T & 1.5 T) With Annealing & With Ageing
Cl. No. 7.1.2.1 & Table-1(Specific Core Loss Measurement without Annealing & with Ageing for CRNO strips)	-	9620	Specific Core Loss (At 1.0 T & 1.5 T) Without Annealing & With Ageing
Cl. No. 7.1.2.1 & Table-1(Specific Core Loss Measurement without Annealing & without Ageing for CRNO strips)	-	2030	Specific Core Loss (At 1.0 T & 1.5 T) Without Annealing & Without Ageing
Cl. No. 7.1.2.3 & Table-1(Anisotropy of Losses for CRNO Strips)	-	2185	Anisotropy of Losses for CRNO strips
Cl. No. 7.2.5(Surface Insulation Resistivity for CRNO Strips)	-	2230	Surface Insulation Resistivity for CRNO Strips
Cl. No. 7.2.6(Thermal Effect on Coating for CRNO Strips)	-	11385	Thermal Effect on Coating for CRNO Strips
Cl. No. 9.1 &Table-1(Stacking Factor for CRNO Strips)	-	575	Stacking Factor for CRNO Strips
Cl. No. 9.2 & Table-1(Ductility (Bend test) for CRNO Strips)	-	575	Ductility for CRNO Strips
Cl. No. 7.2.7(Resistance to Solvent for CRNO Strips)	-	2450	Resistance to Solvents for CRNO Strips
Cl. No. 8.1(Thickness for CRNO Strips)	-	575	Lamination Thickness for CRNO Strips
Cl. No. 6.3.2(Adherence test for CRNO strips)	-	575	Adherence for CRNO Strips
Cl. No. 7.1.1.1 & Table-1(AC Magnetization for CRNO Strips)	-	4695	A.C. Magnetization for CRNO Strips (At 2500, 5000 & 10000 AT/m)
Cl. No. 7.1.2.1 , 7.1.2.2 & Table-1(Specific Core Loss Measurement with Annealing & with Ageing for CRNO strips)	-	11290	Specific Core Loss (At 1.0 T & 1.5 T) With Annealing & With Ageing
Cl. No. 7.1.2.1 & Table-1(Specific Core Loss Measurement without Annealing & with Ageing for CRNO strips)	-	9620	Specific Core Loss (At 1.0 T & 1.5 T) Without Annealing & With Ageing
Cl. No. 7.1.2.1 & Table-1(Specific Core Loss Measurement without Annealing & without Ageing for CRNO strips)	-	2030	Specific Core Loss (At 1.0 T & 1.5 T) Without Annealing & Without Ageing
Cl. No. 7.1.2.3 & Table-1(Anisotropy of Losses for CRNO Strips)	-	2185	Anisotropy of Losses for CRNO strips
Cl. No. 7.2.5(Surface Insulation Resistivity for CRNO Strips)	-	2230	Surface Insulation Resistivity for CRNO Strips
Cl. No. 7.2.6(Thermal Effect on Coating for CRNO Strips)	-	11385	Thermal Effect on Coating for CRNO Strips
Cl. No. 9.1 &Table-1(Stacking Factor for CRNO Strips)	-	575	Stacking Factor for CRNO Strips
Cl. No. 9.2 & Table-1(Ductility (Bend test) for CRNO Strips)	-	575	Ductility for CRNO Strips
Cl. No. 7.2.7(Resistance to Solvent for CRNO Strips)	-	2450	Resistance to Solvents for CRNO Strips
Cl. No. 8.1(Thickness for CRNO Strips)	-	575	Lamination Thickness for CRNO Strips

Complete

30 Nov, 2025

-
Included w.e.f. 05.12.2023. Exclusion: Cl. No. 8.3 (Length Tolerance for CRNO strips), Cl. No. 8.5 (Tolerance on shape for CRNO strips), Cl. No. 8.6 (Flatness (Wavefactor) for CRNO strips), Cl. No. 8.2 (Width Tolerance for CRNO strips), Cl. No. 8.4 (Size Tolerance on size for CRNO strips)

Bureau of Indian Standards

The National Standards Body of India

Electrical Research and Development Association, gujarat

ERDA Road, GIDC, Makarpura, Vadodara, VADODARA, Vadodara, Gujarat, 390010

9987940719 uday.puntambekar@erda.org

Scope List