4.1 (Conductor - Material) |
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4.2 (Conductor resistance test) |
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5.1 (Insulation) |
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6.1 (Filler) |
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4.1 (Annealing test (for copper)) |
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4.1 (Tensile test (for Al)-Before Stranding) |
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4.1 (Tensile test (for Al)- After Stranding) |
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4.1 (Wrapping test (for Al)) |
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10.11 (Per sulphate test (for tinned Cu cable only)) |
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(Cl.16.1)
(Cl.19.1) (Conductor- Diameter ) |
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5.2 (Application ) |
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6.2 (Filler) |
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7 (Binder Tape) |
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8.1 (Sheath Material ) |
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(Cl. 18.1.4)
(Cl. 19.1.5)
(Cl. 20.1.4)
(Cl. 22.1.4) (Colour of Sheath) |
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9 (Overall dimensions) |
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9.1 (Ovality) |
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Table 1 iii) c) 1) (Tensile strength (Without ageing)) |
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Table 1 iii) c) 1) (Elongation (Without ageing)) |
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Table 1 iii) c) 3) (Tensile strength (After ageing)) |
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Table 1 iii) c) 3) (Elongation (After ageing)) |
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Table 1 iii) c) 3) (TS variation) |
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Table 1 iii) c) 3) (Elongation variation) |
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Table 1 iii) d) 1) (Sheath -Tensile strength (Without ageing)) |
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Table 1 iii) d) 1) (Sheath- Elongation (Without ageing)) |
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Table 1 iii) d) 3) (Sheath- Tensile strength (After ageing)) |
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Table 1 iii) d) 3) (Sheath- Elongation (After ageing)) |
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Table 1 iii) d) 3) (Sheath- TS variation) |
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Table 1 iii) d) 3) (Sheath- Elongation variation) |
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Table 1 iii) c) 2) (Loss of mass- Insulation ) |
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Table 1 iii) d) 2) (Loss of mass- Sheath ) |
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Table 1 iii) c) 4) (Shrinkage-Insulation) |
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Table 1 iii) d) 4) (Shrinkage- Sheath ) |
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Table 1 iii) c) 5) (Heat shock-Insulation ) |
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Table 1 iii) d) 5) (Heat shock-Sheath ) |
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Table 1 iii) c) 6) (Hot deformation - Indentation depth- Insulation) |
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Table 1 iii) d) 6) (Hot deformation -Indentation depth - Sheath ) |
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10.4 (Flammability test-Burning after flame removal) |
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10.4 (Flammability test- Unaffected portion) |
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Table 1 iii) c) 8) (Cold bend for insulation) |
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Table 1 iii) d) 8) (Cold bend for sheath) |
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Table 1 iii) c) 9) (Cold impact for insulation) |
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Table 1 iii) d) 9) (Cold impact for sheath) |
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Table 1 iii) c) 7) (Thermal stability- Insulation ) |
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Table 1 iii) d) 7) (Thermal stability- Sheath ) |
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table 1 e) 3) (Volume Resistivity - Room temp ) |
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table 1 e) 3) (Volume Resistivity - Maximum temp) |
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table 1 e) 3) (IR constant- Room temp ) |
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table 1 e) 3) (IR constant- max. Temp) |
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10.1 (HV (water immersion)) |
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10.1 (HV (water immersion)) |
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10.2 (HV (room temperature)) |
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11 (Identification) |
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11.1 (Durability) |
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11.2 (Legibility) |
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4.1 (Conductor - Material) |
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4.1 (Conductor - Material) |
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4.1 (Conductor - Material) |
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8.3 (Avarage thickness of Sheath) |
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5.3 (Minimum thickness of insulation) |
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5.3 (Avarage thickness of insulation) |
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Table 2, IS 8130 (No fo wire in a conductor) |
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4, IS 8130 (Construction of conductor) |
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8.1 (Sheath Material ) |
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12.0 (Core identification) |
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Table 1 (Category Code) |
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Table 4 (Copper purity test) |
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8.3 (Minimum thickness of Sheath) |
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4.4 (Joints in Conductor) |
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4.4 (Joints in Conductor) |
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10.11 (Persulphate Test ) |
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10.9 (Additional ageing test (OU cables only) -HV test (at 60±3oC)) |
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